Bruce Geil

617 citations

41 papers · 492 indexed · h-index 15

Impact in

Electrical and Electronic Engineering top 10%
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
- Advancements in Semiconductor Devices and Circuit Design
Fluid Flow and Transfer Processes top 10%

Papers in

Electrical and Electronic Engineering 35
- Silicon Carbide Semiconductor Technologies 32
- Semiconductor materials and devices 17
- Electromagnetic Compatibility and Noise Suppression 7
- Electrostatic Discharge in Electronics 5
- Multilevel Inverters and Converters 4
- Advancements in Semiconductor Devices and Circuit Design 4
Mechanical Engineering 9
- Heat Transfer and Optimization 7

Co-authors: Charles Scozzie Anant Agarwal Dimeji Ibitayo Sei‐Hyung Ryu Thomas Salem Aivars J. Lelis John W. Palmour Nicholas R. Jankowski
Journals: SAE technical papers on CD-ROM/SAE technical paper series (2 papers)Solid-State Electronics (2 papers)Materials science forum (14 papers)Thin Solid Films (1 paper)IEEE Transactions on Plasma Science (1 paper)
Partner nations: United States China Germany

In The Last Decade

Bruce Geil

37 papers receiving 467 citations

Peers

Countries citing papers authored by Bruce Geil

Since Specialization

Citations

This map shows the geographic impact of Bruce Geil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bruce Geil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bruce Geil more than expected).

