Victor M. van Santen

643 total citations
35 papers, 418 citations indexed

About

Victor M. van Santen is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, Victor M. van Santen has authored 35 papers receiving a total of 418 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 7 papers in Hardware and Architecture and 2 papers in Computer Networks and Communications. Recurrent topics in Victor M. van Santen's work include Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Ferroelectric and Negative Capacitance Devices (13 papers). Victor M. van Santen is often cited by papers focused on Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Ferroelectric and Negative Capacitance Devices (13 papers). Victor M. van Santen collaborates with scholars based in Germany, India and Spain. Victor M. van Santen's co-authors include Hussam Amrouch, Jörg Henkel, Souvik Mahapatra, J. Martín-Martínez, M. Nafrı́a, Thomas Ebi, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan and Jörg Henkel and has published in prestigious journals such as IEEE Access, IEEE Transactions on Computers and Solid-State Electronics.

In The Last Decade

Victor M. van Santen

34 papers receiving 411 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Victor M. van Santen Germany 13 386 110 34 28 19 35 418
Mesut Meterelliyoz United States 13 469 1.2× 155 1.4× 83 2.4× 14 0.5× 27 1.4× 24 515
V. K. Tomar India 14 420 1.1× 107 1.0× 18 0.5× 12 0.4× 47 2.5× 53 458
R. Divakaruni United States 10 306 0.8× 82 0.7× 68 2.0× 12 0.4× 33 1.7× 35 358
Masood Qazi United States 12 482 1.2× 196 1.8× 34 1.0× 13 0.5× 32 1.7× 17 518
Saibal Mukhopadhyay United States 15 559 1.4× 199 1.8× 42 1.2× 17 0.6× 15 0.8× 38 587
John Safran United States 9 327 0.8× 92 0.8× 18 0.5× 15 0.5× 17 0.9× 19 343
Jui-Jen Wu Taiwan 11 416 1.1× 77 0.7× 17 0.5× 24 0.9× 20 1.1× 20 428
Simon Thomann Germany 10 314 0.8× 32 0.3× 12 0.4× 25 0.9× 62 3.3× 37 324
A. Maheshwari United States 9 481 1.2× 170 1.5× 62 1.8× 12 0.4× 9 0.5× 17 509
Campbell Millar United Kingdom 14 567 1.5× 75 0.7× 16 0.5× 15 0.5× 33 1.7× 44 600

Countries citing papers authored by Victor M. van Santen

Since Specialization
Citations

This map shows the geographic impact of Victor M. van Santen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Victor M. van Santen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Victor M. van Santen more than expected).

Fields of papers citing papers by Victor M. van Santen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Victor M. van Santen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Victor M. van Santen. The network helps show where Victor M. van Santen may publish in the future.

Co-authorship network of co-authors of Victor M. van Santen

This figure shows the co-authorship network connecting the top 25 collaborators of Victor M. van Santen. A scholar is included among the top collaborators of Victor M. van Santen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Victor M. van Santen. Victor M. van Santen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Santen, Victor M. van, et al.. (2025). Cryo-CACTI: Cryogenic-Aware CACTI for Cache Modeling Down to 10K in Advanced 7nm FinFETs. IEEE Transactions on Computers. 74(8). 2567–2580. 1 indexed citations
2.
Amrouch, Hussam, et al.. (2023). CARAT – A reliability analysis framework for BTI-HCD aging in circuits. Solid-State Electronics. 201. 108586–108586. 7 indexed citations
3.
Parihar, Shivendra Singh, Victor M. van Santen, Simon Thomann, et al.. (2023). Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Transactions on Circuits and Systems I Regular Papers. 70(8). 3089–3102. 21 indexed citations
4.
Santen, Victor M. van, Marcel Walter, Shivendra Singh Parihar, et al.. (2023). Design Automation for Cryogenic CMOS Circuits. 1–6. 5 indexed citations
5.
Santen, Victor M. van, et al.. (2023). Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31(9). 1280–1293.
6.
Santen, Victor M. van, et al.. (2021). Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. 1–7. 2 indexed citations
7.
Santen, Victor M. van, et al.. (2021). On the Reliability of FeFET On-Chip Memory. IEEE Transactions on Computers. 71(4). 947–958. 34 indexed citations
8.
Amrouch, Hussam, Ramesh Karri, Farshad Khorrami, et al.. (2021). Special Session: Machine Learning for Semiconductor Test and Reliability. 1–11. 7 indexed citations
9.
Santen, Victor M. van, et al.. (2021). FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30(3). 339–352. 9 indexed citations
10.
Santen, Victor M. van, et al.. (2020). Massively Parallel Circuit Setup in GPU-SPICE. IEEE Transactions on Computers. 72(8). 2127–2138. 6 indexed citations
11.
Santen, Victor M. van, Simon Thomann, Uma Sharma, et al.. (2020). BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity. 1–7. 15 indexed citations
12.
Amrouch, Hussam, Victor M. van Santen, Girish Pahwa, Yogesh Singh Chauhan, & Jörg Henkel. (2020). NCFET to Rescue Technology Scaling: Opportunities and Challenges. 637–644. 14 indexed citations
13.
Santen, Victor M. van, et al.. (2019). On the Workload Dependence of Self-Heating in FinFET Circuits. IEEE Transactions on Circuits & Systems II Express Briefs. 67(10). 1949–1953. 9 indexed citations
14.
Santen, Victor M. van, et al.. (2019). Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27(7). 1652–1665. 11 indexed citations
15.
Santen, Victor M. van, Hussam Amrouch, & Jörg Henkel. (2019). Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level. IEEE Transactions on Circuits and Systems I Regular Papers. 66(7). 2671–2684. 10 indexed citations
16.
Santen, Victor M. van, Hussam Amrouch, & Jörg Henkel. (2019). New Worst-Case Timing for Standard Cells Under Aging Effects. IEEE Transactions on Device and Materials Reliability. 19(1). 149–158. 16 indexed citations
17.
Santen, Victor M. van, Hussam Amrouch, & Jörg Henkel. (2018). Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Transactions on Circuits & Systems II Express Briefs. 66(9). 1527–1531. 1 indexed citations
18.
Amrouch, Hussam, et al.. (2017). Impact of BTI on dynamic and static power: From the physical to circuit level. CR–3.1. 31 indexed citations
19.
Santen, Victor M. van, J. Martín-Martínez, Hussam Amrouch, M. Nafrı́a, & Jörg Henkel. (2017). Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. IEEE Transactions on Circuits and Systems I Regular Papers. 65(1). 293–306. 33 indexed citations
20.
Amrouch, Hussam, J. Martín-Martínez, Victor M. van Santen, et al.. (2015). Connecting the physical and application level towards grasping aging effects. 3D.1.1–3D.1.8. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Mesut Meterelliyoz Breakdown of academic impact, for papers by V. K. Tomar Breakdown of academic impact, for papers by R. Divakaruni Breakdown of academic impact, for papers by Masood Qazi Breakdown of academic impact, for papers by Saibal Mukhopadhyay Breakdown of academic impact, for papers by John Safran Breakdown of academic impact, for papers by Jui-Jen Wu Breakdown of academic impact, for papers by Simon Thomann Breakdown of academic impact, for papers by A. Maheshwari Breakdown of academic impact, for papers by Campbell Millar
Rankless by CCL
2026