E. Kótai

1.4k total citations
78 papers, 1.1k citations indexed

About

E. Kótai is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry. According to data from OpenAlex, E. Kótai has authored 78 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 48 papers in Electrical and Electronic Engineering, 42 papers in Computational Mechanics and 24 papers in Materials Chemistry. Recurrent topics in E. Kótai's work include Ion-surface interactions and analysis (40 papers), Silicon and Solar Cell Technologies (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). E. Kótai is often cited by papers focused on Ion-surface interactions and analysis (40 papers), Silicon and Solar Cell Technologies (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). E. Kótai collaborates with scholars based in Hungary, Germany and United States. E. Kótai's co-authors include F. Pászti, A. Manuaba, G. Mezey, E. Szilágyi, J. Gyulai, T. Lohner, G. Battistig, M. Fried, Z. Zolnai and G. Lulli and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

E. Kótai

78 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. Kótai Hungary 16 534 531 443 231 193 78 1.1k
F. Pászti Hungary 19 726 1.4× 834 1.6× 728 1.6× 351 1.5× 277 1.4× 109 1.6k
G. Fuchs France 18 433 0.8× 687 1.3× 691 1.6× 103 0.4× 184 1.0× 75 1.3k
H. D. Carstanjen Germany 20 313 0.6× 305 0.6× 560 1.3× 162 0.7× 204 1.1× 72 1.1k
J.P. Stoquert France 18 333 0.6× 292 0.5× 356 0.8× 145 0.6× 129 0.7× 51 770
Wei‐Kan Chu United States 17 467 0.9× 300 0.6× 417 0.9× 139 0.6× 140 0.7× 79 1.0k
S. Rigo France 19 1.0k 1.9× 279 0.5× 627 1.4× 99 0.4× 148 0.8× 75 1.4k
E. Szilágyi Hungary 20 654 1.2× 617 1.2× 613 1.4× 421 1.8× 283 1.5× 102 1.6k
A. Kinomura Japan 19 803 1.5× 409 0.8× 519 1.2× 196 0.8× 293 1.5× 184 1.5k
B. Pardo France 19 298 0.6× 202 0.4× 326 0.7× 267 1.2× 334 1.7× 82 1.0k
C.J. Sofield United Kingdom 20 306 0.6× 407 0.8× 367 0.8× 239 1.0× 354 1.8× 74 1.0k

Countries citing papers authored by E. Kótai

Since Specialization
Citations

This map shows the geographic impact of E. Kótai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Kótai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Kótai more than expected).

Fields of papers citing papers by E. Kótai

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Kótai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Kótai. The network helps show where E. Kótai may publish in the future.

Co-authorship network of co-authors of E. Kótai

This figure shows the co-authorship network connecting the top 25 collaborators of E. Kótai. A scholar is included among the top collaborators of E. Kótai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Kótai. E. Kótai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lohner, T., E. Szilágyi, Z. Zolnai, et al.. (2020). Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry. Coatings. 10(5). 480–480. 5 indexed citations
2.
Szilágyi, E., E. Kótai, & D. G. Merkel. (2018). Ion-beam analysis of insulator samples. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 450. 184–188. 2 indexed citations
3.
Szilágyi, E., et al.. (2014). Channelling study of La1−Sr CoO3 films on different substrates. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 332. 393–396. 1 indexed citations
4.
Tóth, A.L., et al.. (2012). Formation of Nanoparticles by Ion Beam Irradiation of Thin Films. Journal of Nanoscience and Nanotechnology. 12(6). 5009–5015. 1 indexed citations
5.
Barradas, N.P., Kai Arstila, G. Battistig, et al.. (2007). Summary of “IAEA intercomparison of IBA software”. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 266(8). 1338–1342. 62 indexed citations
6.
Pető, G., N.Q. Khánh, Z.E. Horváth, et al.. (2006). Nanoscale morphology and photoemission of arsenic implanted germanium films. Journal of Applied Physics. 99(8). 1 indexed citations
7.
Szilágyi, E., E. Kótai, N.Q. Khánh, et al.. (2003). Ion implantation induced damage in silicon carbide studied by non-Rutherford elastic backscattering. 131–134. 1 indexed citations
8.
Lohner, T., N.Q. Khánh, P. Petrík, et al.. (1997). Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry. Materials science forum. 248-249. 229–232. 2 indexed citations
9.
Szilágyi, E., L. Bottyán, L. Deák, et al.. (1997). Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry. Materials science forum. 248-249. 365–368. 2 indexed citations
10.
Varga, L.K., L. Liszkay, Zs. Kajcsos, et al.. (1996). Preliminary results of the positron annihilation in zeolites: Peak shape and 3γ-decay. Journal of Radioanalytical and Nuclear Chemistry. 211(1). 237–245. 3 indexed citations
11.
Lohner, T., E. Kótai, N.Q. Khánh, et al.. (1994). Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 85(1-4). 335–339. 29 indexed citations
12.
Guseva, M. I., et al.. (1991). Sputtering of amorphous metallic alloys. Atomic Energy. 70(3). 197–201. 1 indexed citations
13.
Szilágyi, E., F. Pászti, A. Manuaba, C. Hajdu, & E. Kótai. (1989). Cross section measurements of the 1H(4He, 4He)1H elastic recoil reaction for ERD analysis. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 43(4). 502–506. 29 indexed citations
14.
Pászti, F., et al.. (1986). Hydrogen and deuterium measurements by elastic recoil detection using alpha particles. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 15(1-6). 486–491. 51 indexed citations
15.
Khánh, N.Q., G. Mezey, É. Zsoldos, et al.. (1986). Intermetallic compound formation of Ge-Ni and Ge-Al-Ni systems by furnace annealing and ion beam intermixing. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 15(1-6). 703–706. 1 indexed citations
16.
Mezey, G., G. Pető, F. Pászti, et al.. (1986). Oxidation behaviour of GdSi2 studied by RBS. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 15(1-6). 247–249. 4 indexed citations
17.
Lohner, T., G. Mezey, E. Kótai, et al.. (1983). Characterization of ion implanted silicon by ellipsometry and channeling. Nuclear Instruments and Methods in Physics Research. 209-210. 615–620. 28 indexed citations
18.
Pászti, F., L. Pogány, G. Mezey, et al.. (1981). Investigations on blistering and exfoliation in gold by 3.52 MeV helium ions. Journal of Nuclear Materials. 98(1-2). 11–17. 20 indexed citations
19.
Kótai, E., et al.. (1980). Lattice location of Co implanted in silicon. Radiation Effects. 47(1-4). 153–155. 3 indexed citations
20.
Mayer, J. W., L. Csepregi, J. Gyulai, et al.. (1976). MeV He backscattering analysis of ion-implanted Si: Drive-in diffusion and epitaxial regrowth. Thin Solid Films. 32(2). 303–306. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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