N. Ohashi
- Electrical and Electronic Engineering
- Biomedical Engineering
- Electronic, Optical and Magnetic Materials top 10%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Co-authors
- Seiichi KondoYoshio HommaN. OwadaJ. NoguchiK. HinodeHiroshi YamaguchiKen’ichi TakedaYasushi Goto
- Topics
- Copper Interconnects and Reliability (22 papers)Semiconductor materials and devices (17 papers)Advanced Surface Polishing Techniques (12 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringBiomedical Engineering
- Journals
- Journal of The Electrochemical SocietyIEEE Transactions on Electron DevicesIEEE Transactions on Power Delivery
- Partner nations
- Japan
In The Last Decade
N. Ohashi
32 papers receiving 347 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 290
- Biomedical Engineering 200
- Electronic, Optical and Magnetic Materials 194
- Materials Chemistry 84
- Atomic and Molecular Physics, and Optics 50
Countries citing papers authored by N. Ohashi
This map shows the geographic impact of N. Ohashi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Ohashi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Ohashi more than expected).
Fields of papers citing papers by N. Ohashi
This network shows the impact of papers produced by N. Ohashi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Ohashi. The network helps show where N. Ohashi may publish in the future.
Co-authorship network of co-authors of N. Ohashi
This figure shows the co-authorship network connecting the top 25 collaborators of N. Ohashi. A scholar is included among the top collaborators of N. Ohashi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Ohashi. N. Ohashi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 12 | |
| 2 | 3 | |
| 3 | 2 | |
| 4 | 1 | |
| 5 | 5 | |
| 6 | 2 | |
| 7 | 1 | |
| 8 | 3 | |
| 9 | 3 | |
| 10 | 4 | |
| 11 | 3 | |
| 12 | 7 | |
| 13 | 25 | |
| 14 | 37 | |
| 15 | 57 | |
| 16 | 75 | |
| 17 | 16 | |
| 18 | 1 | |
| 19 | 6 | |
| 20 | 2 |
About N. Ohashi
N. Ohashi is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Biomedical Engineering, having authored 32 papers that have together received 382 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (22 papers), Semiconductor materials and devices (17 papers) and Advanced Surface Polishing Techniques (12 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (194 citations), Electrical and Electronic Engineering (290 citations) and Biomedical Engineering (200 citations). N. Ohashi has collaborated with scholars based in Japan. Frequent co-authors include Seiichi Kondo, Yoshio Homma, N. Owada, J. Noguchi, K. Hinode, Hiroshi Yamaguchi, Ken’ichi Takeda, Yasushi Goto, S. Kondo and Hiroyuki Maruyama. Their work appears in journals such as Journal of The Electrochemical Society, IEEE Transactions on Electron Devices and IEEE Transactions on Power Delivery.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.