J. Savir

2.1k total citations
73 papers, 1.5k citations indexed

About

J. Savir is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, J. Savir has authored 73 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 60 papers in Hardware and Architecture, 56 papers in Electrical and Electronic Engineering and 17 papers in Control and Systems Engineering. Recurrent topics in J. Savir's work include VLSI and Analog Circuit Testing (59 papers), Integrated Circuits and Semiconductor Failure Analysis (50 papers) and Radiation Effects in Electronics (15 papers). J. Savir is often cited by papers focused on VLSI and Analog Circuit Testing (59 papers), Integrated Circuits and Semiconductor Failure Analysis (50 papers) and Radiation Effects in Electronics (15 papers). J. Savir collaborates with scholars based in United States. J. Savir's co-authors include S. Patil, W.H. McAnney, Paul H. Bardell, Zhen Guo, J. P. Roth, Qiang Peng, M. Abramovici, Robert J. Berry, George Markowsky and Z. Barzilai and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Instrumentation and Measurement and IBM Journal of Research and Development.

In The Last Decade

J. Savir

68 papers receiving 1.4k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Savir United States 19 1.4k 1.4k 223 63 41 73 1.5k
N. Tamarapalli United States 14 1.2k 0.9× 1.2k 0.9× 192 0.9× 45 0.7× 21 0.5× 17 1.3k
F.J. Ferguson United States 17 993 0.7× 1.0k 0.7× 80 0.4× 53 0.8× 56 1.4× 46 1.1k
C. Landrault France 21 1.4k 1.0× 1.4k 1.0× 185 0.8× 57 0.9× 19 0.5× 101 1.5k
B. Koenemann United States 9 1.5k 1.0× 1.4k 1.0× 258 1.2× 39 0.6× 32 0.8× 15 1.5k
Eric Lindbloom United States 10 1.1k 0.8× 1.1k 0.8× 158 0.7× 67 1.1× 27 0.7× 11 1.1k
J.A. Waicukauski United States 23 1.9k 1.3× 1.8k 1.3× 280 1.3× 72 1.1× 26 0.6× 52 1.9k
Mark Kassab United States 16 1.6k 1.1× 1.5k 1.1× 242 1.1× 49 0.8× 11 0.3× 49 1.6k
H.-J. Wunderlich Germany 16 943 0.7× 900 0.6× 149 0.7× 43 0.7× 33 0.8× 47 990
Sybille Hellebrand Germany 19 1.3k 0.9× 1.3k 0.9× 206 0.9× 41 0.7× 25 0.6× 81 1.5k
Grzegorz Mrugalski United States 17 1.1k 0.8× 1.1k 0.8× 191 0.9× 20 0.3× 28 0.7× 66 1.2k

Countries citing papers authored by J. Savir

Since Specialization
Citations

This map shows the geographic impact of J. Savir's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Savir with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Savir more than expected).

Fields of papers citing papers by J. Savir

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Savir. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Savir. The network helps show where J. Savir may publish in the future.

Co-authorship network of co-authors of J. Savir

This figure shows the co-authorship network connecting the top 25 collaborators of J. Savir. A scholar is included among the top collaborators of J. Savir based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Savir. J. Savir is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Guo, Zhen & J. Savir. (2003). Observer-based test of analog linear time-invariant circuits. 13–17. 1 indexed citations
2.
Savir, J.. (2002). AC product defect level and yield loss. 726–738. 6 indexed citations
3.
4.
Savir, J.. (2002). Scan latch design for delay test. 446–453. 19 indexed citations
5.
Peng, Qiang, M. Abramovici, & J. Savir. (2002). MUST: multiple-stem analysis for identifying sequentially untestable faults. 839–846. 23 indexed citations
6.
7.
Savir, J.. (2000). Distributed BIST Architecture to Combat Delay Faults. Journal of Electronic Testing. 16(4). 369–380. 1 indexed citations
8.
Savir, J.. (1997). BIST-based fault diagnosis in the presence of embedded memories. 37–47. 4 indexed citations
9.
Savir, J.. (1997). Delay Test Generation: A Hardware Perspective. Journal of Electronic Testing. 10(3). 245–254. 5 indexed citations
10.
Savir, J.. (1997). Reduced Latch Count Shift Registers. Journal of Electronic Testing. 11(2). 183–185. 2 indexed citations
11.
Savir, J. & S. Patil. (1994). Broad-side delay test. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 13(8). 1057–1064. 191 indexed citations
12.
Savir, J. & S. Patil. (1994). On broad-side delay test. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2(3). 368–372. 35 indexed citations
13.
Savir, J. & Robert J. Berry. (1992). AC strength of a pattern generator. Journal of Electronic Testing. 3(2). 119–125. 12 indexed citations
14.
Savir, J. & W.H. McAnney. (1992). A multiple seed linear feedback shift register. IEEE Transactions on Computers. 41(2). 250–252. 38 indexed citations
15.
Savir, J.. (1990). AC product defect level and yield loss. IEEE Transactions on Semiconductor Manufacturing. 3(4). 195–205. 5 indexed citations
16.
Savir, J. & W.H. McAnney. (1988). Random pattern testability of delay faults. IEEE Transactions on Computers. 37(3). 291–300. 13 indexed citations
17.
Savir, J., et al.. (1985). RANDOM PATTERN TESTING FOR ADDRESS-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.. International Test Conference. 100–105. 4 indexed citations
18.
Savir, J. & Paul H. Bardell. (1983). On Random Pattern Test Length.. International Test Conference. 95–107. 10 indexed citations
19.
Barzilai, Z., et al.. (1981). VLSI Self-Testing Based on Syndrome Techniques. International Test Conference. 102–109. 6 indexed citations
20.
Savir, J.. (1978). Detection of intermittent faults in sequential circuits. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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