Y. E. Strausser

1.3k total citations
35 papers, 1.0k citations indexed

About

Y. E. Strausser is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, Y. E. Strausser has authored 35 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 14 papers in Atomic and Molecular Physics, and Optics and 12 papers in Computational Mechanics. Recurrent topics in Y. E. Strausser's work include Semiconductor materials and devices (13 papers), Force Microscopy Techniques and Applications (8 papers) and Ion-surface interactions and analysis (6 papers). Y. E. Strausser is often cited by papers focused on Semiconductor materials and devices (13 papers), Force Microscopy Techniques and Applications (8 papers) and Ion-surface interactions and analysis (6 papers). Y. E. Strausser collaborates with scholars based in United States, Taiwan and Norway. Y. E. Strausser's co-authors include J. S. Johannessen, W. E. Spicer, C. R. Helms, R. W. Collins, James S. Speck, P. Hansen, Andrew Erickson, Steven P. DenBaars, V. Narayanamurti and Umesh K. Mishra and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

Y. E. Strausser

33 papers receiving 974 citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author						Papers	Cites
Y. E. Strausser	691	383	367	224	206	35	1.0k
M. Grundner	905 1.3×	586 1.5×	442 1.2×	156 0.7×	149 0.7×	28	1.4k
J. L. Sacedón	387 0.6×	346 0.9×	455 1.2×	92 0.4×	144 0.7×	80	910
M. Tamura	1.5k 2.1×	559 1.5×	538 1.5×	463 2.1×	191 0.9×	147	1.7k
H. Cerva	994 1.4×	613 1.6×	590 1.6×	125 0.6×	193 0.9×	91	1.5k
N.R. Parikh	598 0.9×	677 1.8×	345 0.9×	214 1.0×	222 1.1×	85	1.2k
Seijiro Furukawa	952 1.4×	398 1.0×	618 1.7×	254 1.1×	67 0.3×	99	1.3k
M. Berti	886 1.3×	480 1.3×	700 1.9×	286 1.3×	191 0.9×	102	1.4k
Eiichi Nomura	591 0.9×	280 0.7×	354 1.0×	189 0.8×	53 0.3×	46	1.1k
Cock Lodder	270 0.4×	247 0.6×	532 1.4×	97 0.4×	115 0.6×	35	906
C. J. Buiocchi	992 1.4×	575 1.5×	873 2.4×	140 0.6×	100 0.5×	31	1.5k

Countries citing papers authored by Y. E. Strausser

Since Specialization

Citations

This map shows the geographic impact of Y. E. Strausser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. E. Strausser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. E. Strausser more than expected).

Fields of papers citing papers by Y. E. Strausser

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. E. Strausser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. E. Strausser. The network helps show where Y. E. Strausser may publish in the future.

Co-authorship network of co-authors of Y. E. Strausser

This figure shows the co-authorship network connecting the top 25 collaborators of Y. E. Strausser. A scholar is included among the top collaborators of Y. E. Strausser based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. E. Strausser. Y. E. Strausser is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Pey, K. L., et al.. (2005). Scanning capacitance microscopy analysis of dram trench capacitors. 43. 79–85.

Marx, Egon, et al.. (2002). Power spectral densities: A multiple technique study of different Si wafer surfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 20(1). 31–41. 30 indexed citations

Marx, Egon, et al.. (1998). Round robin determination of power spectral densities of different Si wafer surfaces. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3275. 26–26. 3 indexed citations

Hansen, P., Y. E. Strausser, Andrew Erickson, et al.. (1998). Scanning capacitance microscopy imaging of threading dislocations in GaN films grown on (0001) sapphire by metalorganic chemical vapor deposition. Applied Physics Letters. 72(18). 2247–2249. 223 indexed citations

Edwards, Hal, et al.. (1998). Influence of data analysis and other factors on the short-term stability of vertical scanning-probe microscope calibration measurements. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(2). 633–644. 10 indexed citations

Lee, Joungchel, et al.. (1997). Analysis of the growth processes of plasma-enhanced chemical vapor deposited diamond films from CO/H2 and CH4/H2 mixtures using real-time spectroellipsometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 15(4). 1929–1936. 7 indexed citations

Stringfellow, G. B., et al.. (1995). Atomic force microscopy study of ordered GaInP. Applied Physics Letters. 66(23). 3155–3157. 23 indexed citations

Headrick, Randall L., J.‐M. Baribeau, & Y. E. Strausser. (1995). Anisotropic roughness in Ge/Si superlattices. Applied Physics Letters. 66(1). 96–98. 34 indexed citations

Stringfellow, G. B., et al.. (1995). Step structure during organometallic vapor phase epitaxial growth of ordered GaInP. Journal of Electronic Materials. 24(11). 1591–1595. 6 indexed citations

10.

Strausser, Y. E., et al.. (1993). Study of Silicon Surface Roughness by Atomic Force Microscopy. MRS Proceedings. 324. 3 indexed citations

11.

Strausser, Y. E., et al.. (1987). The Effect of Metal Film Topography and Lithography on Grain Size Distributions and on Electromigration Performance. Reliability physics. 140–144. 6 indexed citations

12.

Strausser, Y. E., et al.. (1981). Digital Auger data processing in NiCo alloy films and Cu/NiCo layered structures. Thin Solid Films. 84(2). 145–153. 21 indexed citations

13.

Musket, R. G. & Y. E. Strausser. (1980). Detection of monolayer quantities of oxygen on silicon using energy-dispersive x-ray spectrometry. Applied Physics Letters. 37(5). 478–480. 6 indexed citations

14.

Paterson, Peter, Paul H. Holloway, & Y. E. Strausser. (1980). Energy referencing of Auger electron spectra from charging samples by implanted inert gas spectra. Applications of Surface Science. 4(1). 37–50. 10 indexed citations

15.

Johannessen, J. S., W. E. Spicer, & Y. E. Strausser. (1979). LVVSpectra of Si, SiO₂and Si₃N₄. Physica Scripta. 19(4). 355–359. 3 indexed citations

16.

Strausser, Y. E., et al.. (1978). Submicron Auger spectroscopy study of reed contact failures. Thin Solid Films. 53(1). 63–64. 1 indexed citations

17.

Strausser, Y. E., E. J. Scheibner, & J. S. Johannessen. (1978). Observations of Al2O3 and free silicon at the interface between aluminum films and SiO2. Thin Solid Films. 52(2). 203–214. 23 indexed citations

18.

Strausser, Y. E. & J. S. Johannessen. (1976). Abstract: AES characterization of oxidized films of Mg, Al, and Si. Journal of Vacuum Science and Technology. 13(1). 48–49. 8 indexed citations

19.

Johannessen, J. S., W. E. Spicer, & Y. E. Strausser. (1976). An Auger analysis of the SiO2-Si interface. Journal of Applied Physics. 47(7). 3028–3037. 214 indexed citations

20.

Strausser, Y. E.. (1969). Review of Outgassing Results. Shinku. 12(11). 389–404. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact