R. S. Johnson
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Oncology
- Co-authors
- G. LucovskyChristopher L. HinkleH. NiimiG. B. RaynerVeena MisraJerry L. WhittenY. ZhangDongkyun Kang
- Topics
- Semiconductor materials and devices (16 papers)Semiconductor materials and interfaces (7 papers)Electronic and Structural Properties of Oxides (6 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryElectronic, Optical and Magnetic Materials
- Partner nations
- United StatesAustraliaUnited Kingdom
In The Last Decade
R. S. Johnson
24 papers receiving 548 citations
Peers
Comparison fields: 5 of 49
- Electrical and Electronic Engineering 492
- Materials Chemistry 223
- Atomic and Molecular Physics, and Optics 126
- Electronic, Optical and Magnetic Materials 83
- Oncology 25
Countries citing papers authored by R. S. Johnson
This map shows the geographic impact of R. S. Johnson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. S. Johnson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. S. Johnson more than expected).
Fields of papers citing papers by R. S. Johnson
This network shows the impact of papers produced by R. S. Johnson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. S. Johnson. The network helps show where R. S. Johnson may publish in the future.
Co-authorship network of co-authors of R. S. Johnson
This figure shows the co-authorship network connecting the top 25 collaborators of R. S. Johnson. A scholar is included among the top collaborators of R. S. Johnson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. S. Johnson. R. S. Johnson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 15 | |
| 2 | 4 | |
| 3 | 10 | |
| 4 | 1 | |
| 5 | 13 | |
| 6 | Properties of aluminum oxide and aluminum oxide alloys and their interfaces with silicon and silicon dioxide | 1 |
| 7 | 17 | |
| 8 | 8 | |
| 9 | 6 | |
| 10 | 12 | |
| 11 | 30 | |
| 12 | 61 | |
| 13 | 32 | |
| 14 | 66 | |
| 15 | 164 | |
| 16 | 36 | |
| 17 | 7 | |
| 18 | 5 | |
| 19 | 3 | |
| 20 | 12 |
About R. S. Johnson
R. S. Johnson is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 24 papers that have together received 574 indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Semiconductor materials and interfaces (7 papers) and Electronic and Structural Properties of Oxides (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (492 citations), Materials Chemistry (223 citations) and Electronic, Optical and Magnetic Materials (83 citations). R. S. Johnson has collaborated with scholars based in United States, Australia and United Kingdom. Frequent co-authors include G. Lucovsky, G. Lucovsky, Christopher L. Hinkle, H. Niimi, G. B. Rayner, Veena Misra, Jerry L. Whitten, Y. Zhang, Dongkyun Kang and G. Appel. Their work appears in journals such as Applied Physics Letters, Applied Surface Science and Journal of Materials Chemistry C.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.