M. G. Dowsett

908 citations

56 papers · 752 indexed · h-index 16

Computational Mechanics top 2%
Electrical and Electronic Engineering top 10%
Materials Chemistry
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films top 5%

Co-authors: R. D. Barlow Daping Chu G. Rowlands E. H. C. Parker R. Collins C. F. McConville Bryan B. Guzmán R. J. H. Morris
Topics: Ion-surface interactions and analysis (48 papers)Integrated Circuits and Semiconductor Failure Analysis (26 papers)Electron and X-Ray Spectroscopy Techniques (15 papers)
Cited by: Computational Mechanics Surfaces, Coatings and Films Electrical and Electronic Engineering
Journals: Physical review. B, Condensed matter Applied Physics Letters Journal of Applied Physics
Partner nations: United Kingdom Spain United States

In The Last Decade

M. G. Dowsett

56 papers receiving 687 citations

Peers

Countries citing papers authored by M. G. Dowsett

Since Specialization

Citations

This map shows the geographic impact of M. G. Dowsett's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. G. Dowsett with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. G. Dowsett more than expected).

Fields of papers citing papers by M. G. Dowsett

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. G. Dowsett. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. G. Dowsett. The network helps show where M. G. Dowsett may publish in the future.

Co-authorship network of co-authors of M. G. Dowsett

This figure shows the co-authorship network connecting the top 25 collaborators of M. G. Dowsett. A scholar is included among the top collaborators of M. G. Dowsett based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. G. Dowsett. M. G. Dowsett is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Molecular-beam epitaxy and lattice parameter of GaN_xSb_1−x: deviation from Vegard's law forx> 0.02 2013 ·Journal of Physics D Applied Physics ·M. J. Ashwin,R. J. H. Morris,David Walker,P. A. Thomas,M. G. Dowsett,T. S. Jones,T. D. Veal	9
2	Structural analysis of the Cu(100)–p(32×2)R45°–Sn surface using low and medium energy ion scattering spectroscopies 2011 ·Surface Science ·Marc Walker,(unknown),M. Draxler,M. G. Dowsett,C. F. McConville,T.C.Q. Noakes,Paul Bailey	3
3	Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/In _x Ga _{1– x} N structures using optical conductivity enhancement 2010 ·Rapid Communications in Mass Spectrometry ·R. J. H. Morris,M. G. Dowsett,Richard Beanland,P. J. Parbrook,C. F. McConville	1
4	Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1−xGex alloy layers 2002 ·Applied Surface Science ·M. G. Dowsett,R. J. H. Morris,(unknown),S. Corcoran,H. Kheyrandish,G. A. Cooke,(unknown),(unknown)	15
5	Establishing an accurate depth-scale calibration in the top few nanometers of an ultrashallow implant profile 2002 ·Physical review. B, Condensed matter ·M. G. Dowsett,(unknown),(unknown),Bryan B. Guzmán,(unknown),T.C.Q. Noakes,Paul Bailey,C. F. McConville	62
6	The effect of Se and Zn pre-deposition on thermal diffusion of elements across the ZnSe/GaAs interface studied by SIMS 2002 ·Applied Surface Science ·(unknown),J.D. Riley,M. G. Dowsett,Kathryn Prince	5
7	Characterisation of ultra-shallow junctions using advanced SIMS, SRP and HRTEM techniques 2002 ·A. Murrell,E. J. H. Collart,M.A. Foad,(unknown),M. G. Dowsett,(unknown),(unknown),(unknown)	5
8	Antimony Diffusion in Strained and Relaxed Si<sub>1-x</sub>Ge<sub>x</sub> 1997 ·Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum ·(unknown),A. F. W. Willoughby,(unknown),J. M. Bonar,P. Phillips,M. G. Dowsett,G. A. Cooke	7
9	Dopant spatial distributions: Sample-independent response function and maximum-entropy reconstruction 1997 ·Physical review. B, Condensed matter ·Daping Chu,M. G. Dowsett	35
10	Reply to comment by V. V. Makarov on ‘an analytic form for the SIMS response function measured from ultra‐thin impurity layers’, by M. G. Dowsett et al. [ Surf. Interface Anal. 21, 310 (1994)] 1995 ·Surface and Interface Analysis ·M. G. Dowsett	2
11	An analytic form for the SIMS response function measured from ultra‐thin impurity layers 1994 ·Surface and Interface Analysis ·M. G. Dowsett,G. Rowlands,(unknown),R. D. Barlow	87
12	Maximum entropy quantification of SIMS depth profiles—behaviour as a function of primary ion energy 1994 ·Surface and Interface Analysis ·(unknown),M. G. Dowsett	9
13	Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry 1994 ·Analytica Chimica Acta ·M. G. Dowsett,R. D. Barlow	32
14	A study of the altered layer produced by oxygen bombardment of silicon 1988 ·Vacuum ·(unknown),M. G. Dowsett,G. D. T. Spiller,(unknown),(unknown),I. Sutherland	8
15	Investigation of MBE-grown (001) GaAs surfaces using low-dose SIMS 1985 ·Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·(unknown),M. G. Dowsett,R King,E. H. C. Parker	1
16	A comparative study of SIMS depth profiling of boron in silicon 1984 ·Surface and Interface Analysis ·J. B. Clegg,A. E. Morgan,H. A. M. de Grefte,(unknown),A. M. Huber,G. W. Blackmore,M. G. Dowsett,D. E. Sykes,C. W. Magee,V. R. Deline	18
17	Shallow ion implantation in gallium arsenide 1984 ·Vacuum ·J. D. Grange,(unknown),(unknown),C. Dineen,(unknown),(unknown),(unknown),M. G. Dowsett	1
18	HIGHLY CONTROLLED DIFFUSION OF ION IMPLANTED ARSENIC BY MULTIPLE SCAN ELECTRON BEAM HEATING 1983 ·Le Journal de Physique Colloques ·D. J. Godfrey,(unknown),H. Ahmed,M. G. Dowsett	1
19	Experimental study of electrode materials for use in a cold-cathode oxygen discharge 1983 ·International Journal of Mass Spectrometry and Ion Physics ·M. G. Dowsett,E. H. C. Parker	7
20	Modification of existing apparatus for SIMS in UHV 1975 ·Journal of Physics E Scientific Instruments ·M. G. Dowsett,R King,E. H. C. Parker	5

About M. G. Dowsett

M. G. Dowsett is a scholar working on Computational Mechanics, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 56 papers that have together received 752 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (48 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers) and Electron and X-Ray Spectroscopy Techniques (15 papers). The work is most often cited by research in Computational Mechanics (524 citations), Surfaces, Coatings and Films (110 citations) and Electrical and Electronic Engineering (513 citations). M. G. Dowsett has collaborated with scholars based in United Kingdom, Spain and United States. Frequent co-authors include R. D. Barlow, Daping Chu, G. Rowlands, E. H. C. Parker, R. Collins, C. F. McConville, Bryan B. Guzmán, R. J. H. Morris, T.C.Q. Noakes and Paul Bailey. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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