T. Lohner
Impact in
- Computational Mechanics top 2%
- Ion-surface interactions and analysis
- Surface Roughness and Optical Measurements
- Surfaces, Coatings and Films top 5%
Papers in
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- Ion-surface interactions and analysis 69
-
- Glass properties and applications 14
T. Lohner
166 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 90
- Computational Mechanics 631
- Surfaces, Coatings and Films 181
- Electrical and Electronic Engineering 1.2k
- Materials Chemistry 839
- Ceramics and Composites 97
Countries citing papers authored by T. Lohner
This map shows the geographic impact of T. Lohner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Lohner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Lohner more than expected).
Fields of papers citing papers by T. Lohner
This network shows the impact of papers produced by T. Lohner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Lohner. The network helps show where T. Lohner may publish in the future.
Co-authorship network
The 25 scholars most cited alongside T. Lohner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 5 | |
| 2 | 2020 | 13 | |
| 3 | Spectroellipsometric Characterization of Sputtered Silicon Nitride Films Using Two Different Dispersion Relations | 2016 | 1 |
| 4 | 2015 | 2 | |
| 5 | 2014 | 22 | |
| 6 | 2012 | 20 | |
| 7 | 2012 | 3 | |
| 8 | 2011 | 21 | |
| 9 | 2010 | 6 | |
| 10 | Optical models for ellipsometric characterization of high temperature annealed nanostructured SiO2 films | 2009 | 3 |
| 11 | Composition and Thickness of RF Sputtered Amorphous Silicon Alloy Films | 2008 | 2 |
| 12 | 2006 | 20 | |
| 13 | 2006 | 13 | |
| 14 | 2004 | 11 | |
| 15 | 2002 | 7 | |
| 16 | 1998 | 6 | |
| 17 | 1997 | 2 | |
| 18 | 1992 | 87 | |
| 19 | 1992 | 69 | |
| 20 | 1980 | 3 |
About T. Lohner
T. Lohner is a scholar working on Computational Mechanics, Ceramics and Composites, Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation, having authored 170 papers that have together received 1.7k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (69 papers), Thin-Film Transistor Technologies (46 papers), Silicon and Solar Cell Technologies (46 papers), Silicon Nanostructures and Photoluminescence (39 papers), Integrated Circuits and Semiconductor Failure Analysis (38 papers), Semiconductor materials and devices (38 papers), Glass properties and applications (14 papers) and Semiconductor materials and interfaces (13 papers). The work is most often cited by research in Computational Mechanics (631 citations), Surfaces, Coatings and Films (181 citations), Electrical and Electronic Engineering (1.2k citations), Materials Chemistry (839 citations) and Ceramics and Composites (97 citations). T. Lohner has collaborated with scholars based in Hungary, Germany and Japan. Frequent co-authors include M. Fried, P. Petrík, J. Gyulai, N.Q. Khánh, O. Polgár, E. Kótai, A. van Silfhout, L.J. Hanekamp, G. Mezey and W.A.M. Aarnink. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Thin Solid Films, Journal of Applied Physics, Vacuum and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.