S. Moisa
- Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials 11
- Materials Chemistry top 5%
- ZnO doping and properties 5
- Mechanics of Materials top 2%
- Metal and Thin Film Mechanics 5
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- Semiconductor materials and devices 22
- Integrated Circuits and Semiconductor Failure Analysis 6
- Semiconductor Lasers and Optical Devices 5
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- Ga2O3 and related materials 9
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- Semiconductor Quantum Structures and Devices 11
- Journals
- Corrosion Science (7 papers)Journal of The Electrochemical Society (5 papers)Applied Physics Letters (4 papers)
- Partner nations
- CanadaUnited KingdomUnited States
In The Last Decade
S. Moisa
46 papers receiving 1.4k citations
Hit Papers
Peers
Comparison fields: 5 of 61
- Condensed Matter Physics 234
- Materials Chemistry 922
- Mechanics of Materials 465
- Electrical and Electronic Engineering 662
- Electronic, Optical and Magnetic Materials 206
Countries citing papers authored by S. Moisa
This map shows the geographic impact of S. Moisa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Moisa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Moisa more than expected).
Fields of papers citing papers by S. Moisa
This network shows the impact of papers produced by S. Moisa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Moisa. The network helps show where S. Moisa may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Moisa, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 3 | |
| 2 | 2015 | 5 | |
| 3 | 2015 | 36 | |
| 4 | 2008 | 2 | |
| 5 | 2008 | 1 | |
| 6 | 2008 | 7 | |
| 7 | 2005 | 5 | |
| 8 | 2003 | 56 | |
| 9 | 2003 | 5 | |
| 10 | 2003 | 13 | |
| 11 | 2003 | 10 | |
| 12 | 2002 | 7 | |
| 13 | 2002 | 14 | |
| 14 | 2002 | 6 | |
| 15 | 2001 | 5 | |
| 16 | 2001 | 19 | |
| 17 | 2001 | 101 | |
| 18 | 1999 | 40 | |
| 19 | 1999 | 12 | |
| 20 | 1994 | 3 |
About S. Moisa
S. Moisa is a scholar working on Condensed Matter Physics, Bioengineering and Electrical and Electronic Engineering, having authored 46 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Semiconductor Quantum Structures and Devices (11 papers), GaN-based semiconductor devices and materials (11 papers), Ga2O3 and related materials (9 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Metal and Thin Film Mechanics (5 papers), ZnO doping and properties (5 papers) and Semiconductor Lasers and Optical Devices (5 papers). The work is most often cited by research in Condensed Matter Physics (234 citations), Materials Chemistry (922 citations) and Mechanics of Materials (465 citations). S. Moisa has collaborated with scholars based in Canada, United Kingdom and United States. Frequent co-authors include Mohamed Chaker, Philippe Mérel, M. Tabbal, J. Margot, J. A. Bardwell, J. Fraser, H. Tang, J. B. Webb, Michel Moisan and A. Ricard. Their work appears in journals such as Corrosion Science, Journal of The Electrochemical Society, Applied Physics Letters, Journal of Crystal Growth and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.