Meng Miao
Impact in
-
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
Papers in
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- Electrostatic Discharge in Electronics 36
- Integrated Circuits and Semiconductor Failure Analysis 22
- Semiconductor materials and devices 18
- Electromagnetic Compatibility and Noise Suppression 13
- Silicon Carbide Semiconductor Technologies 10
- Advancements in Semiconductor Devices and Circuit Design 9
- Radio Frequency Integrated Circuit Design 4
- Co-authors
- Yingchun LiuQi WangShurong DongMarco Buongiorno NardelliJuin J. LiouWeichen DuRenfeng NieJuanjuan Shi
- Journals
- Microelectronics Reliability (8 papers)IEEE Electron Device Letters (5 papers)IEEE Transactions on Microwave Theory and Techniques (2 papers)ACS Applied Materials & Interfaces (2 papers)Electronics Letters (2 papers)
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Meng Miao
66 papers receiving 859 citations
Peers
Comparison fields: 5 of 82
- Electrical and Electronic Engineering 542
- Catalysis 57
- Materials Chemistry 269
- Renewable Energy, Sustainability and the Environment 93
- Process Chemistry and Technology 12
Countries citing papers authored by Meng Miao
This map shows the geographic impact of Meng Miao's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Meng Miao with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Meng Miao more than expected).
Fields of papers citing papers by Meng Miao
This network shows the impact of papers produced by Meng Miao. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Meng Miao. The network helps show where Meng Miao may publish in the future.
Co-authors
The 25 scholars most cited alongside Meng Miao, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2025 | 1 | |
| 3 | 2024 | 3 | |
| 4 | 2024 | 0 | |
| 5 | 2024 | 5 | |
| 6 | 2024 | 6 | |
| 7 | 2023 | 1 | |
| 8 | 2023 | 2 | |
| 9 | 2023 | 2 | |
| 10 | 2023 | 1 | |
| 11 | 2023 | 1 | |
| 12 | 2021 | 8 | |
| 13 | 2020 | 5 | |
| 14 | 2020 | 5 | |
| 15 | 2020 | 2 | |
| 16 | 2018 | 2 | |
| 17 | 2014 | 13 | |
| 18 | 2013 | 113 | |
| 19 | 2013 | 10 | |
| 20 | 2003 | 11 |
About Meng Miao
Meng Miao is a scholar working on Electrical and Electronic Engineering, Process Chemistry and Technology, Catalysis, Condensed Matter Physics and Electronic, Optical and Magnetic Materials, having authored 69 papers that have together received 900 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (36 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Semiconductor materials and devices (18 papers), Electromagnetic Compatibility and Noise Suppression (13 papers), Silicon Carbide Semiconductor Technologies (10 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Catalytic Processes in Materials Science (6 papers) and Radio Frequency Integrated Circuit Design (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (542 citations), Catalysis (57 citations), Materials Chemistry (269 citations), Renewable Energy, Sustainability and the Environment (93 citations) and Process Chemistry and Technology (12 citations). Meng Miao has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Yingchun Liu, Qi Wang, Shurong Dong, Marco Buongiorno Nardelli, Juin J. Liou, Weichen Du, Renfeng Nie, Juanjuan Shi, Zhaoyin Hou and Cam Nguyen. Their work appears in journals such as Microelectronics Reliability, IEEE Electron Device Letters, IEEE Transactions on Microwave Theory and Techniques, ACS Applied Materials & Interfaces and Electronics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.