S.V. Walstra

496 citations

8 papers · 402 indexed · h-index 7

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 10%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing

Papers in

Hardware and Architecture 2
- VLSI and Analog Circuit Testing 2
Electrical and Electronic Engineering 8
- Semiconductor materials and devices 8
- Advancements in Semiconductor Devices and Circuit Design 4
- Radiation Effects in Electronics 4
- Integrated Circuits and Semiconductor Failure Analysis 3
- Ferroelectric and Negative Capacitance Devices 1

Co-authors: Changhong Dai G. Dermer B. Bloechel Shekhar Borkar James Tschanz Tanay Karnik P. Hazucha J. Maiz
Journals: IEEE Transactions on Device and Materials Reliability (1 paper)IEEE Transactions on Electron Devices (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Solid-State Electronics (1 paper)
Partner nations: United States

In The Last Decade

S.V. Walstra

8 papers receiving 392 citations

Peers

Countries citing papers authored by S.V. Walstra

Since Specialization

Citations

This map shows the geographic impact of S.V. Walstra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.V. Walstra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.V. Walstra more than expected).

Fields of papers citing papers by S.V. Walstra

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.V. Walstra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.V. Walstra. The network helps show where S.V. Walstra may publish in the future.

Co-authorship network

The 19 scholars most cited alongside S.V. Walstra, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S.V. Walstra Line = papers co-authored together S.V. Walstra links everyone, so they are left out of the graph.

All Works

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8 of 8 papers shown

#	Work
1	Frequency and recovery effects in high-κ BTI degradation S. Ramey, C. Prasad, M. Agostinelli, Sangwoo Pae, S.V. Walstra, G. Sigerson, J. Hicks	2009	39
2	Circuit-level modeling of soft errors in integrated circuits IEEE Transactions on Device and Materials Reliability ·S.V. Walstra, Changhong Dai	2005	52
3	Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process P. Hazucha, Tanay Karnik, S.V. Walstra, B. Bloechel, James Tschanz, J. Maiz, K. Soumyanath, G. Dermer, S. Narendra, Vivek De, Shekhar Borkar	2004	56
4	Measurements and analysis of SER-tolerant latch in a 90-nm dual-V/sub T/ CMOS process IEEE Journal of Solid-State Circuits ·P. Hazucha, Tanay Karnik, S.V. Walstra, B. Bloechel, James Tschanz, J. Maiz, K. Soumyanath, G. Dermer, S. Narendra, Vivek De, Shekhar Borkar	2004	93
5	Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-μm to 90-nm generation P. Hazucha, Tanay Karnik, J. Maiz, S.V. Walstra, B. Bloechel, James Tschanz, G. Dermer, S.A. Hareland, Peter R. Armstrong, Shekhar Borkar	2004	118
6	The effect of intrinsic capacitance degradation on circuit performance Changhong Dai, S.V. Walstra, Ariane Girard	2002	1
7	EXTENSION OF THE McNUTT-SAH METHOD FOR MEASURING THIN OXIDE THICKNESSES OF MOS DEVICES Solid-State Electronics ·S.V. Walstra, Chih‐Tang Sah	1998	11
8	Thin oxide thickness extrapolation from capacitance-voltage measurements IEEE Transactions on Electron Devices ·S.V. Walstra, Chih‐Tang Sah	1997	32

About S.V. Walstra

S.V. Walstra is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Infectious Diseases and Organic Chemistry, having authored 8 papers that have together received 402 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers), Radiation Effects in Electronics (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (2 papers), Semiconductor materials and interfaces (2 papers) and Ferroelectric and Negative Capacitance Devices (1 paper). The work is most often cited by research in Hardware and Architecture (185 citations), Electrical and Electronic Engineering (397 citations), Safety, Risk, Reliability and Quality (19 citations), Software (5 citations) and Computer Networks and Communications (29 citations). S.V. Walstra has collaborated with scholars based in United States. Frequent co-authors include Changhong Dai, G. Dermer, B. Bloechel, Shekhar Borkar, James Tschanz, Tanay Karnik, P. Hazucha, J. Maiz, Chih‐Tang Sah and S. Narendra. Their work appears in journals such as IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits and Solid-State Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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