Igor Krylov
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- Semiconductor materials and devices 31
- Advancements in Semiconductor Devices and Circuit Design 12
- Integrated Circuits and Semiconductor Failure Analysis 9
- Advanced Memory and Neural Computing 5
- Ferroelectric and Negative Capacitance Devices 5
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- Semiconductor materials and interfaces 8
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- Metal and Thin Film Mechanics 6
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- Copper Interconnects and Reliability 4
- Journals
- Applied Physics Letters (11 papers)Journal of Applied Physics (9 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (5 papers)
- Partner nations
- IsraelSouth AfricaArgentina
In The Last Decade
Igor Krylov
36 papers receiving 424 citations
Peers
Comparison fields: 5 of 23
- Electrical and Electronic Engineering 390
- Condensed Matter Physics 50
- Materials Chemistry 172
- Atomic and Molecular Physics, and Optics 96
- Mechanics of Materials 56
Countries citing papers authored by Igor Krylov
This map shows the geographic impact of Igor Krylov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Igor Krylov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Igor Krylov more than expected).
Fields of papers citing papers by Igor Krylov
This network shows the impact of papers produced by Igor Krylov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Igor Krylov. The network helps show where Igor Krylov may publish in the future.
Co-authorship network
The 21 scholars most cited alongside Igor Krylov, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 1 | |
| 2 | 2020 | 6 | |
| 3 | 2020 | 13 | |
| 4 | 2020 | 7 | |
| 5 | 2020 | 9 | |
| 6 | 2019 | 2 | |
| 7 | 2018 | 22 | |
| 8 | 2017 | 4 | |
| 9 | 2017 | 5 | |
| 10 | 2017 | 10 | |
| 11 | 2015 | 38 | |
| 12 | 2014 | 23 | |
| 13 | 2014 | 11 | |
| 14 | 2014 | 5 | |
| 15 | 2014 | 4 | |
| 16 | 1998 | 3 | |
| 17 | 1995 | 0 | |
| 18 | Observation of quantum oscillations of the magnetoresistance of multiply connected objects with a hopping conductivity | 1986 | 2 |
| 19 | Radio-frequency size effect in the scattering of electrons by the boundary of a diffuse layer of impurities | 1978 | 1 |
| 20 | Radio-frequency size effect in a layer of normal metal bounded by its superconducting phase | 1973 | 1 |
About Igor Krylov
Igor Krylov is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Electronic, Optical and Magnetic Materials, having authored 39 papers that have together received 429 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Semiconductor materials and interfaces (8 papers), Metal and Thin Film Mechanics (6 papers), Advanced Memory and Neural Computing (5 papers), Ferroelectric and Negative Capacitance Devices (5 papers) and Copper Interconnects and Reliability (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (390 citations), Condensed Matter Physics (50 citations), Materials Chemistry (172 citations), Atomic and Molecular Physics, and Optics (96 citations) and Mechanics of Materials (56 citations). Igor Krylov has collaborated with scholars based in Israel, South Africa and Argentina. Frequent co-authors include M. Eizenberg, D. Ritter, Xianbin Xu, Yuanshen Qi, R. Winter, Félix Palumbo, Lior Kornblum, Boaz Pokroy, Xianbin Xu and Eilam Yalon. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Solid-State Electronics and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.