Fields of papers citing papers by Bruce Geil

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bruce Geil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bruce Geil. The network helps show where Bruce Geil may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Bruce Geil, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Bruce Geil Line = papers co-authored together Bruce Geil links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	ARL 400 Amp Silicon Carbide Power Module SAE technical papers on CD-ROM/SAE technical paper series ·Bruce Geil, C. W. Tipton, Damian Urciuoli	2010	1
2	Stereolithographically fabricated aluminum nitride microchannel substrates for integrated power electronics cooling Nicholas R. Jankowski, Robert C. Lambrecht, Bruce Geil, C. W. Tipton, Jan-Otmar Hesse, Tang Hong-tu, Cathelijn Aten	2008	16
3	Manifold Microchannel Cooler for Direct Backside Liquid Cooling of SiC Power Devices Robert C. Lambrecht, Nicholas R. Jankowski, Bruce Geil, Andrew J. Bayba, Dimeji Ibitayo, Patrick McCluskey	2007	22
4	Comparing Microchannel Technologies to Minimize the Thermal Stack and Improve Thermal Performance in Hybrid Electric Vehicles Nicholas R. Jankowski, Robert C. Lambrecht, Harsha Sebestian, Bruce Geil, Patrick McCluskey	2007	16
5	Status of 1200V 4H-SiC Power DMOSFETs Hadi Ghodrat, Fatima Husna, Anant Agarwal, Aivars J. Lelis, Bruce Geil, Charles Scozzie, Mrinal K. Das, Sei‐Hyung Ryu, Sarah K. Haney, Charlotte Jonas, Craig Capell, Min Keun Shim, Jinjin Hu, Robert Callanan	2007	10
6	Encapsulated ball bearings for rotary micro machines Journal of Micromechanics and Microengineering ·Christopher M. Waits, Bruce Geil, Reza Ghodssi	2007	27
7	1200 V 4H-SiC Bipolar Junction Transistors with A Record β of 70 Journal of Electronic Materials ·Charlotte Jonas, Craig Capell, José Antonio Pontijas Sánchez-Ramos, Qingchun Zhang, Robert Callanan, Anant Agarwal, Bruce Geil, Charles Scozzie	2007	19
8	A Technique for Die Surface Temperature Measurement of High-Voltage Power Electronic Components using Coated Thermocouple Probes Conference proceedings - IEEE Instrumentation/Measurement Technology Conference ·Thomas Salem, Dimeji Ibitayo, Bruce Geil	2006	2
9	Model of High-Energy-Density Battery Based on SiC Schottky Diodes Defense Technical Information Center (DTIC) ·J. Pyrzyk, 四十坊典晴, Bruce Geil	2006	0
10	High Current 6 kV 4H-SiC PiN Diodes for Power Module Switching Applications Materials science forum ·Brett Hull, Mrinal K. Das, Jim Richmond, Contract Joe, Joseph J. Sumakeris, Bruce Geil, Charles Scozzie	2006	2
11	Thermal and electrical evaluation of SiC GTOs for pulsed power applications IEEE Transactions on Plasma Science ·Bruce Geil, Stephen Bayne, Dimeji Ibitayo, E. B. Lewis	2005	8
12	1000 V, 30 A SiC Bipolar Junction Transistors and Integrated Darlington Pairs Materials science forum ·Sumi Krishnaswami, Anant Agarwal, Craig Capell, Jim Richmond, Sei‐Hyung Ryu, John W. Palmour, S. Balachandran, T. Paul Chow, 乔健 QIAO Jian, Bruce Geil, Kenneth A. Jones, Charles Scozzie	2005	14
13	On-Demand High Energy Density Materials 四十坊典晴, Jordyn Cleavenger, Bruce Geil, G. Merkel, M. SUNAY, 周春	2005	1
14	Using a PLD BN/AlN composite as an annealing cap for ion implanted SiC Solid-State Electronics ·Laura B. Ruppalt, E. Layher, Dongsheng Yuan, Keith Jones, Matthew H. Ervin, K. W. Kirchner, Dhirendra Kumar Das, M. C. Wood, Bruce Geil, E. Neugebauer, R. D. Vispute, T. Venkatesan	2002	15
15	Advanced operational techniques and pn-pn-pn structures for high-power silicon carbide gate turn-off thyristors IEEE Transactions on Power Electronics ·Pankaj B. Shah, Bruce Geil, Donghyok Suh, 陈铁民, Stephen Bayne, Keith Jones, Timothy R. Oldham	2002	6
16	Advanced operational techniques and pn-pn-pn structures for high-power silicon carbide gate turn-off thyristors Pankaj B. Shah, Bruce Geil, Donghyok Suh, 陈铁民, Stephen Bayne, Keith Jones, Timothy R. Oldham	2002	0
17	AlN thin films deposited by pulsed laser ablation, sputtering and filtered arc techniques Thin Solid Films ·Ravi Bathe, R. D. Vispute, Daniel B. Habersat, R. P. Sharma, T. Venkatesan, Charles Scozzie, Lin Liaoyi, Bruce Geil, Steven K. Fox, Hana Ferwita Oktaviani, R. S. Bhattacharya	2001	16
18	Comparison of High-Temperature Electrcial Characterizations of Pulsed-Laser Deposited AIN on 6H- and 4H-SiC from 25 to 450°C Materials science forum ·Aivars J. Lelis, Charles Scozzie, F. B. McLean, Bruce Geil, R. D. Vispute, T. Venkatesan	2000	2
19	4H-SiC Gate Turn-Off Thyristor Designs for Very High Power Control Materials science forum ·Pankaj B. Shah, Bruce Geil, Kenneth A. Jones, 陈铁民, Michael A. Derenge	2000	0
20	Focused-ion-beam material removal rates Defense Technical Information Center (DTIC) ·Bruce Geil	1993	1

About Bruce Geil

Bruce Geil is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Mechanics of Materials, Fluid Flow and Transfer Processes and Atomic and Molecular Physics, and Optics, having authored 41 papers that have together received 492 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (32 papers), Semiconductor materials and devices (17 papers), Heat Transfer and Optimization (7 papers), Electromagnetic Compatibility and Noise Suppression (7 papers), Electrostatic Discharge in Electronics (5 papers), Semiconductor materials and interfaces (4 papers), Multilevel Inverters and Converters (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (360 citations), Fluid Flow and Transfer Processes (28 citations), Condensed Matter Physics (48 citations), Mechanical Engineering (97 citations) and Computational Mechanics (46 citations). Bruce Geil has collaborated with scholars based in United States, China and Germany. Frequent co-authors include Charles Scozzie, Anant Agarwal, Dimeji Ibitayo, Sei‐Hyung Ryu, Thomas Salem, Aivars J. Lelis, John W. Palmour, Nicholas R. Jankowski, Dionisios G. Vlachos and E. D. Wetzel. Their work appears in journals such as SAE technical papers on CD-ROM/SAE technical paper series, Solid-State Electronics, Materials science forum, Thin Solid Films and IEEE Transactions on Plasma Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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