J. Schneir

2.9k citations

37 papers · 2.2k indexed · 2 hit papers · h-index 19

Impact in

Structural Biology top 1%
Atomic and Molecular Physics, and Optics top 1%
- Force Microscopy Techniques and Applications
- Surface and Thin Film Phenomena
- Mechanical and Optical Resonators

Papers in

Structural Biology 5
- Advanced Electron Microscopy Techniques and Applications 5
Atomic and Molecular Physics, and Optics 26
- Force Microscopy Techniques and Applications 22
- Surface and Thin Film Phenomena 12
- Mechanical and Optical Resonators 6

Co-authors: John A. Dagata J. Bennett H. H. Harary Paul K. Hansma C. J. Evans Michael T. Postek Virgil B. Elings John Gurley
Journals: Applied Physics Letters (5 papers)Journal of Applied Physics (3 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Microscopy and Microanalysis (1 paper)Ultramicroscopy (1 paper)
Partner nations: United States Belgium Denmark

In The Last Decade

J. Schneir

37 papers receiving 2.0k citations

Hit Papers

align trajectories log scale

Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air 1990 · 570 citations

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if any of the following hold:

it has ≥500 total citations;
it reaches ≥1.5× the top-1% citation threshold for papers in the same subfield and year (the threshold is the minimum needed to enter the top 1%, not the average within it);
it reaches the top citation threshold in at least one of its specific research topics.

1990 Applied Physics Letters
1989 Journal of Applied Physics

Peers

Countries citing papers authored by J. Schneir

Since Specialization

Citations

This map shows the geographic impact of J. Schneir's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Schneir with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Schneir more than expected).

