A. Szekeres

1.7k total citations
148 papers, 1.4k citations indexed

About

A. Szekeres is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A. Szekeres has authored 148 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 108 papers in Electrical and Electronic Engineering, 85 papers in Materials Chemistry and 26 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A. Szekeres's work include Semiconductor materials and devices (66 papers), Thin-Film Transistor Technologies (36 papers) and Silicon Nanostructures and Photoluminescence (34 papers). A. Szekeres is often cited by papers focused on Semiconductor materials and devices (66 papers), Thin-Film Transistor Technologies (36 papers) and Silicon Nanostructures and Photoluminescence (34 papers). A. Szekeres collaborates with scholars based in Bulgaria, Romania and Hungary. A. Szekeres's co-authors include K. Gesheva, T. Ivanova, S. Alexandrova, V. Pamukchieva, Á. Cziráki, D. Gogova, M. Gärtner, Margit Fábián, I. N. Mihãilescu and E. Svàb and has published in prestigious journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and Electrochimica Acta.

In The Last Decade

A. Szekeres

143 papers receiving 1.4k citations

Peers

A. Szekeres
E.E. Khawaja Saudi Arabia
N. Nicoloso Germany
G. Baud France
A. Szekeres
Citations per year, relative to A. Szekeres A. Szekeres (= 1×) peers Keishi Nishio

Countries citing papers authored by A. Szekeres

Since Specialization
Citations

This map shows the geographic impact of A. Szekeres's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Szekeres with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Szekeres more than expected).

Fields of papers citing papers by A. Szekeres

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Szekeres. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Szekeres. The network helps show where A. Szekeres may publish in the future.

Co-authorship network of co-authors of A. Szekeres

This figure shows the co-authorship network connecting the top 25 collaborators of A. Szekeres. A scholar is included among the top collaborators of A. Szekeres based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Szekeres. A. Szekeres is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gärtner, M., Mariana Chelu, A. Szekeres, & P. Petrík. (2025). Towards Advanced Materials: Functional Perspectives of Co-Doped ZnO Thin Films. Micromachines. 16(10). 1179–1179. 1 indexed citations
2.
Szekeres, A., Hermine Stroescu, Madalina Nicolescu, et al.. (2024). Sol-Gel Multilayered Niobium (Vanadium)-Doped TiO2 for CO Sensing and Photocatalytic Degradation of Methylene Blue. Materials. 17(8). 1923–1923. 2 indexed citations
3.
Gärtner, M., et al.. (2023). Advanced Nanostructured Coatings Based on Doped TiO2 for Various Applications. Molecules. 28(23). 7828–7828. 10 indexed citations
4.
Stoica, Mihai, José Maria Calderón-Moreno, Mihai Anastasescu, et al.. (2018). Optical, morphological and durability studies of quaternary chalcogenide Ge-Sb(As)-(S,Te) films. Materials Research Bulletin. 106. 234–242. 7 indexed citations
5.
Gärtner, M., Mihai Anastasescu, Mihai Stoica, et al.. (2018). Influence of compositional variation on the optical and morphological properties of Ge Sb Se films for optoelectronics application. Infrared Physics & Technology. 93. 260–270. 11 indexed citations
6.
Pamukchieva, V., A. Szekeres, & D. Arsova. (2011). Spectroscopic ellipsometry study of the effect of illumination and thermal annealing on the optical constants of thin Ge–As–S films. Physica Scripta. 83(2). 25405–25405. 2 indexed citations
7.
Lohner, T., et al.. (2009). Optical models for ellipsometric characterization of high temperature annealed nanostructured SiO2 films. Journal of Optoelectronics and Advanced Materials. 11(9). 1288–1292. 3 indexed citations
8.
Pamukchieva, V., A. Szekeres, Margit Fábián, et al.. (2009). Evaluation of basic physical parameters of quaternary Ge–Sb-(S,Te) chalcogenide glasses. Journal of Non-Crystalline Solids. 355(50-51). 2485–2490. 68 indexed citations
9.
Szekeres, A., et al.. (2005). ELECTRICAL PROPERTIES OF PLASMA-ASSISTED CVD DEPOSITED THIN SILICON OXYNITRIDE FILMS. Journal of Optoelectronics and Advanced Materials. 7(1). 553–556. 4 indexed citations
10.
Hamelmann, Frank, K. Gesheva, T. Ivanova, et al.. (2005). OPTICAL AND ELECTROCHROMIC CHARACTERIZATION OF MULTILAYERED MIXED METAL OXIDE THIN FILMS. Journal of Optoelectronics and Advanced Materials. 7(1). 393–396. 18 indexed citations
11.
Hamelmann, Frank, U. Heinzmann, A. Szekeres, Н. Киров, & Teodora Nikolova. (2005). Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient : IR spectra analysis. Journal of Optoelectronics and Advanced Materials. 7(1). 389–392. 27 indexed citations
12.
Černošková, E. & A. Szekeres. (2005). INFLUENCE OF ILLUMINATION ON THE OPTICAL BANDGAP ENERGY VALUE OF GexSb20-xTe80 FILMS. 1 indexed citations
13.
Alexandrova, S., et al.. (2004). Variable frequency C-V analysis for observation of oxide charge in MOS structures with LPCVD-silicon oxynitride film. Comptes Rendus De L Academie Bulgare Des Sciences. 57(8). 15–22. 3 indexed citations
14.
Ivanova, Tatiana, K. Gesheva, & A. Szekeres. (2002). Structure and optical properties of CVD molybdenum oxide films for electrochromic application. Journal of Solid State Electrochemistry. 7(1). 21–24. 59 indexed citations
15.
Gesheva, K., et al.. (2001). APCVD-molybdenum oxide thin films : Vibrational and optical properties. Journal de Physique IV (Proceedings). 11(PR3). Pr3–1023. 7 indexed citations
16.
Szekeres, A. & D. Gogova. (1998). Optical constants of thin CVD-Tungsten oxide films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3573. 200–200. 5 indexed citations
17.
Szekeres, A., et al.. (1992). Stress-induced refractive index variation in dry SiO2. Philosophical Magazine B. 65(5). 961–966. 6 indexed citations
18.
Szekeres, A., et al.. (1992). Multiple‐angle ellipsometric study of the interfacial layer in SiSiO 2 structures. Surface and Interface Analysis. 19(1-12). 483–486. 4 indexed citations
19.
Alexandrova, S. & A. Szekeres. (1985). On the correlation of the charged centers in Al-thermal SiO2Si structures. physica status solidi (a). 92(2). 589–594. 6 indexed citations
20.
Szekeres, A. & S. Alexandrova. (1983). R.F. plasma annealing of as-grown defects in the Si/SiO2 system. Thin Solid Films. 106(3). 153–158. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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