M.S. Liang

1.5k total citations
104 papers, 960 citations indexed

About

M.S. Liang is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, M.S. Liang has authored 104 papers receiving a total of 960 indexed citations (citations by other indexed papers that have themselves been cited), including 95 papers in Electrical and Electronic Engineering, 28 papers in Electronic, Optical and Magnetic Materials and 11 papers in Materials Chemistry. Recurrent topics in M.S. Liang's work include Semiconductor materials and devices (74 papers), Advancements in Semiconductor Devices and Circuit Design (42 papers) and Copper Interconnects and Reliability (28 papers). M.S. Liang is often cited by papers focused on Semiconductor materials and devices (74 papers), Advancements in Semiconductor Devices and Circuit Design (42 papers) and Copper Interconnects and Reliability (28 papers). M.S. Liang collaborates with scholars based in Taiwan, United States and China. M.S. Liang's co-authors include Chengpu Yu, S.C. Chen, Yinxi Jin, S.M. Jang, C. H. Yu, J.-Y. Choi, R.W. Brodersen, S.Y. Wu, Miao Yu and Fu‐Hsiang Ko and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

M.S. Liang

91 papers receiving 916 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M.S. Liang Taiwan 17 834 149 119 96 86 104 960
Kiyoshi Yoneda Japan 15 488 0.6× 277 1.9× 42 0.4× 196 2.0× 54 0.6× 50 714
Yayi Wei China 13 623 0.7× 138 0.9× 59 0.5× 52 0.5× 266 3.1× 178 769
J. Nulman United States 12 412 0.5× 130 0.9× 112 0.9× 84 0.9× 79 0.9× 45 782
Han Du United Kingdom 14 489 0.6× 122 0.8× 46 0.4× 273 2.8× 93 1.1× 52 650
Michael Winkler Germany 12 532 0.6× 184 1.2× 33 0.3× 76 0.8× 32 0.4× 33 774
J.E. Chung United States 21 1.7k 2.0× 132 0.9× 68 0.6× 96 1.0× 331 3.8× 70 1.8k
Woongje Sung United States 20 1.3k 1.5× 76 0.5× 85 0.7× 185 1.9× 24 0.3× 91 1.4k
P.K. McLarty United States 17 844 1.0× 227 1.5× 72 0.6× 192 2.0× 40 0.5× 37 1.2k
G. Van den bosch Belgium 23 2.0k 2.5× 419 2.8× 99 0.8× 96 1.0× 103 1.2× 198 2.1k
Mingjie Zhang China 15 267 0.3× 131 0.9× 61 0.5× 200 2.1× 70 0.8× 45 450

Countries citing papers authored by M.S. Liang

Since Specialization
Citations

This map shows the geographic impact of M.S. Liang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.S. Liang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.S. Liang more than expected).

Fields of papers citing papers by M.S. Liang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.S. Liang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.S. Liang. The network helps show where M.S. Liang may publish in the future.

Co-authorship network of co-authors of M.S. Liang

This figure shows the co-authorship network connecting the top 25 collaborators of M.S. Liang. A scholar is included among the top collaborators of M.S. Liang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M.S. Liang. M.S. Liang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Yu, Tao, et al.. (2025). Analytic Continual Learning-Based Non-Intrusive Load Monitoring Adaptive to Diverse New Appliances. Applied Sciences. 15(12). 6571–6571. 1 indexed citations
2.
3.
Liang, M.S., et al.. (2025). Corrosion Behavior of Nb-Modified High-Strength Rebar in Simulated Marine Environment. Journal of Materials Engineering and Performance. 34(20). 23790–23805.
4.
Luo, Qingquan, et al.. (2025). Federated learning-based non-intrusive load monitoring adaptive to real-world heterogeneities. Scientific Reports. 15(1). 18223–18223.
5.
Liang, Mengmeng, Yingying Meng, Ying Zhu, et al.. (2024). Application of OSCE-Based Escape Room Approach in Clinical Practice of Nursing Interns in the Department of Gastroenterology. Journal of Biosciences and Medicines. 12(12). 10–21. 2 indexed citations
6.
Fang, Y.K., et al.. (2009). The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs. Solid-State Electronics. 53(8). 892–896. 1 indexed citations
7.
Liang, M.S., et al.. (2008). Accelerating 32nm BEOL technology development by advanced wafer inspection methodology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7140. 71400S–71400S. 1 indexed citations
8.
9.
Hou, Yunfei, Vincent S. Chang, C.C. Chen, et al.. (2007). Effective Work Function Engineering of $\hbox{Ta}_{x}\hbox{C}_{y}$ Metal Gate on Hf-Based Dielectrics. IEEE Electron Device Letters. 28(3). 201–203. 3 indexed citations
10.
Sheu, Yu‐Miin, et al.. (2006). Millisecond Anneal and Short-Channel Effect Control in Si CMOS Transistor Performance. IEEE Electron Device Letters. 27(12). 969–971. 10 indexed citations
11.
Wu, S.Y., et al.. (2005). Virtual metrology: a solution for wafer to wafer advanced process control. 155–157. 84 indexed citations
12.
13.
14.
Chen, Chang‐Hsiao, Y.K. Fang, Chih-Wei Yang, et al.. (2001). Thermally-enhanced remote plasma nitrided ultrathin (1.65 nm) gate oxide with excellent performances in reduction of leakage current and boron diffusion. IEEE Electron Device Letters. 22(8). 378–380. 18 indexed citations
15.
Chen, Chang‐Hsiao, Y.K. Fang, Chih-Wei Yang, et al.. (2001). High-quality ultrathin (1.6 nm) nitride/oxide stack gate dielectrics prepared by combining remote plasma nitridation and LPCVD technologies. IEEE Electron Device Letters. 22(6). 260–262. 8 indexed citations
16.
Chung, Steve S., et al.. (1999). A novel high performance and reliability p-type floating gate n-channel flash EEPROM. 19–20. 7 indexed citations
17.
Liang, M.S., Chun‐Yen Chang, Wen‐Yuan Yang, Chenming Hu, & R.W. Brodersen. (1983). Hot carriers induced degradation in thin gate oxide MOSFETs. 186–189. 12 indexed citations
18.
Liang, M.S., et al.. (1983). Creation and termination of substrate deep depletion in thin oxide MOS Capacitors by charge tunneling. IEEE Electron Device Letters. 4(10). 350–352. 32 indexed citations
19.
Chang, Chih‐Yung, M.S. Liang, Chenming Hu, & R.W. Brodersen. (1983). Carrier tunneling related phenomena in thin oxide MOSFET's. 194–197. 8 indexed citations
20.
Liang, M.S., et al.. (1982). MOSFET Degradation due to stressing of thin oxide. 50–53. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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