S. Bodnar

628 citations

33 papers · 496 indexed · h-index 13

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices 15
- Silicon and Solar Cell Technologies 10
- Chalcogenide Semiconductor Thin Films 8
- Advancements in Semiconductor Devices and Circuit Design 6
- Thin-Film Transistor Technologies 6
Atomic and Molecular Physics, and Optics top 10%
- Semiconductor materials and interfaces 14
Materials Chemistry
- Silicon Nanostructures and Photoluminescence 8
- Quantum Dots Synthesis And Properties 7
Surfaces, Coatings and Films
Biomedical Engineering

Co-authors: J.L. Regolini P. Boucaud D. Bouchier F. H. Julien Colin G. Francis B. Lambert C. Broussillou Jean–Michel Lourtioz
Cited by: Electrical and Electronic Engineering Atomic and Molecular Physics, and Optics Materials Chemistry
Journals: Thin Solid Films (5 papers)Applied Physics Letters (4 papers)Applied Surface Science (2 papers)
Partner nations: France Israel Spain

In The Last Decade

S. Bodnar

32 papers receiving 483 citations

Peers

Countries citing papers authored by S. Bodnar

Since Specialization

Citations

This map shows the geographic impact of S. Bodnar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Bodnar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Bodnar more than expected).

Fields of papers citing papers by S. Bodnar

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Bodnar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Bodnar. The network helps show where S. Bodnar may publish in the future.

