G. A. Cooke

496 total citations · 1 hit paper
27 papers, 390 citations indexed

About

G. A. Cooke is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, G. A. Cooke has authored 27 papers receiving a total of 390 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 17 papers in Computational Mechanics and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in G. A. Cooke's work include Ion-surface interactions and analysis (17 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Semiconductor materials and devices (7 papers). G. A. Cooke is often cited by papers focused on Ion-surface interactions and analysis (17 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Semiconductor materials and devices (7 papers). G. A. Cooke collaborates with scholars based in United Kingdom, United States and Japan. G. A. Cooke's co-authors include Mark Dowsett, Rohit Abraham John, Maryna I. Bodnarchuk, Ivan Shorubalko, Manu V Nair, Maksym V. Kovalenko, Giacomo Indiveri, Thomas Lippert, Yevhen Shynkarenko and Frank Krumeich and has published in prestigious journals such as Nature Communications, SHILAP Revista de lepidopterología and Applied Physics Letters.

In The Last Decade

G. A. Cooke

26 papers receiving 382 citations

Hit Papers

Reconfigurable halide perovskite nanocrystal memristors f... 2022 2026 2023 2024 2022 50 100 150 200

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G. A. Cooke United Kingdom 8 369 96 88 77 60 27 390
Sonu Hooda Singapore 11 289 0.8× 176 1.8× 56 0.6× 29 0.4× 30 0.5× 30 402
E. Verrelli Greece 12 302 0.8× 129 1.3× 24 0.3× 79 1.0× 27 0.5× 33 399
С. Н. Николаев Russia 12 236 0.6× 174 1.8× 19 0.2× 46 0.6× 190 3.2× 53 444
П. А. Форш Russia 14 523 1.4× 338 3.5× 84 1.0× 122 1.6× 35 0.6× 87 636
Mario Olmedo United States 10 395 1.1× 365 3.8× 22 0.3× 90 1.2× 74 1.2× 14 576
I. Kasko Germany 10 283 0.8× 158 1.6× 26 0.3× 28 0.4× 65 1.1× 31 356
R V Tominov Russia 10 234 0.6× 66 0.7× 16 0.2× 69 0.9× 29 0.5× 44 280
C. Reita France 14 575 1.6× 204 2.1× 32 0.4× 11 0.1× 33 0.6× 43 595
C. Jahan France 14 687 1.9× 151 1.6× 31 0.4× 39 0.5× 49 0.8× 41 728
Sebastián Pazos Argentina 12 481 1.3× 169 1.8× 15 0.2× 60 0.8× 32 0.5× 63 576

Countries citing papers authored by G. A. Cooke

Since Specialization
Citations

This map shows the geographic impact of G. A. Cooke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. A. Cooke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. A. Cooke more than expected).

Fields of papers citing papers by G. A. Cooke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. A. Cooke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. A. Cooke. The network helps show where G. A. Cooke may publish in the future.

Co-authorship network of co-authors of G. A. Cooke

This figure shows the co-authorship network connecting the top 25 collaborators of G. A. Cooke. A scholar is included among the top collaborators of G. A. Cooke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. A. Cooke. G. A. Cooke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
John, Rohit Abraham, Yiğit Demirağ, Yevhen Shynkarenko, et al.. (2022). Reconfigurable halide perovskite nanocrystal memristors for neuromorphic computing. Nature Communications. 13(1). 2074–2074. 219 indexed citations breakdown →
3.
Golla‐Schindler, Ute, et al.. (2021). Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries. Microscopy and Microanalysis. 27(S1). 1012–1015. 1 indexed citations
4.
Senevirathna, M. K. Indika, et al.. (2020). Analysis of useful ion yield for the Mg dopant in GaN by quadrupole—SIMS. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 38(3). 2 indexed citations
5.
Chater, Richard J., et al.. (2016). Simultaneous detection of positive and negative secondary ions. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(3). 6 indexed citations
6.
Chater, Richard J., et al.. (2014). Differentially pumped quadrupole SIMS probe on FIB‐based and two‐beam microscopes. Surface and Interface Analysis. 46(S1). 372–374. 3 indexed citations
7.
Bennett, Nick S., N. E. B. Cowern, Andrew J. Smith, et al.. (2006). Highly conductive Sb-doped layers in strained Si. Applied Physics Letters. 89(18). 16 indexed citations
8.
Smith, Andrew J., J. D. Benson, Lu Xu, et al.. (2005). Transient enhanced diffusion and deactivation of ion-implanted As in strained Si. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 237(1-2). 131–135. 5 indexed citations
9.
Dowsett, M. G., et al.. (2002). Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1−xGex alloy layers. Applied Surface Science. 203-204. 500–503. 15 indexed citations
10.
Bonar, J. M., et al.. (2001). Antimony and boron diffusion in SiGe and Si under the influence of injected point defects. Journal of Materials Science Materials in Electronics. 12(4-6). 219–221. 13 indexed citations
11.
Cooke, G. A., et al.. (2000). Use of two beam energies in secondary ion mass spectrometry analysis of shallow implants: Resolution-matched profiling. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(1). 493–495. 3 indexed citations
12.
Bonar, J. M., et al.. (2000). Furnace and Rta Injection of Point Defects into CVD-Grown B Doped Si and SiGe. MRS Proceedings. 610. 3 indexed citations
13.
Chu, Daping, et al.. (1999). The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling. Applied Surface Science. 144-145. 292–296. 21 indexed citations
14.
Morris, R. J. H., Daping Chu, G. A. Cooke, et al.. (1999). Contamination issues during atomic hydrogen surfactant mediated Si MBE. Semiconductor Science and Technology. 14(2). L1–L4. 6 indexed citations
15.
Chu, Daping, et al.. (1998). Is ultra shallow analysis possible using SIMS?. 771–775. 3 indexed citations
16.
Dowsett, Mark, et al.. (1998). Ultralow energy secondary ion mass spectrometry and transient yields at the silicon surface. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(1). 302–305. 17 indexed citations
17.
Willoughby, A. F. W., et al.. (1997). Antimony Diffusion in Strained and Relaxed Si<sub>1-x</sub>Ge<sub>x</sub>. Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum. 143-147. 1131–1134. 7 indexed citations
18.
Cooke, G. A., et al.. (1996). Use of maximum entropy deconvolution for the study of silicon delta layers in GaAs. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(1). 132–135. 4 indexed citations
19.
Willoughby, A. F. W., et al.. (1995). Dopant Diffusion in Strained and Relaxed Si<sub>1-x</sub>Ge<sub>x</sub>. Materials science forum. 196-201. 345–348. 5 indexed citations
20.
Dowsett, Mark & G. A. Cooke. (1992). Two dimensional profiling using secondary ion mass spectrometry. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(1). 353–357. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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