K.Y. Chiu

485 total citations
27 papers, 334 citations indexed

About

K.Y. Chiu is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, K.Y. Chiu has authored 27 papers receiving a total of 334 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 2 papers in Mechanics of Materials. Recurrent topics in K.Y. Chiu's work include Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). K.Y. Chiu is often cited by papers focused on Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). K.Y. Chiu collaborates with scholars based in United States, Japan and Taiwan. K.Y. Chiu's co-authors include Fu‐Lan Hsu, J.L. Moll, Tetsuya Iizuka, T. R. Cass, Paul Merchant, Sarah Angelos, Craig Lage, Runchen Fang, Kit Man Cham and Fu-Chieh Hsu and has published in prestigious journals such as Journal of The Electrochemical Society, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.

In The Last Decade

K.Y. Chiu

23 papers receiving 313 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K.Y. Chiu United States 10 325 56 26 14 9 27 334
S. Krishnan United States 13 477 1.5× 37 0.7× 60 2.3× 19 1.4× 16 1.8× 34 499
P.A. McFarland United States 8 231 0.7× 85 1.5× 26 1.0× 22 1.6× 8 0.9× 19 262
C Bulucea United States 10 330 1.0× 67 1.2× 26 1.0× 31 2.2× 8 0.9× 30 342
P.J. Tsang United States 5 382 1.2× 31 0.6× 19 0.7× 33 2.4× 8 0.9× 13 390
Y.C. See United States 8 178 0.5× 83 1.5× 11 0.4× 12 0.9× 3 0.3× 15 187
C. Kerner Belgium 11 347 1.1× 63 1.1× 26 1.0× 40 2.9× 6 0.7× 33 360
J.D. Hayden United States 9 318 1.0× 29 0.5× 35 1.3× 19 1.4× 10 1.1× 34 326
A. Naem Canada 9 272 0.8× 105 1.9× 62 2.4× 40 2.9× 14 1.6× 28 311
D. Lacey United States 8 278 0.9× 30 0.5× 21 0.8× 37 2.6× 3 0.3× 14 282
K. Henson Belgium 11 275 0.8× 58 1.0× 19 0.7× 14 1.0× 8 0.9× 23 279

Countries citing papers authored by K.Y. Chiu

Since Specialization
Citations

This map shows the geographic impact of K.Y. Chiu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K.Y. Chiu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K.Y. Chiu more than expected).

Fields of papers citing papers by K.Y. Chiu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K.Y. Chiu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K.Y. Chiu. The network helps show where K.Y. Chiu may publish in the future.

Co-authorship network of co-authors of K.Y. Chiu

This figure shows the co-authorship network connecting the top 25 collaborators of K.Y. Chiu. A scholar is included among the top collaborators of K.Y. Chiu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K.Y. Chiu. K.Y. Chiu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Chao, Tien‐Sheng, et al.. (1997). Improved flash cell performance by N/sub 2/O annealing of interpoly oxide. IEEE Electron Device Letters. 18(7). 343–345. 7 indexed citations
3.
Chao, Tien‐Sheng, Horng‐Chih Lin, Len-Yi Leu, et al.. (1997). A Radiation-Hard Flash Cell Using Horn-Shaped Floating Gate and N2O Annealing. 1 indexed citations
4.
Kakumu, M., et al.. (1992). Design optimization methodology for deep-submicrometer CMOS device at low-temperature operation. IEEE Transactions on Electron Devices. 39(2). 370–378. 4 indexed citations
5.
6.
Chiu, K.Y., et al.. (1989). Effects of titanium salicide process on MOSFET characteristics. IEEE Transactions on Electron Devices. 36(1). 145–147. 1 indexed citations
7.
Chiu, K.Y., et al.. (1987). Effects of Titanium Salicide Process on Oxide Charge Trapping and Hot-Electron Reliability in Submicron MOS Devices for VLSI. Symposium on VLSI Technology. 65–66.
8.
Wong, S.S., et al.. (1987). HPSAC—A silicided amorphous-silicon contact and interconnect technology for VLSI. IEEE Transactions on Electron Devices. 34(3). 587–592. 21 indexed citations
9.
Cass, T. R., et al.. (1986). TiSi2thickness limitations for use with shallow junctions and SWAMI or LOCOS isolation. IEEE Transactions on Electron Devices. 33(10). 1463–1469. 15 indexed citations
10.
Hsu, Fu-Chieh & K.Y. Chiu. (1985). Effects of Device Processing on Hot-Electron Induced Device Degradation. Symposium on VLSI Technology. 108–109. 1 indexed citations
11.
Hsu, Fu-Chieh, et al.. (1985). Hot-electron degradation in submicron VLSI. 48–51. 9 indexed citations
12.
Cass, T. R., et al.. (1985). The impact of TiSi2 on shallow junctions. 411–414. 5 indexed citations
13.
Hsu, Fu‐Lan & K.Y. Chiu. (1984). Temperature dependence of hot-electron-induced degradation in MOSFET's. IEEE Electron Device Letters. 5(5). 148–150. 73 indexed citations
14.
Hsu, Fu‐Lan & K.Y. Chiu. (1984). Evaluation of LDD MOSFET's based on hot-electron-induced degradation. IEEE Electron Device Letters. 5(5). 162–165. 33 indexed citations
15.
Fang, Runchen, K.Y. Chiu, & J.L. Moll. (1983). Defect Characteristics and Generation Mechanism in a Bird Beak Free Structure by Sidewall Masked Technique. Journal of The Electrochemical Society. 130(1). 190–196. 6 indexed citations
16.
Chiu, K.Y., et al.. (1983). The sloped-wall SWAMI—A defect-free zero bird's-beak local oxidation process for scaled VLSI technology. IEEE Transactions on Electron Devices. 30(11). 1506–1511. 25 indexed citations
17.
Chiu, K.Y., et al.. (1982). The SWAMI - A Defect Free and Near-Zero Bird's Beak Local Oxidation Technology for VLSI. Symposium on VLSI Technology. 28–29. 2 indexed citations
18.
19.
Chiu, K.Y., et al.. (1982). A bird's beak free local oxidation technology feasible for VLSI circuits fabrication. IEEE Transactions on Electron Devices. 29(4). 536–540. 54 indexed citations
20.
Srour, J. R., et al.. (1973). Radiation Effects on Semiconductor Materials and Devices.. Defense Technical Information Center (DTIC). 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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