К. Д. Щербачев
About
In The Last Decade
К. Д. Щербачев
56 papers receiving 414 citations
Peers
Comparison fields: 5 of 32
- Materials Chemistry 251
- Electrical and Electronic Engineering 178
- Electronic, Optical and Magnetic Materials 139
- Condensed Matter Physics 123
- Atomic and Molecular Physics, and Optics 91
Countries citing papers authored by К. Д. Щербачев
This map shows the geographic impact of К. Д. Щербачев's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by К. Д. Щербачев with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites К. Д. Щербачев more than expected).
Fields of papers citing papers by К. Д. Щербачев
This network shows the impact of papers produced by К. Д. Щербачев. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by К. Д. Щербачев. The network helps show where К. Д. Щербачев may publish in the future.
Co-authorship network of co-authors of К. Д. Щербачев
This figure shows the co-authorship network connecting the top 25 collaborators of К. Д. Щербачев. A scholar is included among the top collaborators of К. Д. Щербачев based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with К. Д. Щербачев. К. Д. Щербачев is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 45 | |
| 2 | 3 | |
| 3 | 6 | |
| 4 | 32 | |
| 5 | 0 | |
| 6 | 1 | |
| 7 | 26 | |
| 8 | 4 | |
| 9 | 2 | |
| 10 | 2 | |
| 11 | 19 | |
| 12 | 2 | |
| 13 | 13 | |
| 14 | 2 | |
| 15 | 18 | |
| 16 | 4 | |
| 17 | 7 | |
| 18 | 2 | |
| 19 | Formation of radiation-induced point defects in silicon doped thin films upon ion implantation and activating annealing | 1 |
| 20 | The study of microdefects in Si-doped GaAs single crystals by X-ray diffuse scattering | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.