Co-authorship network

The 25 scholars most cited alongside S. Bodnar, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Bodnar Line = papers co-authored together S. Bodnar links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Statistical Process Control for Cu(In,Ga)(S,Se)2 electrodeposition-based manufacturing process of 60×120cm2 modules up to 14,0% efficiency C. Broussillou,Johannes Alexander Jesenko,Andrea Czakó,G. L. Li,P. Grand,S. Bodnar,Sophia; id_orcid 0000-0001-7958-8537 Yakoubov,孙雨红,市郎池上,Airina Kallmyr,L. Parissi,Amin Tafreshi	2015	25
2	Rapid thermal processing annealing challenges for large scale Cu₂ZnSnS₄thin films physica status solidi (a) ·Laura Vauche,Jessica Dubois,O.H. VIVEROS,M. Pasquinelli,S. Bodnar,Christian Souza Barboza,R Beesley	2014	15
3	Impact of electronic defects on the Raman spectra from electrodeposited Cu(In,Ga)Se2 solar cells: Application for non-destructive defect assessment Applied Physics Letters ·Carmen M. Ruiz,Xavier Fontané,Andrew Fairbrother,Víctor Izquierdo‐Roca,C. Broussillou,S. Bodnar,A. Pérez‐Rodríguez,V. Bermúdez	2013	31
4	Formation mechanisms of Cu(In,Ga)Se2 solar cells prepared from electrodeposited precursors Thin Solid Films ·Florian Oliva,C. Broussillou,Ana Heloíza Fernandes de Souza,Theuns Fourie,P. Grand,Alan do Nascimento Muniz,Colin Lockwood Fletcher,S. Bodnar	2012	25
5	Sulfurization of Cu–In electrodeposited precursors for CuInS2-based solar cells Solar Energy Materials and Solar Cells ·C. Broussillou,M. Andrieux,Grzegorz Gudzbeler,Michel Jeandin,J.S. Jaime-Ferrer,S. Bodnar,I. Sarbay	2011	18
6	Integration of CVD silicon nanocrystals in a 32 Mb NOR flash memory Solid-State Electronics ·S. Jacob,B. De Salvo,L. Perniola,Moncada Valencia Jhoan,S. Bodnar,R. Coppard,Glafera Janet Barroga Matanguihan,Makary Musiałek,Daniel Pérez,S. Lombardo,J.W. Mellors,E. Jalaguier,Jianbin Jiao,F. Boulanger,S. Deleonibus	2008	8
7	Integration of CVD silicon nanocrystals in a 32Mb NOR flash memory S. Jacob,Moncada Valencia Jhoan,S. Bodnar,R. Coppard,Glafera Janet Barroga Matanguihan,Makary Musiałek,Jianbin Jiao,B. De Salvo,L. Perniola,E. Jalaguier,F. Boulanger,S. Deleonibus	2007	4
8	Investigation of Reliability Characteristics of Si Nanocrystal NOR Memory Arrays S. Jacob,L. Perniola,Moncada Valencia Jhoan,S. Bodnar,R. Coppard,Glafera Janet Barroga Matanguihan,Jianbin Jiao,E. Jalaguier,F. Boulanger,B. De Salvo,S. Deleonibus	2007	2
9	Simultaneous optical measurement of Ge content and Boron doping in strained epitaxial films using a novel data-analysis technique Materials Science in Semiconductor Processing ·Stephen J. Morris,P. Fougères,Eric Bouffet,S. Bodnar,Stéphane Gaillard	2004	4
10	What is the role of the metal on the Fermi-level position at the interface with IV-IV compounds? Microelectronic Engineering ·V. Aubry-Fortuna,Jacques Jouanna,M. Mamor,F. Meyer,Christer Fröjdh,Göran Thungström,C. S. Petersson,S. Bodnar,J.L. Regolini	1997	6
11	Single-wafer Si and SiGe processes for advanced ULSI technologies Thin Solid Films ·S. Bodnar,胡良荣,J.L. Regolini	1997	5
12	Selective Si and SiGe epitaxial heterostructures grown using an industrial low-pressure chemical vapor deposition module Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·S. Bodnar,Michael Havinga,Pierre Bouillon,M. Mouis,T. Skotnicki,J.L. Regolini	1997	50
13	Schottky barrier heights on IV-IV compound semiconductors Journal of Electronic Materials ·F. Meyer,M. Mamor,V. Aubry-Fortuna,P. Warren,S. Bodnar,D. Dutartre,J.L. Regolini	1996	12
14	Growth of Si 1 − x − y Ge x C y multi-quantum wells: structural and optical properties Thin Solid Films ·P. Boucaud,C. Guedj,F. H. Julien,E. Finkman,S. Bodnar,J.L. Regolini	1996	7
15	Optical properties of bulk and multi-quantum well SiGe: C heterostructures Journal of Crystal Growth ·P. Boucaud,C. Guedj,D. Bouchier,F. H. Julien,Jean–Michel Lourtioz,S. Bodnar,J.L. Regolini,E. Finkman	1995	5
16	Growth of ternary alloy Si1−x−yGexCy by rapid thermal chemical vapor deposition Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·S. Bodnar,J.L. Regolini	1995	28
17	Tunable infrared photoemission sensor on silicon using epitaxial heterostructures Journal of Crystal Growth ·Charles Renard,S. Bodnar,P. A. Badoz,I. Sagnes	1995	1
18	Photoluminescence of strained Si1−yCy alloys grown at low temperature Applied Physics Letters ·P. Boucaud,Colin G. Francis,G. Paściak,F. H. Julien,J.-M. Lourtioz,D. Bouchier,S. Bodnar,J.L. Regolini	1995	39
19	Band-edge and deep level photoluminescence of pseudomorphic Si1−x−yGexCy alloys Applied Physics Letters ·P. Boucaud,Colin G. Francis,F. H. Julien,Jean–Michel Lourtioz,D. Bouchier,S. Bodnar,B. Lambert,J.L. Regolini	1994	78
20	Tunable Infrared Detection Using Epitaxial Silicide/Silicon Heterostructures MRS Proceedings ·I. Sagnes,Y. Campidelli,Florian Chevalier,S. Bodnar,Charles Renard,P. A. Badoz	1993	4

About S. Bodnar

S. Bodnar is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Bioengineering, Materials Chemistry and Surfaces, Coatings and Films, having authored 33 papers that have together received 496 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Semiconductor materials and interfaces (14 papers), Silicon and Solar Cell Technologies (10 papers), Chalcogenide Semiconductor Thin Films (8 papers), Silicon Nanostructures and Photoluminescence (8 papers), Quantum Dots Synthesis And Properties (7 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers) and Thin-Film Transistor Technologies (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (468 citations), Atomic and Molecular Physics, and Optics (204 citations), Materials Chemistry (264 citations), Surfaces, Coatings and Films (12 citations) and Biomedical Engineering (42 citations). S. Bodnar has collaborated with scholars based in France, Israel and Spain. Frequent co-authors include J.L. Regolini, P. Boucaud, D. Bouchier, F. H. Julien, Colin G. Francis, B. Lambert, C. Broussillou, Jean–Michel Lourtioz, Pierre Bouillon and T. Skotnicki. Their work appears in journals such as Thin Solid Films, Applied Physics Letters, Applied Surface Science, Materials Science in Semiconductor Processing and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

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