J. Armer
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture
- Signal Processing
- Computer Networks and Communications
- Information Systems
- Co-authors
- K. VerhaegeM. MergensP. JozwiakC. RussB. KeppensChristian RussRanjeet KumarBenjamin Van Camp
- Topics
- Electrostatic Discharge in Electronics (10 papers)Integrated Circuits and Semiconductor Failure Analysis (7 papers)Semiconductor materials and devices (5 papers)
- Journals
- Microelectronics ReliabilityIEEE Transactions on Device and Materials ReliabilityElectrical Overstress/Electrostatic Discharge Symposium
- Partner nations
- GermanyFranceUnited States
In The Last Decade
J. Armer
11 papers receiving 320 citations
Peers
Comparison fields: 5 of 9
- Electrical and Electronic Engineering 352
- Hardware and Architecture 9
- Signal Processing 2
- Computer Networks and Communications 1
- Information Systems 1
Countries citing papers authored by J. Armer
This map shows the geographic impact of J. Armer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Armer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Armer more than expected).
Fields of papers citing papers by J. Armer
This network shows the impact of papers produced by J. Armer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Armer. The network helps show where J. Armer may publish in the future.
Co-authorship network of co-authors of J. Armer
This figure shows the co-authorship network connecting the top 25 collaborators of J. Armer. A scholar is included among the top collaborators of J. Armer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Armer. J. Armer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 14 | |
| 3 | 82 | |
| 4 | 84 | |
| 5 | 12 | |
| 6 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 17 |
| 7 | 10 | |
| 8 | 37 | |
| 9 | 0 | |
| 10 | 2 | |
| 11 | GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes | 61 |
| 12 | Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scaling | 35 |
About J. Armer
J. Armer is a scholar working on Instrumentation, Electrical and Electronic Engineering and Hardware and Architecture, having authored 12 papers that have together received 355 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Semiconductor materials and devices (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (352 citations), Hardware and Architecture (9 citations) and Instrumentation (1 citation). J. Armer has collaborated with scholars based in Germany, France and United States. Frequent co-authors include K. Verhaege, M. Mergens, P. Jozwiak, C. Russ, B. Keppens, Christian Russ, Ranjeet Kumar, Benjamin Van Camp, Simon E. Freeman and John R. Tower. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.