You-Seok Suh

418 total citations
20 papers, 283 citations indexed

About

You-Seok Suh is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, You-Seok Suh has authored 20 papers receiving a total of 283 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 13 papers in Atomic and Molecular Physics, and Optics and 6 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in You-Seok Suh's work include Semiconductor materials and devices (17 papers), Semiconductor materials and interfaces (12 papers) and Copper Interconnects and Reliability (6 papers). You-Seok Suh is often cited by papers focused on Semiconductor materials and devices (17 papers), Semiconductor materials and interfaces (12 papers) and Copper Interconnects and Reliability (6 papers). You-Seok Suh collaborates with scholars based in United States and South Korea. You-Seok Suh's co-authors include Veena Misra, Greg Heuss, Huicai Zhong, Jae Hoon Lee, Dae-Gyu Park, Bei Chen, Jaehoon Lee, In‐Seok Yeo, Jin Won Park and Yanxia Lin and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

You-Seok Suh

17 papers receiving 256 citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
You-Seok Suh 264 63 57 49 36 20 283
Seiji Inumiya 286 1.1× 42 0.7× 43 0.8× 27 0.6× 26 0.7× 47 302
Katsunori Onishi 358 1.4× 118 1.9× 37 0.6× 52 1.1× 27 0.8× 10 369
Rusty Harris 299 1.1× 64 1.0× 32 0.6× 19 0.4× 16 0.4× 27 313
C. Ren 331 1.3× 51 0.8× 40 0.7× 29 0.6× 32 0.9× 18 336
K. Onishi 374 1.4× 70 1.1× 39 0.7× 42 0.9× 23 0.6× 18 380
X.P. Wang 426 1.6× 90 1.4× 46 0.8× 28 0.6× 18 0.5× 14 430
U. Kwon 121 0.5× 34 0.5× 87 1.5× 59 1.2× 19 0.5× 21 193
P. Roper 246 0.9× 32 0.5× 59 1.0× 125 2.6× 32 0.9× 7 272
Pieter Lagrain 134 0.5× 37 0.6× 53 0.9× 47 1.0× 13 0.4× 16 172
Akihiro Otsuki 262 1.0× 16 0.3× 95 1.7× 52 1.1× 22 0.6× 12 311

Countries citing papers authored by You-Seok Suh

Since Specialization
Citations

This map shows the geographic impact of You-Seok Suh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by You-Seok Suh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites You-Seok Suh more than expected).

Fields of papers citing papers by You-Seok Suh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by You-Seok Suh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by You-Seok Suh. The network helps show where You-Seok Suh may publish in the future.

Co-authorship network of co-authors of You-Seok Suh

This figure shows the co-authorship network connecting the top 25 collaborators of You-Seok Suh. A scholar is included among the top collaborators of You-Seok Suh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with You-Seok Suh. You-Seok Suh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Suh, You-Seok, et al.. (2005). Electrical Characteristics of HfO[sub 2] Dielectrics with Ru Metal Gate Electrodes. Journal of The Electrochemical Society. 152(9). F138–F138. 31 indexed citations
3.
Suh, You-Seok, et al.. (2005). Physical and electrical analysis of RuxYy alloys for gate electrode applications. Applied Physics Letters. 86(5). 53502–53502. 11 indexed citations
4.
Suh, You-Seok, Greg Heuss, & Veena Misra. (2004). Characteristics of TaSixNy thin films as gate electrodes for dual gate Si-complementary metal-oxide-semiconductor devices. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(1). 175–179. 15 indexed citations
5.
Suh, You-Seok. (2004). Fabrication and Evaluation of Devices Containing High K Gate Dielectrics and Metal Gate Electrodes for the 70 and 50NM Technology Nodes of ITRS. NCSU Libraries Repository (North Carolina State University Libraries). 1 indexed citations
6.
Suh, You-Seok, et al.. (2004). Investigation of stress behaviors and mechanism of void formation in sputtered TiSix films. Thin Solid Films. 450(2). 341–345. 2 indexed citations
7.
Lee, Jae Hoon, et al.. (2004). Compatibility of dual metal gate electrodes with high-k dielectrics for CMOS. 13.5.1–13.5.4. 24 indexed citations
8.
Suh, You-Seok, Greg Heuss, Jae Hoon Lee, & Veena Misra. (2003). Effect of the composition on the electrical properties of TaSi/sub x/Ny metal gate electrodes. IEEE Electron Device Letters. 24(7). 439–441. 19 indexed citations
9.
Lee, Jae Hoon, et al.. (2003). Tunable work function dual metal gate technology for bulk and non-bulk CMOS. 359–362. 28 indexed citations
10.
Suh, You-Seok, et al.. (2003). Thermal Stability of TaSi[sub x]N[sub y] Films Deposited by Reactive Sputtering on SiO[sub 2]. Journal of The Electrochemical Society. 150(5). F79–F79. 13 indexed citations
11.
12.
Suh, You-Seok, Greg Heuss, Jaehoon Lee, & Veena Misra. (2002). The Effects of Nitrogen on Electrical and Structural Properties in TaSixNy/SiO2/p-Si MOS Capacitors. MRS Proceedings. 716.
13.
Park, Dae-Gyu, You-Seok Suh, Veena Misra, et al.. (2002). Robust ternary metal gate electrodes for dual gate CMOS devices. 38 indexed citations
14.
Zhong, Huicai, et al.. (2002). Properties of Ru-Ta alloys as gate electrodes for NMOS and PMOS silicon devices. 20.5.1–20.5.4. 30 indexed citations
15.
Suh, You-Seok, Greg Heuss, & Veena Misra. (2002). Electrical characteristics of TaSixNy/SiO2/Si structures by Fowler–Nordheim current analysis. Applied Physics Letters. 80(8). 1403–1405. 26 indexed citations
16.
Zhong, Huicai, et al.. (2001). Electrical properties of Ru and RuO2 gate electrodes for Si-PMOSFET with ZrO2 and Zr-silicate dielectrics. Journal of Electronic Materials. 30(12). 1493–1498. 16 indexed citations
17.
Suh, You-Seok, et al.. (2001). Electrical Characteristics of TaSi,N,, Gate Electrodes For Dual Gate Si-CMOS Devices. 11 indexed citations
18.
Kim, Sam-Dong, et al.. (2001). Effects of the Process Variable on Sputtered TiSi[sub x] Polycide Gate Electrodes for sub-0.15 μm Memory Device Application. Journal of The Electrochemical Society. 148(5). G258–G258. 1 indexed citations
19.
Zhong, Huicai, et al.. (2001). Promising Gate Stacks with Ru & RuO2 Gate Electrodes and Y-silicate Dielectrics. MRS Proceedings. 670. 3 indexed citations
20.
Suh, You-Seok, et al.. (2000). Retarded C54 transformation and suppressed agglomeration by precipitates in TiSi2 films. Journal of Applied Physics. 87(6). 2760–2764. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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