V.A. Vardanian

496 citations
27 papers · 360 · h-index 13

Impact in

    • VLSI and Analog Circuit Testing
    • Embedded Systems Design Techniques
    • Integrated Circuits and Semiconductor Failure Analysis
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Low-power high-performance VLSI design
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

    • VLSI and Analog Circuit Testing 27
    • Radiation Effects in Electronics 18
    • Integrated Circuits and Semiconductor Failure Analysis 17
    • Semiconductor materials and devices 4
    • Low-power high-performance VLSI design 3
    • Advancements in Semiconductor Devices and Circuit Design 2

V.A. Vardanian

26 papers receiving 320 citations

Peers

V.A. Vardanian
Comparison fields: 5 of 19
  • Hardware and Architecture 321
  • Electrical and Electronic Engineering 337
  • Software 17
  • Computer Networks and Communications 29
  • Control and Systems Engineering 21
Replace Christian G. Zoellin with:
Christian G. Zoellin Germany
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V.A. Vardanian relative to Christian G. Zoellin Germany Christian G. Zoellin's profile →
Citations per field
00.5×6.5×
Christian G. Zoellin · 1×
Citations per year

Countries citing papers authored by V.A. Vardanian

Since Specialization
Citations

This map shows the geographic impact of V.A. Vardanian's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V.A. Vardanian with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V.A. Vardanian more than expected).

Fields of papers citing papers by V.A. Vardanian

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V.A. Vardanian. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V.A. Vardanian. The network helps show where V.A. Vardanian may publish in the future.

Co-authors

The 3 scholars most cited alongside V.A. Vardanian, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V.A. Vardanian Line = papers co-authored together V.A. Vardanian links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200545
2 200435
3 200231
4 201427
5 200423
6 201123
7 200321
8 200719
9 200619
10 201218
11 200416
12 200613
13 201112
14 200511
15 20118
16 20138
17 20067
18 20135
19 20155
20 20144

About V.A. Vardanian

V.A. Vardanian is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Software, Control and Systems Engineering and Computer Networks and Communications, having authored 27 papers that have together received 360 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (27 papers), Radiation Effects in Electronics (18 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers), Semiconductor materials and devices (4 papers), Software Testing and Debugging Techniques (3 papers), Low-power high-performance VLSI design (3 papers), Engineering and Test Systems (2 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). The work is most often cited by research in Hardware and Architecture (321 citations), Electrical and Electronic Engineering (337 citations), Software (17 citations), Computer Networks and Communications (29 citations) and Control and Systems Engineering (21 citations). V.A. Vardanian has collaborated with scholars based in United States, Switzerland and Armenia. Frequent co-authors include Y. Zorian, S. Shoukourian and G. Harutyunyan. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Journal of Electronic Testing and IEEE Design & Test of Computers.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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