S. Corcoran

509 citations

24 papers · 410 indexed · h-index 10

Electrical and Electronic Engineering top 10%
- Integrated Circuits and Semiconductor Failure Analysis 13
- Silicon and Solar Cell Technologies 9
- Semiconductor materials and devices 5
- Ferroelectric and Negative Capacitance Devices 2
- Advancements in Semiconductor Devices and Circuit Design 2
Computational Mechanics top 10%
- Ion-surface interactions and analysis 15
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces 3
Surfaces, Coatings and Films
- Electron and X-Ray Spectroscopy Techniques 4
Structural Biology

Co-authors: K. Wittmaack D. P. Griffis G. Dewey R. Chau M. Radosavljević M. Metz B. Chu-Kung Niloy Mukherjee
Cited by: Electrical and Electronic Engineering Computational Mechanics Atomic and Molecular Physics, and Optics
Journals: Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Journal of The Electrochemical Society (2 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (2 papers)
Partner nations: United States United Kingdom Taiwan

In The Last Decade

S. Corcoran

20 papers receiving 388 citations

Peers

Countries citing papers authored by S. Corcoran

Since Specialization

Citations

This map shows the geographic impact of S. Corcoran's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Corcoran with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Corcoran more than expected).

Fields of papers citing papers by S. Corcoran

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Corcoran. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Corcoran. The network helps show where S. Corcoran may publish in the future.

Co-authorship network

The 25 scholars most cited alongside S. Corcoran, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Corcoran Line = papers co-authored together S. Corcoran links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	High mobility strained germanium quantum well field effect transistor as the p-channel device option for low power (Vcc = 0.5 V) III–V CMOS architecture R. Pillarisetty,B. Chu-Kung,S. Corcoran,G. Dewey,J. Kavalieros,Lina M. Barrios,R. Kotlyar,Hung V. Le,A. V. Dyomina,M. Metz,Niloy Mukherjee,Junghyo Nah,W. Rachmady,M. Radosavljević,Uday Shah,Huang Bao-huaa,Han Wui Then,David Gaël,R. Chau	2010	80
2	Advanced high-K gate dielectric for high-performance short-channel In<inf>0.7</inf>Ga<inf>0.3</inf>As quantum well field effect transistors on silicon substrate for low power logic applications M. Radosavljević,B. Chu-Kung,S. Corcoran,G. Dewey,Mantu K. Hudait,J. M. Fastenau,J. Kavalieros,W. K. Liu,D. Lubyshev,M. Metz,Annamaria Murdocca,Niloy Mukherjee,W. Rachmady,Uday Shah,R. Chau	2009	111
3	3-D analysis of semiconductor dopant distributions in a patterned structure using LEAP Ultramicroscopy ·J.S. Moore,K. S. Jones,Lina M. Barrios,S. Corcoran	2007	15
4	Modeling of ultrahighly doped shallow junctions for aggressively scaled CMOS Lina M. Barrios,S. Cea,Fu Jun,Liu Chun-p,M.D. Giles,Алфеева Елена Владимировна,J. Sandford,S. Corcoran	2003	6
5	SIMS characterization of ion implanted materials: current status and future opportunities S. Corcoran,Jerry Hunter,A. Budrevich	2003	1
6	Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1−xGex alloy layers Applied Surface Science ·M. G. Dowsett,R. J. H. Morris,N. I. ABDEL‐SAYED,S. Corcoran,H. Kheyrandish,G. A. Cooke,Боян Милушев,Emelia Yayra Horsey	2002	15
7	High accuracy and rapid dose measurements for ultra-low energy ion implantation using low energy x-ray emission spectroscopy S. Corcoran,Stephen Fulder,Pierre-François Staub,B K Sirkar	2002	1
8	In-line measurement of Xj on 300 mm wafers S. Corcoran,Paul Gillespie,狄梦洁,P. Borden	2002	1
9	Nonmelt laser annealing of 5-KeV and 1-KeV boron-implanted silicon IEEE Transactions on Electron Devices ·A Volya,Mark E. Law,Fernando Josué Mairena Mairena,K. S. Jones,S. Talwar,S. Corcoran	2002	22
10	Nonmelt Laser Annealing of 1 Kev Boron Implanted Silicon MRS Proceedings ·A Volya,Mark E. Law,K. S. Jones,S. Talwar,S. Corcoran	2001	6
11	Identification, simulation and avoidance of artifacts in ultra-shallow depth profiling by secondary ion mass spectrometry K. Wittmaack,Hasna Solihat,S. Corcoran	1998	1
12	Sources of error in quantitative depth profiling of shallow doping distributions by secondary-ion-mass spectrometry in combination with oxygen flooding Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·K. Wittmaack,S. Corcoran	1998	55
13	Mapping two-dimensional arsenic distributions in silicon using dopant-selective chemical etching technique Journal of Applied Physics ·Ciarán J. Loughnane,D. Venables,Afifatur Rohimah,Dennis M. Maher,Wawong Dwi Ratminah,S. Corcoran	1997	5
14	A comparison of three techniques for profiling ultra-shallow p+-n junctions Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Susan B. Felch,D. Yost,S. Corcoran,P. N. Duruike	1993	7
15	Evaluation of polyencapsulation, oxygen leak, and low energy ion bombardment in the reduction of secondary ion mass spectrometry surface ion yield transients Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·S. Corcoran,Susan B. Felch	1992	9
16	Channeling effect of P implantation in Si(100) Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Ning Yu,Wei‐Kan Chu,B.K. Patnaik,Adriano Defini Andricopulo,S. Corcoran,Stanislaus Riyanta,Kody Varahramyan	1991	5
17	Characterization of a fast atom source for secondary ion mass spectrometry Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·S. Corcoran,Merwa Ferhat,D. P. Griffis,Richard W. Linton	1989	0
18	PC-based interface for the Cameca IMS-3f ion microscope Review of Scientific Instruments ·S. Corcoran,W. S. Woodward,Richard W. Linton,D. P. Griffis	1989	0
19	Dopant Redistribution during Thermal Oxidation of Monocrystalline Beta ‐ SiC Thin Films Journal of The Electrochemical Society ·John W. Palmour,R. F. Davis,Hoyoul Kong,S. Corcoran,D. P. Griffis	1989	31
20	The Effects of Titanium Silicide Formation on Dopant Redistribution Journal of The Electrochemical Society ·C. M. Osburn,Meidy Bernadette Maringka,Dipika Sharma,D. P. Griffis,S. Corcoran,Showe‐Mei Lin,W. K. Chu,N.R. Parikh	1988	24

About S. Corcoran

S. Corcoran is a scholar working on Computational Mechanics, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 24 papers that have together received 410 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (15 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Silicon and Solar Cell Technologies (9 papers), Semiconductor materials and devices (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Semiconductor materials and interfaces (3 papers), Ferroelectric and Negative Capacitance Devices (2 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (376 citations), Computational Mechanics (108 citations) and Atomic and Molecular Physics, and Optics (101 citations). S. Corcoran has collaborated with scholars based in United States, United Kingdom and Taiwan. Frequent co-authors include K. Wittmaack, D. P. Griffis, G. Dewey, R. Chau, M. Radosavljević, M. Metz, B. Chu-Kung, Niloy Mukherjee, W. Rachmady and J. Kavalieros. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of The Electrochemical Society, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Surface Science and Ultramicroscopy.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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