Y.C. See

448 citations

15 papers · 187 indexed · h-index 8

Impact in

Electrical and Electronic Engineering
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Solid State Laser Technologies
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces
- Advanced Fiber Laser Technologies
- Photorefractive and Nonlinear Optics

Papers in

Electrical and Electronic Engineering 15
- Semiconductor materials and devices 11
- Advancements in Semiconductor Devices and Circuit Design 10
- Integrated Circuits and Semiconductor Failure Analysis 4
- Solid State Laser Technologies 3
- Low-power high-performance VLSI design 2
- Silicon Carbide Semiconductor Technologies 2
Atomic and Molecular Physics, and Optics 6
- Advanced Fiber Laser Technologies 3
- Photorefractive and Nonlinear Optics 3

Co-authors: D.B. Scott Joel Falk Shekhar Guha J.D. Hayden L.C. Parrillo Peter Fejes J.R. Pfiester M. Hong
Journals: IEEE Transactions on Electron Devices (3 papers)IEEE Electron Device Letters (2 papers)Applied Physics Letters (2 papers)Applied Optics (2 papers)
Partner nations: United States Taiwan

In The Last Decade

Y.C. See

15 papers receiving 175 citations

Peers

Countries citing papers authored by Y.C. See

Since Specialization

Citations

This map shows the geographic impact of Y.C. See's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y.C. See with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y.C. See more than expected).

Fields of papers citing papers by Y.C. See

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y.C. See. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y.C. See. The network helps show where Y.C. See may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Y.C. See, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Y.C. See Line = papers co-authored together Y.C. See links everyone, so they are left out of the graph.

All Works

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15 of 15 papers shown

#	Work
1	Uniaxial-biaxial stress hybridization for super-critical strained-si directly on insulator (SC-SSOI) PMOS with different channel orientations. Aaron Thean, L. Prabhu, Victor Vartanian, M. Ramón, B.-Y. Nguyen, T. White, Aceng Kurniawan, Marco Antonio Soto Fonseca, Sharon Murphy, Bilqis Olajumoke Muhammad, S. Venkatesan, J. Mogab, James Myall, Yu‐Jing Chiu, H.C. Tuan, Y.C. See, M.S. Liang, الزهراء حوحو	2006	16
2	A high-performance sub-half micron CMOS technology for fast SRAMs J.D. Hayden, F.K. Baker, 吴随状, Jan Maluszynski, Kyouko Hirama, Achmad Irawan, T. McNelly, T.C. Mele, Alicia Fábregas, B Lendvay, L.C. Parrillo, W. M. Paulson, J.R. Pfiester, 박철선, Y.C. See, 陈冬卫, C Flegler, P. Kerschl	2003	1
3	Characteristics of a poly-silicon contact plug technology Kyouko Hirama, 박철선, W. M. Paulson, David Fisher, Tonoyuki Miyakawa, Y.C. See	2003	3
4	A high performance 0.5 mu m BiCMOS triple polysilicon technology for 4 Mb fast SRAMs T.C. Mele, J.D. Hayden, Abul Israt, Achmad Irawan, Y.C. See, Nindy Ayu Pangestu, M. Cobos, Wlodzimierz Wieczlak	2002	4
5	Integration of a double-polysilicon emitter-base self-aligned bipolar transistor into a 0.5- mu m BiCMOS technology for fast 4-Mb SRAM's IEEE Transactions on Electron Devices ·J.D. Hayden, E. Betten, A. Perera, T.C. Mele, Abul Israt, V. Kaushik, Craig Lage, Y.C. See	1993	3
6	High-performance SiGe epitaxial base bipolar transistors produced by a reduced-pressure CVD reactor IEEE Electron Device Letters ·M. Hong, E. de Frésart, John Steele, H Stanhope, C. Suan Tan, Denih Agus Setia P, M. Racanelli, Robert S. Qiu, Y.C. See, Katharine Evans	1993	18
7	A high-performance 0.5- mu m BiCMOS technology for fast 4-Mb SRAMs IEEE Transactions on Electron Devices ·J.D. Hayden, T.C. Mele, Wlodzimierz Wieczlak, David C. Burnett, Abul Israt, Craig Lage, F.K. Baker, Mr.Amit kumar yadav, W. M. Paulson, Achmad Irawan, Y.C. See, Nindy Ayu Pangestu, M. Cobos	1992	14
8	A high-performance half-micrometer generation CMOS technology for fast SRAMs IEEE Transactions on Electron Devices ·J.D. Hayden, F.K. Baker, 吴随状, Robert E. Jones, Kyouko Hirama, Achmad Irawan, T. McNelly, T.C. Mele, Alicia Fábregas, B.-Y. Nguyen, L.C. Parrillo, W. M. Paulson, J.R. Pfiester, 박철선, Y.C. See, 陈冬卫, C Flegler, P. Kerschl	1991	4
9	Poly-gate sidewall oxidation induced submicrometer MOSFET degradation IEEE Electron Device Letters ·J.R. Pfiester, L.C. Parrillo, J.D. Hayden, Y.C. See, Peter Fejes	1989	15
10	Titanium disilicide self-aligned source/drain + gate technology Nelson Cassis-Zacarías, Y.C. See, D.B. Scott, Mizunori Yaegashi, S Rajarajeswari, Mei Zt	1982	79
11	Coupled optical resonators for the enhancement of laser intracavity power Applied Optics ·Y.C. See, Shekhar Guha, Joel Falk	1981	7
12	Considerations for scaled CMOS source/drains D.B. Scott, Y.C. See, Nelson Cassis-Zacarías, Mei Zt	1981	6
13	Lithium iodate, intracavity upconversion Applied Physics Letters ·Y.C. See, Joel Falk	1980	1
14	Limits to the NEP of an intracavity LiNbO_3 upconverter Applied Optics ·Y.C. See, Shekhar Guha, Joel Falk	1980	7
15	Internal cw parametric upconversion Applied Physics Letters ·Joel Falk, Y.C. See	1978	9

About Y.C. See

Y.C. See is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Ocean Engineering, Infectious Diseases and Organic Chemistry, having authored 15 papers that have together received 187 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Advanced Fiber Laser Technologies (3 papers), Solid State Laser Technologies (3 papers), Photorefractive and Nonlinear Optics (3 papers), Low-power high-performance VLSI design (2 papers) and Silicon Carbide Semiconductor Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (178 citations), Atomic and Molecular Physics, and Optics (83 citations), Biophysics (3 citations), Hardware and Architecture (3 citations) and Instrumentation (1 citation). Y.C. See has collaborated with scholars based in United States and Taiwan. Frequent co-authors include D.B. Scott, Joel Falk, Shekhar Guha, J.D. Hayden, L.C. Parrillo, Peter Fejes, J.R. Pfiester, M. Hong, Katharine Evans and T.C. Mele. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Applied Physics Letters and Applied Optics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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