Y. Hirano
- Automotive Engineering top 10%
-
- Advancements in Semiconductor Devices and Circuit Design 24
- Semiconductor materials and devices 22
- Integrated Circuits and Semiconductor Failure Analysis 7
- Low-power high-performance VLSI design 7
- Silicon Carbide Semiconductor Technologies 6
- Radio Frequency Integrated Circuit Design 2
- Electrostatic Discharge in Electronics 2
- Ferroelectric and Negative Capacitance Devices 2
- Co-authors
- J. R. SelmanIsamu UchidaSaid Al HallajT. IwamatsuT. OhmiHiroyuki ShimadaT. IppōshiS. Maegawa
- Journals
- Journal of Power Sources (1 paper)IEEE Transactions on Electron Devices (7 papers)Japanese Journal of Applied Physics (2 papers)
- Partner nations
- JapanUnited StatesGermany
In The Last Decade
Y. Hirano
27 papers receiving 297 citations
Peers
Comparison fields: 5 of 29
- Automotive Engineering 74
- Electrical and Electronic Engineering 308
- Hardware and Architecture 14
- Safety, Risk, Reliability and Quality 4
- Mechanical Engineering 13
Countries citing papers authored by Y. Hirano
This map shows the geographic impact of Y. Hirano's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Hirano with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Hirano more than expected).
Fields of papers citing papers by Y. Hirano
This network shows the impact of papers produced by Y. Hirano. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Hirano. The network helps show where Y. Hirano may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Y. Hirano, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2010 | 30 | |
| 2 | 2007 | 6 | |
| 3 | 2005 | 1 | |
| 4 | 2004 | 16 | |
| 5 | 2004 | 2 | |
| 6 | 2003 | 1 | |
| 7 | 2003 | 1 | |
| 8 | 2003 | 18 | |
| 9 | 2002 | 12 | |
| 10 | 2002 | 2 | |
| 11 | 2002 | 17 | |
| 12 | 2002 | 3 | |
| 13 | 2002 | 6 | |
| 14 | 2002 | 0 | |
| 15 | 2001 | 81 | |
| 16 | 2001 | 13 | |
| 17 | 2001 | 4 | |
| 18 | Active body-bias SOI-CMOS driver circuits | 1997 | 3 |
| 19 | 1997 | 27 | |
| 20 | 1997 | 23 |
About Y. Hirano
Y. Hirano is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Statistics, Probability and Uncertainty, having authored 30 papers that have together received 319 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (24 papers), Semiconductor materials and devices (22 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Low-power high-performance VLSI design (7 papers), Silicon Carbide Semiconductor Technologies (6 papers), Radio Frequency Integrated Circuit Design (2 papers), Electrostatic Discharge in Electronics (2 papers) and Ferroelectric and Negative Capacitance Devices (2 papers). The work is most often cited by research in Automotive Engineering (74 citations), Electrical and Electronic Engineering (308 citations) and Hardware and Architecture (14 citations). Y. Hirano has collaborated with scholars based in Japan, United States and Germany. Frequent co-authors include J. R. Selman, Isamu Uchida, Said Al Hallaj, T. Iwamatsu, T. Ohmi, Hiroyuki Shimada, T. Ippōshi, S. Maegawa, Koji Nii and Yutaro Yamaguchi. Their work appears in journals such as Journal of Power Sources, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.