Bernd Bodermann

963 total citations
89 papers, 697 citations indexed

About

Bernd Bodermann is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Bernd Bodermann has authored 89 papers receiving a total of 697 indexed citations (citations by other indexed papers that have themselves been cited), including 62 papers in Surfaces, Coatings and Films, 46 papers in Electrical and Electronic Engineering and 32 papers in Biomedical Engineering. Recurrent topics in Bernd Bodermann's work include Optical Coatings and Gratings (56 papers), Surface Roughness and Optical Measurements (27 papers) and Advancements in Photolithography Techniques (26 papers). Bernd Bodermann is often cited by papers focused on Optical Coatings and Gratings (56 papers), Surface Roughness and Optical Measurements (27 papers) and Advancements in Photolithography Techniques (26 papers). Bernd Bodermann collaborates with scholars based in Germany, United States and Netherlands. Bernd Bodermann's co-authors include M. Wurm, E. Tiemann, H. Knöckel, Alexander C. Diener, Andreas Rathsfeld, M. Bär, Harald Bosse, Hermann Groß, Egbert Buhr and Frank Scholze and has published in prestigious journals such as SHILAP Revista de lepidopterología, Scientific Reports and Optics Letters.

In The Last Decade

Bernd Bodermann

85 papers receiving 652 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Bernd Bodermann Germany 13 305 253 240 239 199 89 697
R. J. King United Kingdom 12 87 0.3× 186 0.7× 232 1.0× 173 0.7× 98 0.5× 44 545
Jorge Filevich United States 11 37 0.1× 282 1.1× 150 0.6× 64 0.3× 88 0.4× 35 627
Scott Halle United States 13 92 0.3× 182 0.7× 306 1.3× 74 0.3× 37 0.2× 59 521
Omar El Gawhary Netherlands 12 124 0.4× 340 1.3× 119 0.5× 202 0.8× 48 0.2× 36 533
Pierre Kern France 15 47 0.2× 533 2.1× 420 1.8× 205 0.9× 84 0.4× 61 991
Azalia A. Krasnoperova United States 14 86 0.3× 74 0.3× 273 1.1× 148 0.6× 28 0.1× 38 570
Yasuhiro Mizutani Japan 14 34 0.1× 331 1.3× 381 1.6× 155 0.6× 19 0.1× 52 577
P. Labeye France 15 33 0.1× 540 2.1× 661 2.8× 105 0.4× 46 0.2× 83 835
Ernest V. Loewenstein United States 9 53 0.2× 193 0.8× 263 1.1× 105 0.4× 24 0.1× 17 485
James P. McGuire United States 13 85 0.3× 352 1.4× 171 0.7× 247 1.0× 26 0.1× 47 598

Countries citing papers authored by Bernd Bodermann

Since Specialization
Citations

This map shows the geographic impact of Bernd Bodermann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bernd Bodermann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bernd Bodermann more than expected).

Fields of papers citing papers by Bernd Bodermann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bernd Bodermann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bernd Bodermann. The network helps show where Bernd Bodermann may publish in the future.

Co-authorship network of co-authors of Bernd Bodermann

This figure shows the co-authorship network connecting the top 25 collaborators of Bernd Bodermann. A scholar is included among the top collaborators of Bernd Bodermann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bernd Bodermann. Bernd Bodermann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Burger, Sven, et al.. (2025). Spectroscopic Ellipsometry of Plasmonic Gratings─Ideal Parameters for Sensing and Subpicometer Measurement Uncertainty. ACS Omega. 10(14). 14466–14473. 1 indexed citations
2.
Siefke, Thomas, et al.. (2020). Inverted plasmonic lens design for nanometrology applications. Measurement Science and Technology. 31(7). 74013–74013. 3 indexed citations
3.
Kroker, Stefanie, et al.. (2020). Imaging Mueller matrix ellipsometry setup for optical nanoform metrology. SHILAP Revista de lepidopterología. 238. 6006–6006. 1 indexed citations
4.
Siefke, Thomas, J. H. Meyer, Sven Burger, et al.. (2020). Quasi-bound states in the continuum for deep subwavelength structural information retrieval for DUV nano-optical polarizers. Optics Express. 28(16). 23122–23122. 4 indexed citations
5.
Weimann, Thomas, P. Hinze, Thorsten Dziomba, et al.. (2019). Method for non-invasive hemoglobin oxygen saturation measurement using broadband light source and color filters. 67–67. 2 indexed citations
6.
Raab, Mario, et al.. (2018). Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures. Scientific Reports. 8(1). 1780–1780. 36 indexed citations
7.
Hinze, P., Thomas Weimann, Bernd Bodermann, et al.. (2018). Pixel-Wise Multispectral Sensing System Using Nanostructured Filter Matrix for Biomedical Applications. SHILAP Revista de lepidopterología. 880–880. 1 indexed citations
8.
Petrík, P., Emil Agócs, P. Kozma, et al.. (2015). Methods for optical modeling and cross-checking in ellipsometry and scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9526. 95260S–95260S. 2 indexed citations
9.
Bosse, Harald, Bernd Bodermann, Gaoliang Dai, et al.. (2015). Challenges in nanometrology: highprecision measurement of position and size. tm - Technisches Messen. 82(7-8). 346–358.
10.
Agócs, Emil, Bernd Bodermann, Sven Burger, et al.. (2015). Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9556. 955610–955610. 9 indexed citations
11.
12.
Bodermann, Bernd, et al.. (2013). The road towards accurate optical width measurements at the industrial level. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8788. 87881S–87881S. 1 indexed citations
13.
Scholze, Frank, Bernd Bodermann, Hermann Groß, Akiko Kato, & M. Wurm. (2011). First steps towards traceability in scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7985. 79850G–79850G. 3 indexed citations
14.
Köning, Rainer, Jens Flügge, Gaoliang Dai, et al.. (2011). Dimensional Micro- and Nanometrology at PTB. 1 indexed citations
15.
Bodermann, Bernd, et al.. (2010). A 193nm microscope for CD metrology for the 32nm node and beyond. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7545. 75450A–75450A. 3 indexed citations
16.
Bodermann, Bernd, et al.. (2009). A 193nm optical CD metrology tool for the 32nm node. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7488. 74881J–74881J.
17.
Bodermann, Bernd, et al.. (2009). A new high-aperture 193 nm microscope for the traceable dimensional characterization of micro- and nanostructures. Measurement Science and Technology. 20(8). 84010–84010. 11 indexed citations
18.
Richter, Jan, et al.. (2006). Systematic investigation of CD metrology tool response to sidewall profile variation on a COG test mask. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6281. 62810D–62810D. 3 indexed citations
19.
Bodermann, Bernd, et al.. (2004). High precision description of the rovibronic structure of the I $\mathsf{_2}$ B-X spectrum. The European Physical Journal D. 28(2). 199–209. 77 indexed citations
20.
Bodermann, Bernd, et al.. (1998). Wavelength measurements of three iodine lines between 780 nm and 795 nm. Metrologia. 35(2). 105–113. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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