Moritz Andreas Meyer
About
In The Last Decade
Moritz Andreas Meyer
11 papers receiving 214 citations
Peers
Comparison fields: 5 of 16
- Electrical and Electronic Engineering 191
- Electronic, Optical and Magnetic Materials 138
- Materials Chemistry 69
- Atomic and Molecular Physics, and Optics 39
- Mechanics of Materials 29
Countries citing papers authored by Moritz Andreas Meyer
This map shows the geographic impact of Moritz Andreas Meyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Moritz Andreas Meyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Moritz Andreas Meyer more than expected).
Fields of papers citing papers by Moritz Andreas Meyer
This network shows the impact of papers produced by Moritz Andreas Meyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Moritz Andreas Meyer. The network helps show where Moritz Andreas Meyer may publish in the future.
Co-authorship network of co-authors of Moritz Andreas Meyer
This figure shows the co-authorship network connecting the top 25 collaborators of Moritz Andreas Meyer. A scholar is included among the top collaborators of Moritz Andreas Meyer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Moritz Andreas Meyer. Moritz Andreas Meyer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | Discrete interactions between a few interlayer excitons trapped at a MoSe<sub>2</sub>-WSe<sub>2</sub> heterointerface | 67 |
| 3 | 2 | |
| 4 | 4 | |
| 5 | 14 | |
| 6 | 2 | |
| 7 | 6 | |
| 8 | Effects of advanced process approaches on electromigration degradation of Cu on-chip interconnects | 2 |
| 9 | 16 | |
| 10 | 1 | |
| 11 | 82 | |
| 12 | 26 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.