William A. McGahan

1.9k total citations · 1 hit paper
47 papers, 1.6k citations indexed

About

William A. McGahan is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, William A. McGahan has authored 47 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 15 papers in Atomic and Molecular Physics, and Optics and 15 papers in Computational Mechanics. Recurrent topics in William A. McGahan's work include Magneto-Optical Properties and Applications (14 papers), Surface Roughness and Optical Measurements (10 papers) and Optical Polarization and Ellipsometry (9 papers). William A. McGahan is often cited by papers focused on Magneto-Optical Properties and Applications (14 papers), Surface Roughness and Optical Measurements (10 papers) and Optical Polarization and Ellipsometry (9 papers). William A. McGahan collaborates with scholars based in United States and South Korea. William A. McGahan's co-authors include John A. Woollam, Blaine Johs, W. M. Paulson, Craig M. Herzinger, Kevin D. Cole, Jeffrey S. Hale, Shan Zheng, Frank K. Urban, Ping He and Daniel D. Stancil and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Optics Express.

In The Last Decade

William A. McGahan

43 papers receiving 1.5k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

1998 893 citations Craig M. Herzinger, Blaine Johs et al. Journal of Applied Physics profile →

Peers

Countries citing papers authored by William A. McGahan

Since Specialization

Citations

This map shows the geographic impact of William A. McGahan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by William A. McGahan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites William A. McGahan more than expected).

Fields of papers citing papers by William A. McGahan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by William A. McGahan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by William A. McGahan. The network helps show where William A. McGahan may publish in the future.

Co-authorship network of co-authors of William A. McGahan

This figure shows the co-authorship network connecting the top 25 collaborators of William A. McGahan. A scholar is included among the top collaborators of William A. McGahan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with William A. McGahan. William A. McGahan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Device based in-chip critical dimension and overlay metrology 2009 ·Optics Express ·Young‐Nam Kim, (unknown), (unknown), Sang‐Bong Lee, Jiangtao Hu, Zhuan Liu, (unknown), William A. McGahan	39
2	Design and performance of a normal-incidence optical critical dimension metrology system 2002 ·William A. McGahan, (unknown), P. I. Rovira, R. Lowe-Webb, (unknown), (unknown), (unknown)	3
3	A multi-sample, multi-wavelength, multi-angle investigation of the interface layer between silicon and thermally grown silicon dioxide 1998 ·Thin Solid Films ·Craig M. Herzinger, Blaine Johs, William A. McGahan, W. M. Paulson	11
4	Characterizing optical properties of red, green, and blue color filters for automated film-thickness measurement 1998 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), William A. McGahan	2
5	<title>Combined spectroscopic ellipsometry and reflectometry for advanced semiconductor fabrication metrology</title> 1996 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·William A. McGahan, (unknown), (unknown), John D. Williams	3
6	Optical properties of cobalt oxide films deposited by spray pyrolysis 1996 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown), Frank K. Urban, (unknown), William A. McGahan	56
7	Optical analysis of complex multilayer structures using multiple data types 1994 ·Thin Solid Films ·Blaine Johs, William A. McGahan, John A. Woollam	20
8	Optical Characterization and Modeling of Amorphous Hydrogenated Carbon Films 1994 ·MRS Proceedings ·William A. McGahan, John A. Woollam	11
9	Theory of Multilayers Heated by Laser Absorption 1993 ·Journal of Heat Transfer ·Kevin D. Cole, William A. McGahan	33
10	Thermal characterization of thin films by photothermally induced laser beam deflection 1993 ·Thin Solid Films ·(unknown), William A. McGahan, John A. Woollam, Kevin D. Cole	13
11	In situ and Ex situ Applications of Spectroscopic Ellipsometry 1993 ·MRS Proceedings ·John A. Woollam, Blaine Johs, William A. McGahan, Paul G. Snyder, Jeffrey S. Hale, (unknown)	1
12	Optical and magneto-optical characterization of thin films 1992 ·William A. McGahan, Ping He, John A. Woollam, Federico Sequeda	2
13	Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures 1991 ·Journal of Applied Physics ·Ping He, William A. McGahan, John A. Woollam, F. Sequeda, Daniel D. Stancil, Hoa Do	30
14	Optimization of quadrilayer structures for various magneto-optical recording materials 1991 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ping He, William A. McGahan, John A. Woollam	6
15	Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers 1991 ·Journal of Applied Physics ·Ping He, William A. McGahan, S. Nafis, John A. Woollam, Shan Zheng, S. H. Liou, F. Sequeda, Daniel D. Stancil, Hoa Do	19
16	Optimization of Quadralayer Structures for Various Magneto-Optical Recording Materials 1991 ·Ping He, William A. McGahan, John A. Woollam	1
17	Pulsed Laser Deposition of Magneto-Optic Material 1990 ·MRS Proceedings ·(unknown), William A. McGahan, N. J. Ianno, John A. Woollam	2
18	Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayers 1989 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·William A. McGahan, Shan Zheng, (unknown), Thomas E. Tiwald, John A. Woollam	3
19	Resonant Moke Spectra in Magnetic Layers on Silver 1989 ·MRS Proceedings ·(unknown), William A. McGahan, Shan Zheng, D. J. Sellmyer, John A. Woollam	3
20	Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures 1989 ·Applied Physics Letters ·William A. McGahan, Liang‐Yao Chen, Shan Zheng, D. J. Sellmyer, John A. Woollam	19

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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