D. E. Sykes

659 citations

39 papers · 511 indexed · h-index 13

Electrical and Electronic Engineering top 10%
Computational Mechanics top 5%
Atomic and Molecular Physics, and Optics top 10%
Materials Chemistry
Surfaces, Coatings and Films top 10%

Co-authors: John M. Walls Robert Bradley J. P. Stagg A. Briggs C. R. Whitehouse N. E. B. Cowern D. J. Godfrey Trevor Martin
Topics: Ion-surface interactions and analysis (24 papers)Integrated Circuits and Semiconductor Failure Analysis (14 papers)Semiconductor materials and devices (11 papers)
Cited by: Surfaces, Coatings and Films Computational Mechanics Atomic and Molecular Physics, and Optics
Journals: Applied Physics Letters Journal of Applied Physics Applied Surface Science
Partner nations: United Kingdom United States Italy

In The Last Decade

D. E. Sykes

36 papers receiving 467 citations

Peers

Countries citing papers authored by D. E. Sykes

Since Specialization

Citations

This map shows the geographic impact of D. E. Sykes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. E. Sykes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. E. Sykes more than expected).

Fields of papers citing papers by D. E. Sykes

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. E. Sykes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. E. Sykes. The network helps show where D. E. Sykes may publish in the future.

Co-authorship network of co-authors of D. E. Sykes

This figure shows the co-authorship network connecting the top 25 collaborators of D. E. Sykes. A scholar is included among the top collaborators of D. E. Sykes based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. E. Sykes. D. E. Sykes is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Final report on VAMAS round‐robin study to evaluate a correction method for saturation effects in DSIMS 2015 ·Surface and Interface Analysis ·(unknown),Hidehiko Nonaka,Yoshikazu Homma,(unknown),Atsushi Murase,(unknown),Mario Barozzi,(unknown),D. E. Sykes,David S. Simons,J. Bennett,C. W. Magee	0
2	The development and application of novel Ru precursors for atmospheric pressure MOVPE growth of Ru doped current blocking layers 2008 ·(unknown),(unknown),(unknown),I.F. Lealman,Richard Moore,L.J. Rivers,M. J. Robertson,S. Rushworth,Rajesh Odedra,Priyalakshmi Viswanathan,D. E. Sykes,(unknown)	1
3	Practical Surface Analysis: Volume 2 - Ion and Neutral Spectroscopy (2nd edn) 1997 ·Measurement Science and Technology ·D. E. Sykes	1
4	SIMS without sums 1997 ·III-Vs Review ·D. E. Sykes,(unknown)	1
5	Carbon delta doping in chemical beam epitaxy using CBr4 1997 ·Journal of Crystal Growth ·T.B. Joyce,T.J. Bullough,T. Farrell,BR Davidson,D. E. Sykes,(unknown)	0
6	Secondary ion mass spectrometry - SIMS VIII 1993 ·Spectrochimica Acta Part A Molecular Spectroscopy ·D. E. Sykes	58
7	The control and evaluation of blue shift in GaInAs/GaInAsP multiple quantum well structures for integrated lasers and Stark-effect modulators 1993 ·Semiconductor Science and Technology ·R. E. Mallard,E. J. Thrush,Robert Martin,(unknown),R. J. Nicholas,R. Pritchard,B. Hamilton,(unknown),(unknown),(unknown),D. E. Sykes,J. Will Thompson,(unknown),J. M. Jowett,K. Satzke,Andrew G. Norman,G. R. Booker	4
8	SIMS analysis of oxygen in Al _x Ga _{1 − x} As alloys: Variations in sensitivity as a function of alloy composition 1993 ·Surface and Interface Analysis ·(unknown),D. E. Sykes,M. R. Houlton,G. W. Blackmore,(unknown)	1
9	UV ozone modification of wool fibre surfaces 1993 ·Applied Surface Science ·Robert Bradley,(unknown),D. E. Sykes	20
10	Static SIMS using a cameca ims 3f 1991 ·Surface and Interface Analysis ·(unknown),D. E. Sykes	1
11	Correlation of electronic and structural data for a superlattice tunnel diode 1989 ·Semiconductor Science and Technology ·R A Davies,Erica G. Bithell,Annabel R. Chew,Philip Harris,C. Dineen,Michael J. Kelly,W. M. Stobbs,D. E. Sykes,T. M. Kerr	5
12	The Depth Resolution of Secondary Ion Mass Spectrometers: A Critical Evaluation 1988 ·Scanning microscopy ·(unknown),(unknown),J. B. Clegg,Mark Dowsett,(unknown),G. D. T. Spiller,D. E. Sykes	4
13	Passivation of zinc acceptors in InP by atomic hydrogen coming from arsine during metalorganic vapor phase epitaxy 1988 ·Applied Physics Letters ·(unknown),A. Briggs,(unknown),(unknown),J. P. Stagg,(unknown),D. E. Sykes	77
14	Molecular-beam epitaxy of (100) InSb for CdTe/InSb device applications 1988 ·Journal of Applied Physics ·G. M. Williams,C. R. Whitehouse,Trevor Martin,N. G. Chew,A. G. Cullis,T. Ashley,D. E. Sykes,(unknown),R. H. Williams	35
15	Identification of the major residual donor in unintentionally doped InP grown by molecular beam epitaxy 1985 ·Applied Physics Letters ·Trevor Martin,C.R. Stanley,Agis A. Iliadis,C. R. Whitehouse,D. E. Sykes	22
16	A comparative study of SIMS depth profiling of boron in silicon 1984 ·Surface and Interface Analysis ·J. B. Clegg,A. E. Morgan,H. A. M. de Grefte,(unknown),A. M. Huber,G. W. Blackmore,M. G. Dowsett,D. E. Sykes,C. W. Magee,V. R. Deline	18
17	Summary Abstract: Surface topography of electronic materials following oxygen and cesium ion bombardment 1983 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Sara J. Duncan,R. Jeffrey Smith,D. E. Sykes,John M. Walls	10
18	Sputter‐depth profiling in AES: Dependence of depth resolution on electron and ion beam geometry 1983 ·Surface and Interface Analysis ·Sara J. Duncan,Roger Smith,D. E. Sykes,John M. Walls	2
19	Composition–Depth profiling and interface analysis of surface coatings using ball cratering and the scanning auger microprobe 1979 ·Surface and Interface Analysis ·John M. Walls,(unknown),D. E. Sykes	57
20	Field emission from lead telluride 1975 ·physica status solidi (b) ·D. E. Sykes,E. Braun	3

About D. E. Sykes

D. E. Sykes is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Radiation, having authored 39 papers that have together received 511 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (24 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and Semiconductor materials and devices (11 papers). The work is most often cited by research in Surfaces, Coatings and Films (84 citations), Computational Mechanics (218 citations) and Atomic and Molecular Physics, and Optics (187 citations). D. E. Sykes has collaborated with scholars based in United Kingdom, United States and Italy. Frequent co-authors include John M. Walls, Robert Bradley, J. P. Stagg, A. Briggs, C. R. Whitehouse, N. E. B. Cowern, D. J. Godfrey, Trevor Martin, Graham C. Smith and P. Li Kam Wa. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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