S. Ramey

2.0k total citations
50 papers, 732 citations indexed

About

S. Ramey is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, S. Ramey has authored 50 papers receiving a total of 732 indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 3 papers in Biomedical Engineering. Recurrent topics in S. Ramey's work include Semiconductor materials and devices (41 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers) and Integrated Circuits and Semiconductor Failure Analysis (21 papers). S. Ramey is often cited by papers focused on Semiconductor materials and devices (41 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers) and Integrated Circuits and Semiconductor Failure Analysis (21 papers). S. Ramey collaborates with scholars based in United States, Greece and Belgium. S. Ramey's co-authors include D. K. Ferry, C. Prasad, J. Hicks, Anisur Rahman, S. Novak, M. Agostinelli, Lei Jiang, C. Auth, R. James and G. Leatherman and has published in prestigious journals such as IEEE Transactions on Electron Devices, Physica B Condensed Matter and Semiconductor Science and Technology.

In The Last Decade

S. Ramey

41 papers receiving 716 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Ramey United States 15 684 115 60 45 44 50 732
H.-J. Wann United States 10 863 1.3× 105 0.9× 93 1.6× 89 2.0× 39 0.9× 18 885
J.Y.-C. Sun Taiwan 10 646 0.9× 133 1.2× 121 2.0× 55 1.2× 21 0.5× 28 666
Subhadeep Mukhopadhyay India 17 844 1.2× 63 0.5× 98 1.6× 43 1.0× 46 1.0× 38 919
N. Planes France 17 781 1.1× 49 0.4× 56 0.9× 39 0.9× 51 1.2× 56 804
Jeff A. Babcock United States 8 867 1.3× 68 0.6× 35 0.6× 96 2.1× 66 1.5× 19 904
Jeffrey B. Johnson United States 12 415 0.6× 41 0.4× 41 0.7× 21 0.5× 32 0.7× 49 431
D. Moy United States 11 372 0.5× 88 0.8× 38 0.6× 27 0.6× 47 1.1× 31 395
E. Morifuji Japan 15 771 1.1× 87 0.8× 62 1.0× 25 0.6× 46 1.0× 59 782
L. Ciampolini France 9 321 0.5× 115 1.0× 56 0.9× 55 1.2× 24 0.5× 35 361
G.D.J. Smit Netherlands 15 847 1.2× 123 1.1× 91 1.5× 55 1.2× 25 0.6× 39 893

Countries citing papers authored by S. Ramey

Since Specialization
Citations

This map shows the geographic impact of S. Ramey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Ramey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Ramey more than expected).

Fields of papers citing papers by S. Ramey

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Ramey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Ramey. The network helps show where S. Ramey may publish in the future.

Co-authorship network of co-authors of S. Ramey

This figure shows the co-authorship network connecting the top 25 collaborators of S. Ramey. A scholar is included among the top collaborators of S. Ramey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Ramey. S. Ramey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
Ascázubi, Ricardo, et al.. (2024). Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology. 1–6.
4.
Parker, Rachael J., et al.. (2023). A Physical Unclonable Function Leveraging Hot Carrier Injection Aging. 1–5. 3 indexed citations
5.
Jamil, Mubasher, et al.. (2023). Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. 1–5. 1 indexed citations
6.
Meric, Inanc, et al.. (2022). Method to evaluate off-state breakdown in scaled Tri-gate technologies. 1–6. 2 indexed citations
7.
Mahapatra, Souvik, Kevin J. Chen, B. Kaczer, et al.. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices. 66(11). 4497–4503.
9.
Su, Cheng‐Yong, M Armstrong, Lei Jiang, et al.. (2018). Transistor reliability characterization and modeling of the 22FFL FinFET technology. 6F.8–1. 6 indexed citations
10.
Ramey, S., C. Prasad, & Anisur Rahman. (2018). Technology scaling implications for BTI reliability. Microelectronics Reliability. 82. 42–50. 8 indexed citations
11.
Prasad, C., S. Ramey, & Lei Jiang. (2017). Self-heating in advanced CMOS technologies. 6A–4.1. 46 indexed citations
12.
Ramey, S. & J. Hicks. (2014). SILC and gate oxide breakdown characterization of 22nm tri-gate technology. 3C.2.1–3C.2.5. 3 indexed citations
13.
Ramey, S., C. Auth, Jason Clifford, et al.. (2013). Intrinsic transistor reliability improvements from 22nm tri-gate technology. 4C.5.1–4C.5.5. 137 indexed citations
14.
Ferry, D. K., R. Akis, Aron W. Cummings, Matthew J. Gilbert, & S. Ramey. (2006). Semiconductor Device Scaling: Physics, Transport, and the Role of Nanowires. 2006 Sixth IEEE Conference on Nanotechnology. 1. 415–418. 3 indexed citations
15.
Agostinelli, M., Sangwoo Pae, Wenxing Yang, et al.. (2005). Random charge effects for PMOS NBTI in ultra-small gate area devices. 529–532. 33 indexed citations
16.
17.
Ramey, S. & D. K. Ferry. (2003). Threshold voltage calculation in ultrathin-film soi mosfets using the effective potential. IEEE Transactions on Nanotechnology. 2(3). 121–125. 8 indexed citations
18.
Ramey, S., et al.. (2003). Modeling of multiple-quantum-well solar cells including capture, escape, and recombination of photoexcited carriers in quantum wells. IEEE Transactions on Electron Devices. 50(5). 1179–1188. 53 indexed citations
20.
Ramey, S. & D. K. Ferry. (2002). Modeling of quantum effects in ultrasmall FD-SOI MOSFETs with effective potentials and three-dimensional Monte Carlo. Physica B Condensed Matter. 314(1-4). 350–353. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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