C. Russ
Impact in
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- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electromagnetic Compatibility and Noise Suppression
- Silicon Carbide Semiconductor Technologies
- Radio Frequency Integrated Circuit Design
Papers in
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- Semiconductor materials and devices 31
- Electrostatic Discharge in Electronics 31
- Integrated Circuits and Semiconductor Failure Analysis 21
- Advancements in Semiconductor Devices and Circuit Design 16
- Electromagnetic Compatibility and Noise Suppression 2
- 3D IC and TSV technologies 1
- Low-power high-performance VLSI design 1
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- Analog and Mixed-Signal Circuit Design 3
- Co-authors
- K. Verhaege (12 shared papers)M. Mergens (8 shared papers)J. Armer (7 shared papers)P. Jozwiak (7 shared papers)B. Keppens (5 shared papers)G. Groeseneken (13 shared papers)Karlheinz Bock (4 shared papers)S. Thijs (8 shared papers)
- Journals
- Microelectronics Reliability (4 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Transactions on Electronics Packaging Manufacturing (1 paper)Quality and Reliability Engineering International (1 paper)IEEE Transactions on Electron Devices (1 paper)
- Partner nations
- GermanyUnited StatesBelgium
In The Last Decade
C. Russ
36 papers receiving 590 citations
Peers
Comparison fields: 5 of 10
- Electrical and Electronic Engineering 643
- Hardware and Architecture 17
- Biomedical Engineering 26
- Atomic and Molecular Physics, and Optics 4
- Computational Theory and Mathematics 2
Countries citing papers authored by C. Russ
This map shows the geographic impact of C. Russ's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Russ with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Russ more than expected).
Fields of papers citing papers by C. Russ
This network shows the impact of papers produced by C. Russ. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Russ. The network helps show where C. Russ may publish in the future.
Co-authors
The 25 scholars most cited alongside C. Russ, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 84 | |
| 2 | 2005 | 82 | |
| 3 | GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes | 2001 | 61 |
| 4 | Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scaling | 2001 | 35 |
| 5 | 2002 | 35 | |
| 6 | 1997 | 23 | |
| 7 | 2006 | 23 | |
| 8 | 2007 | 22 | |
| 9 | 2006 | 21 | |
| 10 | 1994 | 20 | |
| 11 | Next generation bulk FinFET devices and their benefits for ESD robustness | 2009 | 20 |
| 12 | 2002 | 19 | |
| 13 | 2006 | 19 | |
| 14 | 2007 | 18 | |
| 15 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 2003 | 17 |
| 16 | 2005 | 16 | |
| 17 | 2005 | 14 | |
| 18 | SCCF — System to component level correlation factor | 2010 | 12 |
| 19 | PMOSFET-based ESD protection in 65nm bulk CMOS technology for improved external latchup robustness | 2005 | 11 |
| 20 | 2003 | 10 |
About C. Russ
C. Russ is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Bioengineering, Infectious Diseases and Organic Chemistry, having authored 36 papers that have together received 645 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Electrostatic Discharge in Electronics (31 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers), Analog and Mixed-Signal Circuit Design (3 papers), Electromagnetic Compatibility and Noise Suppression (2 papers), 3D IC and TSV technologies (1 paper) and Low-power high-performance VLSI design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (643 citations), Hardware and Architecture (17 citations), Biomedical Engineering (26 citations), Atomic and Molecular Physics, and Optics (4 citations) and Computational Theory and Mathematics (2 citations). C. Russ has collaborated with scholars based in Germany, United States and Belgium. Frequent co-authors include K. Verhaege, M. Mergens, J. Armer, P. Jozwiak, B. Keppens, G. Groeseneken, Karlheinz Bock, S. Thijs, D. Linten and Mirko Scholz. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electronics Packaging Manufacturing, Quality and Reliability Engineering International and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.