K. T. Short

4.0k total citations · 1 hit paper
70 papers, 3.2k citations indexed

About

K. T. Short is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, K. T. Short has authored 70 papers receiving a total of 3.2k indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 37 papers in Atomic and Molecular Physics, and Optics and 28 papers in Computational Mechanics. Recurrent topics in K. T. Short's work include Silicon and Solar Cell Technologies (33 papers), Ion-surface interactions and analysis (28 papers) and Semiconductor materials and interfaces (24 papers). K. T. Short is often cited by papers focused on Silicon and Solar Cell Technologies (33 papers), Ion-surface interactions and analysis (28 papers) and Semiconductor materials and interfaces (24 papers). K. T. Short collaborates with scholars based in United States, Australia and Netherlands. K. T. Short's co-authors include Alice E. White, B. Batlogg, R. J. Cava, L. W. Rupp, R. C. Farrow, J. J. Krajewski, W. F. Peck, T. Y. Kometani, J. S. Williams and Edward A. Rietman and has published in prestigious journals such as Nature, Science and Physical Review Letters.

In The Last Decade

K. T. Short

68 papers receiving 3.0k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Superconductivity near 30 K without copper: the Ba0.6K0.4BiO3 perovskite

1988 997 citations R. C. Farrow, Alice E. White et al. profile →

Peers

Countries citing papers authored by K. T. Short

Since Specialization

Citations

This map shows the geographic impact of K. T. Short's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. T. Short with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. T. Short more than expected).

Fields of papers citing papers by K. T. Short

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. T. Short. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. T. Short. The network helps show where K. T. Short may publish in the future.

Co-authorship network of co-authors of K. T. Short

This figure shows the co-authorship network connecting the top 25 collaborators of K. T. Short. A scholar is included among the top collaborators of K. T. Short based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. T. Short. K. T. Short is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Influence of Si(100) surface pretreatment on the morphology of TiO2 films grown by atomic layer deposition 2003 ·Thin Solid Films ·Kim S. Finnie, Gerry Triani, K. T. Short, David R. G. Mitchell, Darren Attard, John R. Bartlett, Christophe J. Barbé	28
2	Patterned Electrical Conductance and Electrode Formation in Ion‐Implanted Diamond Films 1994 ·Journal of The Electrochemical Society ·B.I. Miller, R. Kalish, L. C. Feldman, A. Katz, N. Moriya, K. T. Short, Alice E. White	43
3	Controlled misfit dislocation nucleation in Si0.90Ge0.10 epitaxial layers grown on Si 1993 ·Applied Physics Letters ·G. P. Watson, Eugene A. Fitzgerald, Ya‐Hong Xie, P. J. Silvėrman, Alice E. White, K. T. Short	10
4	Interpretation of dislocation propagation velocities in strained GexSi1−x/Si(100) heterostructures by the diffusive kink pair model 1991 ·Journal of Applied Physics ·R. Hull, J. C. Bean, D. Bahnck, L. J. Peticolas, K. T. Short, F. C. Unterwald	84
5	In-situ growth of Y 1 Ba 2 Cu 3 O 7-x films by molecular beam epitaxy with an activated oxygen source 1989 ·Physica C Superconductivity ·J. Kwo, M. Hong, D. J. Trevor, R. M. Fleming, Alice E. White, J. P. Mannáerts, R. C. Farrow, A. R. Kortan, K. T. Short	11
6	Implantation temperature dependence of electrical activation, solubility, and diffusion of implanted Te, Cd, and Sn in GaAs 1989 ·Journal of Applied Physics ·S. J. Pearton, J. S. Williams, K. T. Short, (unknown), (unknown), J. M. Poate, J. M. Gibson, D.O. Boerma	25
7	Rapid Annealing of Rie-Induced Damage in GaAs and AlGaAs 1989 ·MRS Proceedings ·S. J. Pearton, W. S. Hobson, U. K. Chakrabarti, K. T. Short, Alice E. White, K. S. Jones	0
8	Ion beam thinning and polishing of YBa2Cu3O7 films 1989 ·Applied Physics Letters ·A. F. Hebard, R. M. Fleming, K. T. Short, Alice E. White, Catherine E. Rice, A. F. J. Levi, R. H. Eick	31
9	Ion implantation damage and annealing in InAs, GaSb, and GaP 1988 ·Journal of Applied Physics ·S. J. Pearton, A. R. Von Neida, Judith M. Brown, K. T. Short, (unknown), U. K. Chakrabarti	54
10	Controllable reduction of critical currents in YBa2Cu3O7−δ films 1988 ·Applied Physics Letters ·Alice E. White, K. T. Short, R. C. Dynes, A. F. J. Levi, M. Anzlowar, K. W. Baldwin, P. Polakos, T. A. Fulton, L. N. Dunkleberger	87
11	Atomic structure imaging of the Si/SiO₂ interface with high-resolution electron microscopy 1986 ·Proceedings annual meeting Electron Microscopy Society of America ·J. L. Batstone, J. M. Gibson, Alice E. White, K. T. Short	2
12	Mesotaxy: Formation of Buried Single-Crystal CoSi₂ Layers by Implantation 1986 ·MRS Proceedings ·Alice E. White, K. T. Short, R. C. Dynes, J. P. Garno, J. M. Gibson	11
13	Ion-Beam-Induced Damaging and Dynamic Annealing Processes in Silicon 1983 ·MRS Proceedings ·K. T. Short, (unknown), R. G. Elliman, (unknown), A.P. Pogany, H. Wagenfeld, J. S. Williams	4
14	Metastable solid solutions of antimony in (100) silicon 1983 ·Nuclear Instruments and Methods in Physics Research ·A.P. Pogany, (unknown), K. T. Short, H. Wagenfeld, J. S. Williams	20
15	Anomalous near-surface effects in room temperature implanted germanium 1983 ·Nuclear Instruments and Methods in Physics Research ·E.M. Lawson, K. T. Short, J. S. Williams, B. R. Appleton, O. W. Holland, (unknown)	11
16	Applications of a Continuous Wave Incoherent Light Source (Cwils) to Semiconductor Processing 1982 ·MRS Proceedings ·H.B. Harrison, (unknown), (unknown), (unknown), K. T. Short, J. S. Williams	1
17	The annealing behavior of antimony implanted polycrystalline silicon 1982 ·Applied Physics Letters ·J. L. Tandon, H.B. Harrison, (unknown), K. T. Short, J. S. Williams	12
18	Comparison of solubility limits and electrical activities for antimony and arsenic ion implanted silicon 1982 ·Physics Letters A ·(unknown), K. T. Short, J. S. Williams	6
19	High resolution RBS and channeling analysis of ion implanted single crystal Fe 1981 ·Nuclear Instruments and Methods in Physics Research ·K. T. Short, J. S. Williams	2
20	Rapid Annealing of Ion Implanted Silicon Structures using a Radiant Light Source 1981 ·MRS Proceedings ·H.B. Harrison, (unknown), K. T. Short, J. S. Williams, (unknown)	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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