You-Seok Suh
- Electrical and Electronic Engineering
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
- Topics
- Semiconductor materials and devices (17 papers)Semiconductor materials and interfaces (12 papers)Copper Interconnects and Reliability (6 papers)
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesSouth Korea
In The Last Decade
You-Seok Suh
17 papers receiving 256 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 264
- Materials Chemistry 63
- Atomic and Molecular Physics, and Optics 57
- Electronic, Optical and Magnetic Materials 49
- Mechanics of Materials 36
Countries citing papers authored by You-Seok Suh
This map shows the geographic impact of You-Seok Suh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by You-Seok Suh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites You-Seok Suh more than expected).
Fields of papers citing papers by You-Seok Suh
This network shows the impact of papers produced by You-Seok Suh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by You-Seok Suh. The network helps show where You-Seok Suh may publish in the future.
Co-authorship network of co-authors of You-Seok Suh
This figure shows the co-authorship network connecting the top 25 collaborators of You-Seok Suh. A scholar is included among the top collaborators of You-Seok Suh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with You-Seok Suh. You-Seok Suh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 31 | |
| 3 | 11 | |
| 4 | 15 | |
| 5 | Fabrication and Evaluation of Devices Containing High K Gate Dielectrics and Metal Gate Electrodes for the 70 and 50NM Technology Nodes of ITRS | 1 |
| 6 | 2 | |
| 7 | 24 | |
| 8 | 19 | |
| 9 | 28 | |
| 10 | 13 | |
| 11 | 38 | |
| 12 | 10 | |
| 13 | 30 | |
| 14 | 26 | |
| 15 | 0 | |
| 16 | Electrical Characteristics of TaSi,N,, Gate Electrodes For Dual Gate Si-CMOS Devices | 11 |
| 17 | 16 | |
| 18 | 3 | |
| 19 | 1 | |
| 20 | 4 |
About You-Seok Suh
You-Seok Suh is a scholar working on Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering, having authored 20 papers that have together received 283 indexed citations. Recurring topics across this work include Semiconductor materials and devices (17 papers), Semiconductor materials and interfaces (12 papers) and Copper Interconnects and Reliability (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (264 citations), Electronic, Optical and Magnetic Materials (49 citations) and Atomic and Molecular Physics, and Optics (57 citations). You-Seok Suh has collaborated with scholars based in United States and South Korea. Frequent co-authors include Veena Misra, Greg Heuss, Huicai Zhong, Jae Hoon Lee, Dae-Gyu Park, Jaehoon Lee, Bei Chen, In‐Seok Yeo, Jae-Sung Roh and Jin Won Park. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.