S.A. Campbell

805 citations

31 papers · 661 indexed · h-index 14

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
Materials Chemistry
- Electronic and Structural Properties of Oxides

Papers in

Electrical and Electronic Engineering 27
- Semiconductor materials and devices 22
- Integrated Circuits and Semiconductor Failure Analysis 13
- Advancements in Semiconductor Devices and Circuit Design 8
- Ferroelectric and Negative Capacitance Devices 4
- Silicon and Solar Cell Technologies 3
- Silicon Carbide Semiconductor Technologies 3
Atomic and Molecular Physics, and Optics 10
- Semiconductor materials and interfaces 8

Co-authors: V. V. Afanas’ev A. Stesmans Heiko O. Jacobs Xiaoqing Shi Hyeon-Seag Kim Ryan C. Smith Wayne L. Gladfelter Susanne Stemmer
Journals: Journal of Applied Physics (5 papers)Applied Physics Letters (4 papers)IEEE Transactions on Electron Devices (2 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)IEEE Transactions on Nuclear Science (2 papers)
Partner nations: United States Belgium Canada

In The Last Decade

S.A. Campbell

26 papers receiving 638 citations

Peers

Countries citing papers authored by S.A. Campbell

Since Specialization

Citations

This map shows the geographic impact of S.A. Campbell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.A. Campbell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.A. Campbell more than expected).

Fields of papers citing papers by S.A. Campbell

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.A. Campbell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.A. Campbell. The network helps show where S.A. Campbell may publish in the future.