Fields of papers citing papers by J. Schneir

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Schneir. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Schneir. The network helps show where J. Schneir may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Schneir, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Schneir Line = papers co-authored together J. Schneir links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Spatial Distribution Maps for Atom Probe Tomography Microscopy and Microanalysis ·B. Geiser, Thomas F. Kelly, David J. Larson, J. Schneir, 이호일	2007	145
2	100-nm-pitch standard characterization for metrology applications Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·M. Tortonese, Azime Berna Oezcelik, Əliəf Cabbarov Şəfa Quliyeva Şəfa Quliyeva, J. Schneir, I. Smith	2002	18
3	Influence of data analysis and other factors on the short-term stability of vertical scanning-probe microscope calibration measurements Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Hal Edwards, Haldane Luther Johnson, John A. Dagata, Y. E. Strausser, J. Schneir	1998	10
4	High-resolution profilometry for improved overlay measurements of CMP-processed layers Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ji Hyeon Jeong, J. Schneir	1998	2
5	Increasing the value of atomic force microscopy process metrology using a high-accuracy scanner, tip characterization, and morphological image analysis Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·J. Schneir, John S. Villarrubia, Carlos Escobar Ibanez, J Oldenburg, 李志峰李志峰	1996	11
6	<title>Toward accurate linewidth metrology using atomic force microscopy and tip characterization</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ronald G. Dixson, J. Schneir, Carlos Escobar Ibanez, R. Higginbotham, J Oldenburg, Saleem H. Zaidi, S. R. J. Brueck	1996	1
7	A Study of the Surface Texture of Polycrystalline Phosphor Films Using Atomic Force Microscopy MRS Proceedings ·J D COOPER, J. Schneir, Lorena Carvalho de Souza Chaves, John S. Villarrubia, Savita Sethi, James P. Cline, B.B. Govorkov, W. Wong‐Ng	1994	3
8	Scanning tunneling microscope-based nanostructure fabrication system* Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·J. Schneir, John A. Dagata, H. H. Harary	1993	3
9	Nanofabrication and characterization using a scanning tunneling microscope Nanotechnology ·John A. Dagata, W. F. Tseng, J. Schneir, Richard M. Silver	1993	2
10	Integration of scanning tunneling microscope nanolithography and electronics device processing Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·John A. Dagata, W. F. Tseng, J. Bennett, E. A. Dobisz, J. Schneir, H. H. Harary	1992	28
11	Pattern generation on semiconductor surfaces by a scanning tunneling microscope operating in air Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·John A. Dagata, J. Schneir, H. H. Harary, J. Bennett, W. F. Tseng	1991	60
12	An atomic-resolution atomic-force microscope implemented using an optical lever Journal of Applied Physics ·S. Alexander, L. Hellemans, Othmar Marti, J. Schneir, Virgil B. Elings, Paul K. Hansma, E. Luther Corley, John Gurley Hit paper breakdown →	1989	436
13	Scanning Tunneling Microscopy Of Optical Surfaces Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·J. Schneir, John A. Dagata, H. H. Harary, C. J. Evans, A.J. Melmed, H. B. Elswijk, J. E. Sauvageau	1989	5
14	Creating And Observing Surface Features With A Scanning Tunneling Microscope Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·J. Schneir, P. K. Hansma, Virgil B. Elings, John Gurley, Wili Wiliana, Richard Sonnenfeld	1988	17
15	Scanning probe microscopy of biological samples and other surfaces Journal of Microscopy ·Othmar Marti, Virgil B. Elings, Hollie K. Berglof, C. E. Bracker, J. Schneir, B. Drake, S. A. C. Gould, John Gurley, L. Hellemans, K. A. Shaw, A. L. Weisenhorn, Joseph A. Zasadzinski, Paul K. Hansma	1988	29
16	Tunneling microscopy, lithography, and surface diffusion on an easily prepared, atomically flat gold surface Journal of Applied Physics ·J. Schneir, Richard Sonnenfeld, Othmar Marti, P. K. Hansma, J. E. Demuth, Robert J. Hamers	1988	107
17	Scanning Tunneling Microscopy of Freeze-Fracture Replicas of Biomembranes Science ·Joseph A. Zasadzinski, J. Schneir, John Gurley, Virgil B. Elings, Paul K. Hansma	1988	132
18	Scanning tunneling microscopy and lithography of solid surfaces covered with nonpolar liquids Langmuir ·J. Schneir, P. K. Hansma	1987	20
19	Scanning tunneling microscopy of processes at liquid-solid interfaces Surface Science Letters ·B. Drake, Richard Sonnenfeld, J. Schneir, Paul K. Hansma	1987	1
20	Tunneling microscopy study of the graphite surface in air and water Physical review. B, Condensed matter ·J. Schneir, Richard Sonnenfeld, Paul K. Hansma, J. Tersoff	1986	73

About J. Schneir

J. Schneir is a scholar working on Structural Biology, Atomic and Molecular Physics, and Optics, Metals and Alloys, Electrochemistry and Surfaces, Coatings and Films, having authored 37 papers that have together received 2.2k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (22 papers), Surface and Thin Film Phenomena (12 papers), Advanced Materials Characterization Techniques (9 papers), Mechanical and Optical Resonators (6 papers), Advanced Electron Microscopy Techniques and Applications (5 papers), Advanced Measurement and Metrology Techniques (4 papers), nanoparticles nucleation surface interactions (4 papers) and Semiconductor materials and devices (4 papers). The work is most often cited by research in Structural Biology (169 citations), Atomic and Molecular Physics, and Optics (1.7k citations), Metals and Alloys (79 citations), Biomedical Engineering (927 citations) and Surfaces, Coatings and Films (125 citations). J. Schneir has collaborated with scholars based in United States, Belgium and Denmark. Frequent co-authors include John A. Dagata, J. Bennett, H. H. Harary, Paul K. Hansma, C. J. Evans, Michael T. Postek, Virgil B. Elings, John Gurley, Othmar Marti and Richard Sonnenfeld. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Microscopy and Microanalysis and Ultramicroscopy.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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