Juin J. Liou
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- Semiconductor materials and devices 14
- Advancements in Semiconductor Devices and Circuit Design 12
- Silicon Carbide Semiconductor Technologies 10
- Electrostatic Discharge in Electronics 7
- Integrated Circuits and Semiconductor Failure Analysis 6
- Radio Frequency Integrated Circuit Design 5
- Condensed Matter Physics top 10%
- GaN-based semiconductor devices and materials 7
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- Ferroelectric and Piezoelectric Materials 3
- Co-authors
- A. Ortíz-CondeFrancisco J. García-SánchezJuan MuciChing-Sung HoSlavica MalobabicJunkai HuangXiaoyu MaWanling Deng
- Journals
- Microelectronics Reliability (7 papers)IEEE Electron Device Letters (3 papers)IEEE Transactions on Electron Devices (3 papers)
- Partner nations
- United StatesChinaVenezuela
In The Last Decade
Juin J. Liou
29 papers receiving 555 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 518
- Condensed Matter Physics 74
- Bioengineering 10
- Hardware and Architecture 11
- Electronic, Optical and Magnetic Materials 30
Countries citing papers authored by Juin J. Liou
This map shows the geographic impact of Juin J. Liou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Juin J. Liou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Juin J. Liou more than expected).
Fields of papers citing papers by Juin J. Liou
This network shows the impact of papers produced by Juin J. Liou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Juin J. Liou. The network helps show where Juin J. Liou may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Juin J. Liou, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2023 | 1 | |
| 3 | 2021 | 14 | |
| 4 | 2017 | 40 | |
| 5 | 2016 | 1 | |
| 6 | 2016 | 4 | |
| 7 | 2015 | 39 | |
| 8 | 2015 | 2 | |
| 9 | 2014 | 0 | |
| 10 | 2014 | 9 | |
| 11 | 2014 | 3 | |
| 12 | 2012 | 234 | |
| 13 | 2011 | 0 | |
| 14 | 2010 | 17 | |
| 15 | 2009 | 16 | |
| 16 | 2008 | 12 | |
| 17 | 2007 | 6 | |
| 18 | 2006 | 0 | |
| 19 | 2001 | 2 | |
| 20 | 1995 | 0 |
About Juin J. Liou
Juin J. Liou is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 35 papers that have together received 568 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Silicon Carbide Semiconductor Technologies (10 papers), Electrostatic Discharge in Electronics (7 papers), GaN-based semiconductor devices and materials (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Radio Frequency Integrated Circuit Design (5 papers) and Ferroelectric and Piezoelectric Materials (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (518 citations), Condensed Matter Physics (74 citations) and Bioengineering (10 citations). Juin J. Liou has collaborated with scholars based in United States, China and Venezuela. Frequent co-authors include A. Ortíz-Conde, Francisco J. García-Sánchez, Juan Muci, Ching-Sung Ho, Slavica Malobabic, Junkai Huang, Xiaoyu Ma, Wanling Deng, Reydezel Torres‐Torres and Roberto S. Murphy‐Arteaga. Their work appears in journals such as Microelectronics Reliability, IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Solid-State Electronics and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.