Koen De Munck

601 citations
39 papers · 448 indexed · h-index 11
Topics
CCD and CMOS Imaging Sensors (20 papers)Advanced Optical Sensing Technologies (9 papers)3D IC and TSV technologies (9 papers)
Partner nations
BelgiumNetherlandsItaly

In The Last Decade

Koen De Munck

35 papers receiving 427 citations

Peers

Koen De Munck
Comparison fields: 5 of 46
  • Electrical and Electronic Engineering 384
  • Biomedical Engineering 105
  • Automotive Engineering 48
  • Nuclear and High Energy Physics 46
  • Instrumentation 45
Replace Vyshnavi Suntharalingam with:
Vyshnavi Suntharalingam United States
C.L. Britton United States
Y. Sugimoto Japan
T. Wakano Japan
Olivier Marcelot France
S.C. Witczak United States
Ulrike Fuchs Germany
Uwe Paschen Germany
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Koen De Munck relative to Vyshnavi Suntharalingam United States Vyshnavi Suntharalingam's profile →
Citations per field
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Vyshnavi Suntharalingam · 1×
Citations per year

Countries citing papers authored by Koen De Munck

Since Specialization
Citations

This map shows the geographic impact of Koen De Munck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Koen De Munck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Koen De Munck more than expected).

Fields of papers citing papers by Koen De Munck

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Koen De Munck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Koen De Munck. The network helps show where Koen De Munck may publish in the future.

Co-authorship network of co-authors of Koen De Munck

This figure shows the co-authorship network connecting the top 25 collaborators of Koen De Munck. A scholar is included among the top collaborators of Koen De Munck based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Koen De Munck. Koen De Munck is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 0
3 0
4 15
5 2
6 1
7 16
8 2
9 3
10 1
11 2
12 17
13 2
14 1
15 9
16 11
17 9
18 6
19 161
20
3D Interconnect technology for space applications
1

About Koen De Munck

Koen De Munck is a scholar working on Instrumentation, Electrical and Electronic Engineering and Biophysics, having authored 39 papers that have together received 448 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (20 papers), Advanced Optical Sensing Technologies (9 papers) and 3D IC and TSV technologies (9 papers). The work is most often cited by research in Instrumentation (45 citations), Electrical and Electronic Engineering (384 citations) and Radiation (37 citations). Koen De Munck has collaborated with scholars based in Belgium, Netherlands and Italy. Frequent co-authors include Piet De Moor, Deniz Sabuncuoglu Tezcan, Bart Swinnen, Chris Van Hoof, Wouter Ruythooren, Lieve Bogaerts, Jan Vaes, Eric Beyne, Zs. Tôkei and Serguei Stoukatch. Their work appears in journals such as Sensors, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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