S. Rolfe
- Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials 20
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- Ga2O3 and related materials 12
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- Semiconductor materials and devices 29
- Thin-Film Transistor Technologies 7
- Advanced Semiconductor Detectors and Materials 6
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- Semiconductor Quantum Structures and Devices 17
- Semiconductor materials and interfaces 7
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- Silicon Nanostructures and Photoluminescence 6
S. Rolfe
51 papers receiving 609 citations
Peers
Comparison fields: 5 of 39
- Condensed Matter Physics 417
- Electronic, Optical and Magnetic Materials 245
- Electrical and Electronic Engineering 408
- Atomic and Molecular Physics, and Optics 179
- Materials Chemistry 205
Countries citing papers authored by S. Rolfe
This map shows the geographic impact of S. Rolfe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Rolfe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Rolfe more than expected).
Fields of papers citing papers by S. Rolfe
This network shows the impact of papers produced by S. Rolfe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Rolfe. The network helps show where S. Rolfe may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Rolfe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2010 | 24 | |
| 2 | 2010 | 23 | |
| 3 | 2008 | 5 | |
| 4 | 2005 | 5 | |
| 5 | 2003 | 13 | |
| 6 | 2002 | 6 | |
| 7 | 2002 | 5 | |
| 8 | 2001 | 5 | |
| 9 | 2001 | 7 | |
| 10 | 2000 | 20 | |
| 11 | 1999 | 40 | |
| 12 | 1999 | 139 | |
| 13 | 1998 | 8 | |
| 14 | 1994 | 3 | |
| 15 | 1994 | 4 | |
| 16 | 1993 | 10 | |
| 17 | 1993 | 3 | |
| 18 | 1993 | 2 | |
| 19 | 1991 | 32 | |
| 20 | 1986 | 5 |
About S. Rolfe
S. Rolfe is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Materials Chemistry, having authored 52 papers that have together received 639 indexed citations. Recurring topics across this work include Semiconductor materials and devices (29 papers), GaN-based semiconductor devices and materials (20 papers), Semiconductor Quantum Structures and Devices (17 papers), Ga2O3 and related materials (12 papers), Semiconductor materials and interfaces (7 papers), Thin-Film Transistor Technologies (7 papers), Silicon Nanostructures and Photoluminescence (6 papers) and Advanced Semiconductor Detectors and Materials (6 papers). The work is most often cited by research in Condensed Matter Physics (417 citations), Electronic, Optical and Magnetic Materials (245 citations), Electrical and Electronic Engineering (408 citations), Atomic and Molecular Physics, and Optics (179 citations) and Materials Chemistry (205 citations). S. Rolfe has collaborated with scholars based in Canada, United States and France. Frequent co-authors include J. A. Bardwell, H. Tang, J. B. Webb, J.‐M. Baribeau, J. B. Webb, S. Moisa, J. Fraser, S. Haffouz, Ian G. Foulds and John Hulse. Their work appears in journals such as Applied Physics Letters, Journal of Crystal Growth, Thin Solid Films, Journal of Applied Physics and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.