K. Sonoda

584 total citations
41 papers, 452 citations indexed

About

K. Sonoda is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, K. Sonoda has authored 41 papers receiving a total of 452 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 4 papers in Materials Chemistry and 3 papers in Mechanics of Materials. Recurrent topics in K. Sonoda's work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). K. Sonoda is often cited by papers focused on Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). K. Sonoda collaborates with scholars based in Japan, United States and Germany. K. Sonoda's co-authors include O. Tsuchiya, Kiyoshi Ishikawa, T. Eimori, Harushige Tsubakino, Ryoichi Nozato, Kenji Taniguchi, Chihiro Hamaguchi, Atsushi Sakai, Yasuo Inoue and Masahiro Moniwa and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Journal of Sound and Vibration.

In The Last Decade

K. Sonoda

35 papers receiving 429 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Sonoda Japan 12 343 94 41 40 33 41 452
Babak Jamshidi United States 5 276 0.8× 89 0.9× 52 1.3× 27 0.7× 95 2.9× 9 384
Bruce Geil United States 15 360 1.0× 63 0.7× 42 1.0× 10 0.3× 54 1.6× 41 492
R.N. Master United States 13 355 1.0× 45 0.5× 62 1.5× 22 0.6× 11 0.3× 40 414
Jeffery C. C. Lo Hong Kong 10 261 0.8× 66 0.7× 90 2.2× 14 0.3× 52 1.6× 98 412
Qiaoling Tong China 14 609 1.8× 57 0.6× 24 0.6× 19 0.5× 82 2.5× 27 675
Siva P. Gurrum United States 9 158 0.5× 111 1.2× 36 0.9× 14 0.3× 22 0.7× 34 364
Robert G. Azevedo United States 9 235 0.7× 85 0.9× 55 1.3× 14 0.3× 129 3.9× 15 338
Sung-Hwan Hwang United States 11 367 1.1× 81 0.9× 21 0.5× 9 0.2× 51 1.5× 28 498
Pinyen Lin United States 6 202 0.6× 45 0.5× 74 1.8× 9 0.2× 78 2.4× 12 324
Matthias Hütter Germany 12 404 1.2× 36 0.4× 43 1.0× 8 0.2× 58 1.8× 53 527

Countries citing papers authored by K. Sonoda

Since Specialization
Citations

This map shows the geographic impact of K. Sonoda's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Sonoda with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Sonoda more than expected).

Fields of papers citing papers by K. Sonoda

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Sonoda. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Sonoda. The network helps show where K. Sonoda may publish in the future.

Co-authorship network of co-authors of K. Sonoda

This figure shows the co-authorship network connecting the top 25 collaborators of K. Sonoda. A scholar is included among the top collaborators of K. Sonoda based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Sonoda. K. Sonoda is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sonoda, K., et al.. (2022). Modeling electrical resistivity of CrSi thin films. Solid-State Electronics. 198. 108471–108471.
2.
Nishimura, T., et al.. (2021). Full band Monte Carlo analysis of the uniaxial stress impact on 4H-SiC high energy transport. 28–31. 1 indexed citations
3.
Yamaguchi, Tadashi, et al.. (2020). Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution. IEICE Technical Report; IEICE Tech. Rep.. 119(397). 5–8. 2 indexed citations
4.
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6.
Inoue, Masao, et al.. (2016). Comprehensive study on charge trapping property of Si-containing hafnium-oxide polymorph. Japanese Journal of Applied Physics. 55(8S2). 08PB03–08PB03. 2 indexed citations
7.
Sonoda, K., et al.. (2015). Electron trap level of hydrogen incorporated nitrogen vacancies in silicon nitride. Journal of Applied Physics. 117(10). 26 indexed citations
8.
Tsuchiya, Toshiaki, et al.. (2013). (Invited) Characterization of Oxide Traps Participating in Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs. ECS Transactions. 58(9). 265–279. 11 indexed citations
9.
Ohbayashi, S., K. Sonoda, Y. Hirano, et al.. (2010). Application of a statistical compact model for Random Telegraph Noise to scaled-SRAM Vmin analysis. 95–96. 30 indexed citations
10.
Sonoda, K., Kiyoshi Ishikawa, T. Eimori, & O. Tsuchiya. (2007). Discrete Dopant Effects on Statistical Variation of Random Telegraph Signal Magnitude. IEEE Transactions on Electron Devices. 54(8). 1918–1925. 95 indexed citations
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Sonoda, K., Takashi Ogura, Shotai Kobayashi, et al.. (2004). Compact Modeling of a Flash Memory Cell Including Substrate-Bias-Dependent Hot-Electron Gate Current. IEEE Transactions on Electron Devices. 51(10). 1726–1730. 6 indexed citations
13.
Kõyama, T., et al.. (2001). Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique. Microelectronics Reliability. 41(8). 1243–1253. 4 indexed citations
14.
Sonoda, K., et al.. (2000). Impact response of anisotropic plates by the method of eigenfunction expansion. WIT transactions on the built environment. 48. 625–633. 1 indexed citations
15.
Sonoda, K., et al.. (1996). Impact Ionization Model Using Average Energy and Average Square Energy of Distribution Function. Japanese Journal of Applied Physics. 35(2S). 818–818. 12 indexed citations
16.
17.
Sonoda, K., Kenji Taniguchi, & Chihiro Hamaguchi. (1991). Analytical device model including velocity overshoot effect for ultra small MOSFETs. Microelectronic Engineering. 15(1-4). 221–224. 1 indexed citations
18.
Sonoda, K., Kenji Taniguchi, & Chihiro Hamaguchi. (1991). Analytical device model for submicrometer MOSFET's. IEEE Transactions on Electron Devices. 38(12). 2662–2668. 27 indexed citations
19.
Sonoda, K., Yoshitsugu Inoue, Kenji Taniguchi, & Chihiro Hamaguchi. (1989). Physical Models for Deep Submicron Device Simulation. Japanese Journal of Applied Physics. 28(12A). L2313–L2313. 4 indexed citations
20.
Sonoda, K., et al.. (1970). Impact Fracture Analysis Of ReinforcedConcrete Rock Sheds. WIT transactions on the built environment. 8.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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