H. Cerva

2.0k citations

91 papers · 1.5k indexed · h-index 23

Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications 9
Atomic and Molecular Physics, and Optics top 5%
- Semiconductor Quantum Structures and Devices 22
- Semiconductor materials and interfaces 15
Electrical and Electronic Engineering top 5%
- Integrated Circuits and Semiconductor Failure Analysis 24
- Silicon and Solar Cell Technologies 23
- Semiconductor materials and devices 17
Condensed Matter Physics top 5%
Materials Chemistry top 10%
- Silicon Nanostructures and Photoluminescence 10
Surfaces, Coatings and Films
- Electron and X-Ray Spectroscopy Techniques 12

Co-authors: J. Wecker W. Wegscheider W. Graeff Sabrina L. J. Thomä W. Schröter H. Oppolzer D. Bimberg A. Krost
Cited by: Structural Biology Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering
Journals: Applied Physics Letters (9 papers)Journal of Applied Physics (7 papers)Journal of Crystal Growth (6 papers)
Partner nations: Germany Austria United States

In The Last Decade

H. Cerva

90 papers receiving 1.5k citations

Peers

Countries citing papers authored by H. Cerva

Since Specialization

Citations

This map shows the geographic impact of H. Cerva's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Cerva with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Cerva more than expected).

Fields of papers citing papers by H. Cerva

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Cerva. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Cerva. The network helps show where H. Cerva may publish in the future.

Co-authorship network

The 25 scholars most cited alongside H. Cerva, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H. Cerva Line = papers co-authored together H. Cerva links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Organic Peracid Etches: A New Class of Chromium Free Etch Solutions for the Delineation of Defects in Different Semiconducting Materials ECS Transactions ·Claire Riddell,Bernd O. Kolbesen,H. Cerva,张广开	2007	4
2	Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability Materials science forum ·Roland Rupp,Michael Treu,P. Türkes,F. J. Méndez,T. Scherg,H. Preis,H. Cerva	2005	16
3	Interfacial layers and their effect on leakage current in mocvd-deposited SBT thin films Integrated ferroelectrics ·Ártemis Soares,H. Reisinger,G. Steinlesberger,H. Schroeder,장선미 김태기,Alessandra Martina,H. Cerva,H. von Philipsborn,Rainer Waser	2001	3
4	A novel high performance adhesion enhancing Zn-Cr leadframe coating for popcorn prevention IEEE Transactions on Advanced Packaging ·Liliana Marta F,Ng Xin Jie,H. Cerva,T. F. D.,M. Marzioni	1999	12
5	Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum ·H. Cerva	1997	7
6	Nanostructured Nd–Fe–B magnets with enhanced remanence Applied Physics Letters ·J. Wecker,K. Schnitzke,H. Cerva,Werner Grogger	1995	42
7	Imaging of La/Sr Vacancy Defects in La0.8Sr0.2MnO3 by High-Resolution Transmission Electron Microscopy Journal of Solid State Chemistry ·H. Cerva	1995	6
8	InGaAs/InP quantum wells on vicinal Si(001): Structural and optical properties Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Marius Grundmann,A. Krost,D. Bimberg,H. Cerva	1992	2
9	Microcrystallites in Oxidized Porous Silicon MRS Proceedings ·V. Lehmann,H. Cerva,B. Jobst,V. Petrova-Koch,A. Kux,Thanawadee Chantean	1992	1
10	Comparison of Transmission Electron Microscope Cross Sections of Amorphous Regions in Ion Implanted Silicon with Point‐Defect Density Calculations Journal of The Electrochemical Society ·H. Cerva,G. Hobler	1992	36
11	High-resolution electron microscopy of diamond hexagonal silicon in low pressure chemical vapor deposited polycrystalline silicon Journal of materials research/Pratt's guide to venture capital sources ·H. Cerva	1991	40
12	The influence of non-linear interference processes on the HREM contrast of AlGaAs in 〈100〉 projection Ultramicroscopy ·Sabrina L. J. Thomä,H. Cerva	1991	27
13	Process-induced defects in VLSI Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Bernd O. Kolbesen,W. Bergholz,H. Cerva,Zeeshan Ali,Ashraf F. El-Kerm,G. Zoth	1991	3
14	Characterisation of heteroepitaxial compound semiconductor layers and superlattices using transmission electron microscopy Progress in Crystal Growth and Characterization of Materials ·H. Cerva,H. Oppolzer	1990	16
15	Film redeposition on vertical surfaces during reactive ion etching Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·David D. Allred,S. Jäckel,C. Mazuré,ABC Marketing,H. Cerva,W. Hösler	1989	11
16	Investigation of the critical layer thickness in elastically strained InGaAs/GaAlAs quantum wells by photoluminescence and transmission electron microscopy Applied Physics Letters ·J.P. Reithmaier,H. Cerva,R. Lösch	1989	41
17	Microstructure and Crystal Structure of Bismuth Oxide Phases in Zinc Oxide Varistor Ceramics Journal of the American Ceramic Society ·H. Cerva,Eyuche Lawretta Ozoemena	1988	49
18	Transmission electron microscope study of lattice damage and polymer coating formed after reactive ion etching of SiO2 Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·H. Cerva,Evita Mohr,H. Oppolzer	1987	17
19	Lattice defects in single-crystal lithium niobate II. Electric fields of dislocations and small-angle grain boundaries Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties ·H. Cerva,P. Pongratz,P. Skalický	1986	12
20	Contrast investigations of surface acoustic waves by stroboscopic topography. I. Orientation contrast physica status solidi (a) ·H. Cerva,W. Graeff	1984	56

About H. Cerva

H. Cerva is a scholar working on Structural Biology, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 91 papers that have together received 1.5k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (24 papers), Silicon and Solar Cell Technologies (23 papers), Semiconductor Quantum Structures and Devices (22 papers), Semiconductor materials and devices (17 papers), Semiconductor materials and interfaces (15 papers), Electron and X-Ray Spectroscopy Techniques (12 papers), Silicon Nanostructures and Photoluminescence (10 papers) and Advanced Electron Microscopy Techniques and Applications (9 papers). The work is most often cited by research in Structural Biology (63 citations), Atomic and Molecular Physics, and Optics (590 citations) and Electrical and Electronic Engineering (994 citations). H. Cerva has collaborated with scholars based in Germany, Austria and United States. Frequent co-authors include J. Wecker, W. Wegscheider, W. Graeff, Sabrina L. J. Thomä, W. Schröter, H. Oppolzer, D. Bimberg, A. Krost, G. Hobler and V. Lehmann. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of Crystal Growth, Ultramicroscopy and Journal of The Electrochemical Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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