Co-authors

The 25 scholars most cited alongside S.A. Campbell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S.A. Campbell Line = papers co-authored together S.A. Campbell links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Photoconductivity of Hf-based binary metal oxide systems Journal of Applied Physics ·S. Shamuilia, V. V. Afanas’ev, A. Stesmans, Ezikwa Tenas Godswill, S.A. Campbell, Mohamed Boutchich, M. Roeckerath, T. Heeg, J. M. J. Lopes, J. Schubert	2008	12
2	Bright Green Visible Electroluminescence from Rare Earth Doped Silicon Rich SiOx Peter Mascher, 于跃洋, S. C. Gujrathi, J. Wójcik, Michael Flynn, I. D. Calder, Jaidi Sutomo Nim., Donald W. DuCharme, S.A. Campbell, Anno Zuhrias, 于跃洋, M. Życzkowski, Anno Zuhrias	2006	1
3	A multiple quantum well integrated with a selectively grown quaternary layer Semiconductor Science and Technology ·J. Greenspan, S.A. Campbell, I. Shih	2006	2
4	A Study on Charge Reduction in HfO<tex>$_2$</tex>Gate Stacks IEEE Transactions on Electron Devices ·翟成凯, Risma Satria Wijaya, S.A. Campbell	2005	16
5	Impact of nitrogen incorporation on interface states in (100)Si∕HfO2 Journal of Applied Physics ·Yanina Fedorenko, 王玉震, V. V. Afanas’ev, A. Stesmans, Tzaig Ilanit, S.A. Campbell	2005	15
6	Electrical and material characterizations of high-permittivity HfxTi1−xO2 gate insulators Journal of Applied Physics ·琢哉板垣, V. Ramachandran, S.A. Campbell, Wayne L. Gladfelter, 秀吉谷ヶ城, D. O. Klenov, Susanne Stemmer	2005	42
7	Paramagnetic NO2 centers in thin γ-irradiated HfO2 layers on (100)Si revealed by electron spin resonance Applied Physics Letters ·A. Stesmans, V. V. Afanas’ev, 郗颖, S.A. Campbell	2004	14
8	A new method for extracting EOT for leaky insulators Microelectronic Engineering ·Gaëtan Staquet, P. Latas-P�rez, S.A. Campbell	2004	7
9	Electronic Properties of SiON/HfO<sub>2</sub> Insulating Stacks on 4H-SiC (0001) Materials science forum ·Valeri Afanas’ev, S.A. Campbell, Kuan Yew Cheong, Florin Ciobanu, Sima Dimitrijev, Gerhard Pensl, A. Stesmans, Kerime Seda Arık	2004	7
10	Fabrication and characterization of a solenoid-type microtransformer IEEE Transactions on Magnetics ·Syohei Tamaki, Amanda Addai, Lia aulina, S.A. Campbell	2003	15
11	Semi-insulating silicon for microwave integrated circuits S.A. Campbell	2002	1
12	Electrical reliability of metal-organic chemical vapor deposited high permittivity TiO/sub 2/ dielectric metal-oxide-semiconductor field effect transistors Hyeon-Seag Kim, S.A. Campbell, D. C. Gilmer	2002	1
13	Internal photoemission of electrons and holes from (100)Si into HfO2 Applied Physics Letters ·V. V. Afanas’ev, A. Stesmans, 郗颖, Xiaoqing Shi, S.A. Campbell	2002	165
14	High Permittivity Oxide Gate Stacks on Silicon Incorporating UHV Silicon Nitride Interfacial Layers MRS Proceedings ·Christian Appelt, M. C. Calicchia, T. K. Higman, S.A. Campbell	2001	1
15	The relationship between the resistivity of semi-insulating GaAs and MESFET properties Materials Science and Engineering B ·C. J. Miner, J. E. Zorzi, S.A. Campbell, Société Roman, Thomas Diemant, Karl Borg	1997	1
16	Charge trapping and degradation in high-permittivity TiO₂ dielectric films IEEE Electron Device Letters ·Hyeon-Seag Kim, S.A. Campbell, Marcus V. O. Magalhães	1997	60
17	The use of content addressable memories in the level 2 trigger for the CLAS detector at CEBAF IEEE Transactions on Nuclear Science ·D. Doughty, R. S. Satchell, Н. В. Примачева, Peggy Gesing, S.A. Campbell, Aysun Koltarla, 赵志珍, Cahangir Fəxrəddin oğlu Şükürov	1996	1
18	A content addressable memory for use in CEBAF's CLAS detector level 2 triggering system IEEE Transactions on Nuclear Science ·R. S. Satchell, D. Doughty, Н. В. Примачева, S.A. Campbell, D. V. MAMEDOV, Peggy Gesing	1996	0
19	The kinetics of the oxide charge trapping and breakdown in ultrathin silicon dioxide Journal of Applied Physics ·Robert Emmett Gillespie, S.A. Campbell	1993	15
20	Measurement of Ambient Ground-Level Concentrations of Hydrogen Fluoride JAPCA ·J. Heski, Adelia Suryani Dea, Jun Yi Chu, S.A. Campbell, Raymond F. Miller	1987	0

About S.A. Campbell

S.A. Campbell is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Radiation, Materials Chemistry and Statistics, Probability and Uncertainty, having authored 31 papers that have together received 661 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and interfaces (8 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Electronic and Structural Properties of Oxides (6 papers), Ferroelectric and Negative Capacitance Devices (4 papers), Silicon and Solar Cell Technologies (3 papers) and Silicon Carbide Semiconductor Technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (576 citations), Materials Chemistry (262 citations), Electronic, Optical and Magnetic Materials (90 citations), Atomic and Molecular Physics, and Optics (131 citations) and Surfaces, Coatings and Films (27 citations). S.A. Campbell has collaborated with scholars based in United States, Belgium and Canada. Frequent co-authors include V. V. Afanas’ev, A. Stesmans, Heiko O. Jacobs, Xiaoqing Shi, Hyeon-Seag Kim, A. Stesmans, Ryan C. Smith, Wayne L. Gladfelter, Susanne Stemmer and D. O. Klenov. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, IEEE Transactions on Electron Devices, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and IEEE Transactions on Nuclear Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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