Hans Eisenmann
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
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- VLSI and FPGA Design Techniques
- Low-power high-performance VLSI design
- Advancements in Photolithography Techniques
- 3D IC and TSV technologies
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
-
- Advancements in Photolithography Techniques 11
- VLSI and FPGA Design Techniques 5
- Integrated Circuits and Semiconductor Failure Analysis 4
- 3D IC and TSV technologies 3
- Low-power high-performance VLSI design 3
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- Electron and X-Ray Spectroscopy Techniques 6
- Co-authors
- Frank Johannes (3 shared papers)Hans Hartmann (5 shared papers)Thomas Waas (6 shared papers)Wolfgang Henke (1 shared paper)P. Hudek (1 shared paper)U. Denker (1 shared paper)Dirk Beyer (1 shared paper)Jens Schneider (1 shared paper)
- Journals
- Microelectronic Engineering (3 papers)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)IEE Proceedings - Computers and Digital Techniques (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (5 papers)
- Partner nations
- GermanyUnited StatesAustria
In The Last Decade
Hans Eisenmann
12 papers receiving 379 citations
Peers
Comparison fields: 5 of 24
- Hardware and Architecture 266
- Electrical and Electronic Engineering 404
- Surfaces, Coatings and Films 38
- Computer Networks and Communications 43
- Computer Graphics and Computer-Aided Design 5
Countries citing papers authored by Hans Eisenmann
This map shows the geographic impact of Hans Eisenmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hans Eisenmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hans Eisenmann more than expected).
Fields of papers citing papers by Hans Eisenmann
This network shows the impact of papers produced by Hans Eisenmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hans Eisenmann. The network helps show where Hans Eisenmann may publish in the future.
Co-authors
The 12 scholars most cited alongside Hans Eisenmann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 298 | |
| 2 | 1993 | 44 | |
| 3 | 2002 | 16 | |
| 4 | 2007 | 15 | |
| 5 | 1994 | 11 | |
| 6 | 2002 | 9 | |
| 7 | 1995 | 6 | |
| 8 | 1994 | 6 | |
| 9 | 1999 | 5 | |
| 10 | 2003 | 3 | |
| 11 | 2014 | 2 | |
| 12 | 2015 | 2 | |
| 13 | 1999 | 1 | |
| 14 | 1996 | 0 |
About Hans Eisenmann
Hans Eisenmann is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Hardware and Architecture, Industrial and Manufacturing Engineering and Radiology, Nuclear Medicine and Imaging, having authored 14 papers that have together received 418 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (11 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), VLSI and FPGA Design Techniques (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), VLSI and Analog Circuit Testing (4 papers), 3D IC and TSV technologies (3 papers), Low-power high-performance VLSI design (3 papers) and Industrial Vision Systems and Defect Detection (2 papers). The work is most often cited by research in Hardware and Architecture (266 citations), Electrical and Electronic Engineering (404 citations), Surfaces, Coatings and Films (38 citations), Computer Networks and Communications (43 citations) and Computer Graphics and Computer-Aided Design (5 citations). Hans Eisenmann has collaborated with scholars based in Germany, United States and Austria. Frequent co-authors include Frank Johannes, Hans Hartmann, Thomas Waas, Wolfgang Henke, P. Hudek, U. Denker, Dirk Beyer, Jens Schneider, Ang Lu and Andrzej J. Strojwas. Their work appears in journals such as Microelectronic Engineering, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, IEE Proceedings - Computers and Digital Techniques and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.