K. Hinode

2.3k total citations
106 papers, 1.8k citations indexed

About

K. Hinode is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, K. Hinode has authored 106 papers receiving a total of 1.8k indexed citations (citations by other indexed papers that have themselves been cited), including 62 papers in Electrical and Electronic Engineering, 42 papers in Electronic, Optical and Magnetic Materials and 36 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in K. Hinode's work include Copper Interconnects and Reliability (42 papers), Semiconductor materials and devices (37 papers) and Physics of Superconductivity and Magnetism (28 papers). K. Hinode is often cited by papers focused on Copper Interconnects and Reliability (42 papers), Semiconductor materials and devices (37 papers) and Physics of Superconductivity and Magnetism (28 papers). K. Hinode collaborates with scholars based in Japan, United States and Portugal. K. Hinode's co-authors include S. Nagasawa, T. Satoh, Mutsuo Hidaka, Yoshihiro Kitagawa, Hiroyuki Akaike, Yoshio Homma, Shoichiro Tanigawa, Masao Doyama, Seiichi Kondo and Ken’ichi Takeda and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Proceedings of the IEEE.

In The Last Decade

K. Hinode

104 papers receiving 1.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Hinode Japan 26 1.2k 673 588 523 427 106 1.8k
C. A. Neugebauer United States 19 1.1k 0.9× 536 0.8× 678 1.2× 233 0.4× 306 0.7× 49 2.0k
Jing Yang China 18 751 0.6× 578 0.9× 685 1.2× 992 1.9× 189 0.4× 220 1.8k
W. Prusseit Germany 26 667 0.6× 559 0.8× 502 0.9× 1.6k 3.0× 110 0.3× 108 2.0k
Robert S. Okojie United States 21 1.9k 1.6× 201 0.3× 409 0.7× 293 0.6× 125 0.3× 81 2.3k
Yu.N. Makarov Russia 32 1.6k 1.3× 805 1.2× 557 0.9× 1.5k 2.9× 354 0.8× 162 3.1k
K. Yamanaka Japan 21 802 0.7× 224 0.3× 430 0.7× 411 0.8× 60 0.1× 113 1.4k
Tanemasa Asano Japan 24 1.7k 1.4× 218 0.3× 637 1.1× 152 0.3× 163 0.4× 225 2.3k
C. R. Guarnieri United States 14 1.1k 0.9× 188 0.3× 371 0.6× 113 0.2× 553 1.3× 35 1.6k
D. D. Bacon United States 19 640 0.5× 232 0.3× 378 0.6× 221 0.4× 201 0.5× 42 1.2k
W. Schilling Germany 25 524 0.4× 341 0.5× 406 0.7× 186 0.4× 231 0.5× 96 2.0k

Countries citing papers authored by K. Hinode

Since Specialization
Citations

This map shows the geographic impact of K. Hinode's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Hinode with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Hinode more than expected).

Fields of papers citing papers by K. Hinode

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Hinode. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Hinode. The network helps show where K. Hinode may publish in the future.

Co-authorship network of co-authors of K. Hinode

This figure shows the co-authorship network connecting the top 25 collaborators of K. Hinode. A scholar is included among the top collaborators of K. Hinode based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Hinode. K. Hinode is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Satoh, T., K. Hinode, S. Nagasawa, et al.. (2009). Planarization Process for Fabricating Multi-Layer Nb Integrated Circuits Incorporating Top Active Layer. IEEE Transactions on Applied Superconductivity. 19(3). 167–170. 14 indexed citations
2.
Nagasawa, S., T. Satoh, K. Hinode, et al.. (2009). New Nb multi-layer fabrication process for large-scale SFQ circuits. Physica C Superconductivity. 469(15-20). 1578–1584. 55 indexed citations
3.
Akaike, Hiroyuki, Akira Fujimaki, T. Satoh, et al.. (2007). Effects of a DC-Power Layer Under a Ground Plane in SFQ Circuits. IEEE Transactions on Applied Superconductivity. 17(2). 466–469. 11 indexed citations
4.
Satoh, T., K. Hinode, Hiroyuki Akaike, et al.. (2005). Fabrication Process of Planarized Multi-Layer Nb Integrated Circuits. IEEE Transactions on Applied Superconductivity. 15(2). 78–81. 33 indexed citations
5.
Nagasawa, S., K. Hinode, T. Satoh, et al.. (2004). Development of advanced Nb process for SFQ circuits. Physica C Superconductivity. 412-414. 1429–1436. 57 indexed citations
6.
Hinode, K., S. Nagasawa, T. Satoh, et al.. (2003). Pattern-Size-Free Planarization for Multilayered Large-Scale SFQ Circuits. IEICE Transactions on Electronics. 86(12). 2511–2513. 18 indexed citations
7.
Hinode, K., et al.. (2002). Increase in Electrical Resistivity of Copper and Aluminum Fine Lines. MATERIALS TRANSACTIONS. 43(7). 1621–1623. 45 indexed citations
8.
Takeda, Eiji, et al.. (2002). Reliability issues of silicon LSIs facing 100-nm technology node. Microelectronics Reliability. 42(4-5). 493–506. 6 indexed citations
9.
Oshima, Taku, Hiromichi Aoki, Hiroshi Ashihara, et al.. (2002). Improvement of thermal stability of via resistance in dual damascene copper interconnection. 123–126. 20 indexed citations
10.
Aoki, Hiromichi, Taku Oshima, J. Noguchi, et al.. (2002). Robust 130 mn-node Cu dual damascene technology with low-k barrier SiCN. 4.2.1–4.2.4. 1 indexed citations
11.
Takeda, Ken’ichi, et al.. (2001). Light Emission Analysis of Dielectric Breakdown in Stressed Damascene Copper Interconnection. Japanese Journal of Applied Physics. 40(4S). 2658–2658. 3 indexed citations
12.
Takeda, Ken’ichi, et al.. (1998). Enhanced dielectric breakdown lifetime of the copper/silicon nitride/silicon dioxide structure. 36–41. 24 indexed citations
13.
Kondo, Seiichi, et al.. (1996). Thermographic analysis of electromigration phenomena in aluminum metallization. Journal of Applied Physics. 79(2). 736–741. 14 indexed citations
14.
Hinode, K., Takeshi Furusawa, & Yoshio Homma. (1992). Relaxation Phenomenon During Electromigration Under Pulsed Current. 205–210. 8 indexed citations
15.
Wei, Long, Shoichiro Tanigawa, K. Hinode, et al.. (1992). Study of Interfacial Reactions in W/Si Systems by a Monoenergetic Positron Beam. Materials science forum. 105-110. 1463–1466. 2 indexed citations
16.
Hinode, K.. (1991). Some critical issues of LSI aluminum conductor.. Journal of Japan Institute of Light Metals. 41(9). 614–622. 1 indexed citations
17.
Hinode, K., et al.. (1990). A study on stress-induced migration in aluminum metallization based on direct stress measurements. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 8(3). 495–498. 28 indexed citations
18.
Hinode, K.. (1989). Aluminum conductor materials for silicon LSI.. Bulletin of the Japan Institute of Metals. 28(1). 40–47. 5 indexed citations
19.
Hinode, K., N. Owada, Toshirou Nishida, & K. Mukai. (1987). Stress-induced grain boundary fractures in Al–Si interconnects. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 5(2). 518–522. 102 indexed citations
20.
Doyama, Masao, K. Hinode, Shoichiro Tanigawa, & Kensuke Shiraishi. (1979). Effect of gaseous impurity atoms on the formation of microvoids studied by positron annihilation. Journal of Nuclear Materials. 85-86. 781–785. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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