M. Fried

2.4k total citations
173 papers, 1.9k citations indexed

About

M. Fried is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Fried has authored 173 papers receiving a total of 1.9k indexed citations (citations by other indexed papers that have themselves been cited), including 119 papers in Electrical and Electronic Engineering, 71 papers in Computational Mechanics and 46 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Fried's work include Ion-surface interactions and analysis (54 papers), Thin-Film Transistor Technologies (49 papers) and Silicon and Solar Cell Technologies (38 papers). M. Fried is often cited by papers focused on Ion-surface interactions and analysis (54 papers), Thin-Film Transistor Technologies (49 papers) and Silicon and Solar Cell Technologies (38 papers). M. Fried collaborates with scholars based in Hungary, Germany and Italy. M. Fried's co-authors include T. Lohner, P. Petrík, J. Gyulai, O. Polgár, A. van Silfhout, I. Bársony, N.Q. Khánh, L.J. Hanekamp, W.A.M. Aarnink and F. Pászti and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

M. Fried

169 papers receiving 1.8k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Fried Hungary 21 1.1k 775 589 501 438 173 1.9k
P. Petrík Hungary 21 943 0.8× 807 1.0× 377 0.6× 578 1.2× 301 0.7× 203 1.8k
T. Lohner Hungary 21 1.2k 1.0× 839 1.1× 631 1.1× 336 0.7× 261 0.6× 170 1.7k
Ee Jin Teo Singapore 22 1.0k 0.9× 596 0.8× 358 0.6× 559 1.1× 566 1.3× 84 1.7k
Daniel Franta Czechia 25 955 0.9× 828 1.1× 656 1.1× 553 1.1× 371 0.8× 138 2.1k
Nikolaos Vainos Greece 22 880 0.8× 398 0.5× 378 0.6× 398 0.8× 517 1.2× 134 1.6k
Cheng-Chung Lee Taiwan 25 1.1k 0.9× 714 0.9× 325 0.6× 504 1.0× 273 0.6× 175 2.1k
Takanobu Watanabe Japan 23 1.1k 0.9× 901 1.2× 124 0.2× 423 0.8× 322 0.7× 153 1.7k
William A. McGahan United States 15 844 0.8× 631 0.8× 268 0.5× 427 0.9× 409 0.9× 47 1.6k
Monica Bollani Italy 23 840 0.8× 543 0.7× 316 0.5× 650 1.3× 670 1.5× 114 1.7k
Stavros Pissadakis Greece 24 1.4k 1.3× 163 0.2× 212 0.4× 589 1.2× 493 1.1× 156 1.9k

Countries citing papers authored by M. Fried

Since Specialization
Citations

This map shows the geographic impact of M. Fried's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Fried with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Fried more than expected).

Fields of papers citing papers by M. Fried

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Fried. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Fried. The network helps show where M. Fried may publish in the future.

Co-authorship network of co-authors of M. Fried

This figure shows the co-authorship network connecting the top 25 collaborators of M. Fried. A scholar is included among the top collaborators of M. Fried based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Fried. M. Fried is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lábadi, Zoltán, et al.. (2024). Compositional Optimization of Sputtered WO3/MoO3 Films for High Coloration Efficiency. Materials. 17(5). 1000–1000.
2.
Kertész, Krisztián, Z. Zolnai, András Deák, et al.. (2024). Optimized sensing on gold nanoparticles created by graded-layer magnetron sputtering and annealing. Sensors and Actuators B Chemical. 425. 136875–136875. 3 indexed citations
3.
Lábadi, Zoltán, et al.. (2023). Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. Materials. 16(12). 4204–4204. 2 indexed citations
4.
Bányász, I., I. Rajta, V. Havránek, et al.. (2023). Design, fabrication, and characterization of picowell arrays on cyclic olefin copolymer surfaces generated with a 10.5 MeV N4+ ion microbeam. Applied Physics Letters. 123(5). 1 indexed citations
5.
Fried, M., et al.. (2022). Investigation of Combinatorial WO3-MoO3 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. Nanomaterials. 12(14). 2421–2421. 3 indexed citations
6.
Jankovics, Hajnalka, Éva Tóth, Zoltán Lábadi, et al.. (2021). Flagellin-based electrochemical sensing layer for arsenic detection in water. Scientific Reports. 11(1). 3497–3497. 8 indexed citations
7.
Lohner, T., E. Szilágyi, Z. Zolnai, et al.. (2020). Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry. Coatings. 10(5). 480–480. 5 indexed citations
8.
Zolnai, Z., Dániel Zámbó, Z. Osváth, et al.. (2018). Gold Nanorod Plasmon Resonance Damping Effects on a Nanopatterned Substrate. The Journal of Physical Chemistry C. 122(43). 24941–24948. 5 indexed citations
9.
Pollakowski, Beatrix, et al.. (2017). Ellipsometric and X‐Ray Spectrometric Investigation of Fibrinogen Protein Layers. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 14(12). 1 indexed citations
10.
Saftics, András, Sándor Kurunczi, Emil Agócs, et al.. (2017). SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO 2 -SiO 2 OPTICAL WAVEGUIDE SURFACES. Repository of the Academy's Library (Library of the Hungarian Academy of Sciences). 1 indexed citations
11.
Bányász, I., M. Fried, V. Havránek, et al.. (2016). The use of ion beam techniques for the fabrication of integrated optical elements. ASEP. 1–4.
12.
Defforge, Thomas, et al.. (2016). Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. Applied Surface Science. 421. 397–404. 20 indexed citations
13.
Petrík, P., Emil Agócs, P. Kozma, et al.. (2015). Methods for optical modeling and cross-checking in ellipsometry and scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9526. 95260S–95260S. 2 indexed citations
14.
Bányász, I., Z. Zolnai, S. Pelli, et al.. (2012). Fabrication of barrier-type slab waveguides in Er3+-doped tellurite glass by single and double energy MeV N+ion implantation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8264. 826406–826406. 3 indexed citations
15.
Polgár, O., M. Fried, T. Lohner, & I. Bársony. (2004). Evaluation of ellipsometric measurements using complex strategies. Thin Solid Films. 455-456. 95–100. 11 indexed citations
16.
Petrík, P., Werner Lehnert, Claus M. Schneider, et al.. (2000). In situ spectroscopic ellipsometry for the characterization of polysilicon formation inside a vertical furnace. Thin Solid Films. 364(1-2). 150–155. 4 indexed citations
17.
Fried, M., et al.. (2000). Non-destructive optical depth profiling and real-time evaluation of spectroscopic data. Thin Solid Films. 364(1-2). 64–74. 12 indexed citations
18.
Lohner, T., N.Q. Khánh, P. Petrík, et al.. (1997). Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry. Materials science forum. 248-249. 229–232. 2 indexed citations
19.
Lohner, T., E. Kótai, N.Q. Khánh, et al.. (1994). Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 85(1-4). 335–339. 29 indexed citations
20.
Fried, M., T. Lohner, W.A.M. Aarnink, L.J. Hanekamp, & A. van Silfhout. (1992). Determination of complex dielectric functions of ion implanted and implanted-annealed amorphous silicon by spectroscopic ellipsometry. Journal of Applied Physics. 71(10). 5260–5262. 87 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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