Uwe Paschen

698 total citations
35 papers, 573 citations indexed

About

Uwe Paschen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Instrumentation. According to data from OpenAlex, Uwe Paschen has authored 35 papers receiving a total of 573 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 7 papers in Instrumentation. Recurrent topics in Uwe Paschen's work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers) and Advanced Optical Sensing Technologies (7 papers). Uwe Paschen is often cited by papers focused on Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers) and Advanced Optical Sensing Technologies (7 papers). Uwe Paschen collaborates with scholars based in Germany, Italy and Austria. Uwe Paschen's co-authors include C. Sürgers, Christoph Strunk, H. v. Löhneysen, Sascha Weyers, Daniel Durini, Franco Zappa, Simone Tisa, Alberto Tosi, Federica Villa and Danilo Bronzi and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Uwe Paschen

35 papers receiving 553 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Uwe Paschen Germany 13 224 193 191 150 106 35 573
Xiaogang Bai United States 11 274 1.2× 95 0.5× 238 1.2× 94 0.6× 56 0.5× 27 445
Qiugui Zhou United States 15 563 2.5× 308 1.6× 92 0.5× 61 0.4× 31 0.3× 46 656
Han-Din Liu United States 14 792 3.5× 331 1.7× 245 1.3× 97 0.6× 43 0.4× 23 907
A. Pauchard United States 14 953 4.3× 407 2.1× 371 1.9× 21 0.1× 91 0.9× 45 1.1k
Y. Ebiko Japan 12 359 1.6× 149 0.8× 108 0.6× 26 0.2× 24 0.2× 21 445
Dion McIntosh United States 14 789 3.5× 325 1.7× 239 1.3× 132 0.9× 26 0.2× 34 928
Ömer Gökalp Memiş United States 13 274 1.2× 268 1.4× 48 0.3× 12 0.1× 29 0.3× 29 490
Eiji Yagyu Japan 14 519 2.3× 197 1.0× 75 0.4× 420 2.8× 13 0.1× 52 705
Demis D. John United States 12 841 3.8× 623 3.2× 17 0.1× 11 0.1× 19 0.2× 34 947
J. O. Tenorio-Pearl United Kingdom 5 104 0.5× 173 0.9× 51 0.3× 15 0.1× 28 0.3× 6 424

Countries citing papers authored by Uwe Paschen

Since Specialization
Citations

This map shows the geographic impact of Uwe Paschen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Uwe Paschen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Uwe Paschen more than expected).

Fields of papers citing papers by Uwe Paschen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Uwe Paschen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Uwe Paschen. The network helps show where Uwe Paschen may publish in the future.

Co-authorship network of co-authors of Uwe Paschen

This figure shows the co-authorship network connecting the top 25 collaborators of Uwe Paschen. A scholar is included among the top collaborators of Uwe Paschen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Uwe Paschen. Uwe Paschen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Dreiner, S., et al.. (2016). Experimental Reliability Studies and SPICE Simulation for EEPROM at Temperatures up to 450°C. Journal of Microelectronics and Electronic Packaging. 13(1). 33–37. 1 indexed citations
2.
Durini, Daniel, W. Brockherde, Alberto Tosi, et al.. (2014). CMOS Technology for SPAD / SiPM: Results from the MiSPiA Project. 1 indexed citations
3.
Bronzi, Danilo, Federica Villa, Simone Tisa, et al.. (2013). Large-area CMOS SPADs with very low dark counting rate. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8631. 86311B–86311B. 11 indexed citations
4.
Dreiner, S., et al.. (2013). Reliability Investigations up to 350°C of Gate Oxide Capacitors Realized in a Silicon-on-Insulator CMOS Technology. Journal of Microelectronics and Electronic Packaging. 10(4). 150–154. 1 indexed citations
5.
Bronzi, Danilo, Federica Villa, Bojan Marković, et al.. (2012). Low-noise and large-area CMOS SPADs with timing response free from slow tails. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 230–233. 47 indexed citations
6.
Villa, Federica, Bojan Marković, Danilo Bronzi, et al.. (2012). SPAD detector for long-distance 3D ranging with sub-nanosecond TDC. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 24–25. 1 indexed citations
7.
Dreiner, S., et al.. (2011). CMOS photodiodes for narrow linewidth applications. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1600–1603. 1 indexed citations
8.
Vogt, H., et al.. (2011). High Temperature Reliability Investigations of EEPROM Memory Cells Realised in Silicon-on-Insulator (SOI) Technology. Additional Conferences (Device Packaging HiTEC HiTEN & CICMT). 2011(HITEN). 221–225. 7 indexed citations
9.
Lorenz, J., Eberhard Bär, Tanja Clees, et al.. (2011). Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results. IEEE Transactions on Electron Devices. 58(8). 2227–2234. 17 indexed citations
10.
Lorenz, J., et al.. (2010). Coupling of Monte Carlo sputter simulation and feature-scale profile simulation and application to the simulation of back etching of an intermetal dielectric. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 53–56. 1 indexed citations
11.
Paschen, Uwe, et al.. (2010). CMOS process enhancement for high precision narrow linewidth applications. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 9. 254–256. 2 indexed citations
12.
Dimopoulos, Théodoros, Thomas Uhrmann, A. Kohn, et al.. (2009). Magnetic properties of embedded ferromagnetic contacts to silicon for spin injection. Journal of Physics D Applied Physics. 42(8). 85004–85004. 5 indexed citations
13.
Paschen, Uwe, et al.. (2008). Ti/Ni(80%)Cr(20%) Thin-Film Resistor With a Nearly Zero Temperature Coefficient of Resistance for Integration in a Standard CMOS Process. IEEE Electron Device Letters. 29(3). 212–214. 15 indexed citations
14.
Sikora, Axel, et al.. (2006). Technologies and reliability of modern embedded flash cells. Microelectronics Reliability. 46(12). 1980–2005. 7 indexed citations
15.
Paschen, Uwe, et al.. (1997). Evidence for hole traps at the amorphous silicon/amorphous silicon–germanium heterostructure interface. Applied Physics Letters. 70(4). 499–501. 4 indexed citations
16.
Paschen, Uwe, et al.. (1995). Magnetooptic measurements on ultrathin Gd films on Y. Zeitschrift für Physik B Condensed Matter. 98(4). 541–547. 6 indexed citations
17.
Strunk, Christoph, Uwe Paschen, C. Sürgers, & H. v. Löhneysen. (1994). Pair-breaking mechanisms in Nb/Gd/Nb films. Physica B Condensed Matter. 194-196. 2403–2404. 2 indexed citations
18.
Paschen, Uwe, Daewon Kwon, & J. David Cohen. (1994). Charge and Current Transient Measurements on N-Type Hydrogenated Amorphous Silicon in the Relaxation Regime. MRS Proceedings. 336. 2 indexed citations
19.
Paschen, Uwe, C. Sürgers, & H. v. Löhneysen. (1993). MAGNETOOPTIC MEASUREMENTS ON Gd/Nb/Gd SANDWICHES. International Journal of Modern Physics B. 7(01n03). 500–503. 1 indexed citations
20.
Goll, G., Uwe Paschen, & H. v. Löhneysen. (1991). Impurity contributions to the specific heat of YBa2Cu3O7−δ-single crystal below 1 K in magnetic fields up to 6 T. Physica C Superconductivity. 177(4-6). 351–355. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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