J. Angilello

1.2k total citations
33 papers, 956 citations indexed

About

J. Angilello is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, J. Angilello has authored 33 papers receiving a total of 956 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 14 papers in Atomic and Molecular Physics, and Optics and 12 papers in Materials Chemistry. Recurrent topics in J. Angilello's work include Semiconductor materials and interfaces (9 papers), Semiconductor materials and devices (8 papers) and Copper Interconnects and Reliability (7 papers). J. Angilello is often cited by papers focused on Semiconductor materials and interfaces (9 papers), Semiconductor materials and devices (8 papers) and Copper Interconnects and Reliability (7 papers). J. Angilello collaborates with scholars based in United States and Italy. J. Angilello's co-authors include E. Tierney, E. A. Irene, G. S. Cargill, K. L. Kavanagh, J. J. Cuomo, Joyce C. Liu, Chin‐An Chang, K. N. Tu, A. Segmüller and J. O. Olowolafe and has published in prestigious journals such as Science, Physical Review Letters and Applied Physics Letters.

In The Last Decade

J. Angilello

32 papers receiving 893 citations

Peers

Countries citing papers authored by J. Angilello

Since Specialization

Citations

This map shows the geographic impact of J. Angilello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Angilello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Angilello more than expected).

Fields of papers citing papers by J. Angilello

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Angilello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Angilello. The network helps show where J. Angilello may publish in the future.

Co-authorship network of co-authors of J. Angilello

This figure shows the co-authorship network connecting the top 25 collaborators of J. Angilello. A scholar is included among the top collaborators of J. Angilello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Angilello. J. Angilello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Thermal stability of Si1−xCx/Si strained layer superlattices 1992 ·Applied Physics Letters ·Mark S. Goorsky, Subramanian S. Iyer, K. Eberl, F. Legoues, J. Angilello, F. Cardone	43
2	Preparation and some properties of sputtered Co/U-As multilayers 1992 ·IEEE Transactions on Magnetics ·T. S. Plaskett, P. Fumagalli, T. R. McGuire, R. J. Gambino, N. A. Bojarczuk, J. Angilello	3
3	Epitaxy of (100) Cu on (100) Si by evaporation near room temperatures: In-plane epitaxial relation and channeling analysis 1990 ·Applied Physics Letters ·Chin‐An Chang, Joyce C. Liu, J. Angilello	53
4	In-Situ Strain Measurement Via X-Ray Diffraction 1990 ·MRS Proceedings ·R. D. Thompson, J. Angilello	1
5	Lanthanide gallate perovskite-type substrates for epitaxial, high-T _c superconducting Ba ₂ YCu ₃ O _7-δ films 1990 ·IBM Journal of Research and Development ·E. A. Giess, R. L. Sandstrom, W. J. Gallagher, Arunava Gupta, Subhash L. Shindé, Robert F. Cook, Emanuel I. Cooper, E. J. O’Sullivan, J.M. Roldan, A. Segmüller, J. Angilello	56
6	Crystallization kinetics of amorphous NiSix films 1990 ·Thin Solid Films ·R. D. Thompson, J. Angilello, K. N. Tu	5
7	Properties of diamond structure SnGe films grown by molecular beam epitaxy 1990 ·Thin Solid Films ·Alex Harwit, Paul Pukite, J. Angilello, Subramanian S. Iyer	25
8	High-speed X-ray diffraction and in situ resistivity measurements at temperatures of 100 to 1000 K 1989 ·Journal of Applied Crystallography ·J. Angilello, R. D. Thompson, K. N. Tu	3
9	Lattice Compression from Conduction Electrons in Heavily Doped Si:As 1988 ·Physical Review Letters ·G. S. Cargill, J. Angilello, K. L. Kavanagh	101
10	Oriented growth of ultrathin tungsten films on sapphire substrates 1987 ·Journal of Applied Physics ·Jun H. Souk, Armin Segmüller, J. Angilello	21
11	Stresses and radiation damage in Ar+ and Ti+ ion-implanted silicon 1987 ·Journal of Applied Physics ·(unknown), J. Angilello	3
12	Thermal stability of Pb-alloy Josephson junction electrode materials. VII. Concentration range of single ε-phase Pb-Bi films used in counterelectrodes 1983 ·Journal of Applied Physics ·Masanori Murakami, Huakun Huang, J. Angilello, (unknown)	6
13	Precise lattice parameter determination of PtHg₄ 1982 ·Journal of Applied Crystallography ·S. K. Lahiri, J. Angilello, (unknown)	8
14	Tantalum silicide films deposited by dc sputtering 1981 ·Journal of Electronic Materials ·J. Angilello, J. E. E. Baglin, F. Cardone, (unknown), F. M. d’Heurle, E. A. Irene, (unknown), C. S. Petersson, R. Savoy, A. Segmüller, E. Tierney	25
15	Observations of stresses in thin films of palladium and platinum silicides on silicon 1980 ·Journal of Vacuum Science and Technology ·J. Angilello, F. M. d’Heurle, S. Petersson, A. Segmüller	32
16	Preparation and Characterization of Ruthenium Dioxide Crystals 1979 ·Journal of The Electrochemical Society ·M. W. Shafer, (unknown), B. L. Olson, S. J. LaPlaca, J. Angilello	20
17	Stresses in silicides formed by the interaction of metal films with silicon substrates 1979 ·J. Angilello, J. E. E. Baglin, F. M. d’Heurle, C. S. Petersson	3
18	Al-Cu Alloy for Gas Panels 1978 ·IBM Journal of Research and Development ·V. Brusić, F. M. d’Heurle, (unknown), E. I. Alessandrini, J. Angilello, (unknown), (unknown)	1
19	2.22 The deposition by evaporation of CuAl alloy films 1977 ·Vacuum ·F. M. d’Heurle, (unknown), J. Angilello, V. Brusić, (unknown), (unknown)	15
20	Electromechanical Feedback Control for Lang Topography 1971 ·Review of Scientific Instruments ·J. Angilello, (unknown)	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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