Seiji Kajihara
- Electrical and Electronic Engineering top 2%
- Hardware and Architecture top 0.2%
- Control and Systems Engineering top 5%
- Software top 5%
- Computer Networks and Communications
- Co-authors
- Kohei MiyaseS.M. ReddyIrith PomeranzK. KinoshitaXiaoqing WenKewal K. SalujaYasuo SatôLaung‐Terng Wang
- Topics
- VLSI and Analog Circuit Testing (139 papers)Integrated Circuits and Semiconductor Failure Analysis (124 papers)Radiation Effects in Electronics (33 papers)
- Journals
- IEEE AccessIEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsIEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Partner nations
- JapanUnited StatesGermany
In The Last Decade
Seiji Kajihara
145 papers receiving 2.4k citations
Peers
Comparison fields: 5 of 38
- Electrical and Electronic Engineering 2.4k
- Hardware and Architecture 2.3k
- Control and Systems Engineering 263
- Software 109
- Computer Networks and Communications 39
Countries citing papers authored by Seiji Kajihara
This map shows the geographic impact of Seiji Kajihara's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Seiji Kajihara with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Seiji Kajihara more than expected).
Fields of papers citing papers by Seiji Kajihara
This network shows the impact of papers produced by Seiji Kajihara. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Seiji Kajihara. The network helps show where Seiji Kajihara may publish in the future.
Co-authorship network of co-authors of Seiji Kajihara
This figure shows the co-authorship network connecting the top 25 collaborators of Seiji Kajihara. A scholar is included among the top collaborators of Seiji Kajihara based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Seiji Kajihara. Seiji Kajihara is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 3 | |
| 3 | High Field Reliability Using Built-In Self Test | 0 |
| 4 | 3 | |
| 5 | 0 | |
| 6 | 89 | |
| 7 | 38 | |
| 8 | Don't Care Identification and Statistical Encoding for Test Data Compression | 1 |
| 9 | 6 | |
| 10 | 16 | |
| 11 | 7 | |
| 12 | 11 | |
| 13 | Average Power Reduction in Scan Testing by Test Vector Modification | 1 |
| 14 | 55 | |
| 15 | A Redundancy Removal Method for Sequential Circuits Based on Unreachable States | 0 |
| 16 | 1 | |
| 17 | Retiming for Sequential Circuits with a Specified Initial State and Its Application to Testability Enhancement | 2 |
| 18 | Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis | 1 |
| 19 | Test Sequence Generation for Sequential Circuits with Distinguishing Sequences (Special Section on VLSI Design and CAD Algorithms) | 1 |
| 20 | 17 |
About Seiji Kajihara
Seiji Kajihara is a scholar working on Hardware and Architecture, Software and Electrical and Electronic Engineering, having authored 155 papers that have together received 2.5k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (139 papers), Integrated Circuits and Semiconductor Failure Analysis (124 papers) and Radiation Effects in Electronics (33 papers). The work is most often cited by research in Hardware and Architecture (2.3k citations), Electrical and Electronic Engineering (2.4k citations) and Software (109 citations). Seiji Kajihara has collaborated with scholars based in Japan, United States and Germany. Frequent co-authors include Kohei Miyase, S.M. Reddy, Irith Pomeranz, K. Kinoshita, Xiaoqing Wen, Kewal K. Saluja, Yasuo Satô, Laung‐Terng Wang, Yoshiyuki Yamashita and Shuji Hamada. Their work appears in journals such as IEEE Access, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.