P. E. Russell

85 papers receiving 1.4k citations

Peers

P. E. Russell
Comparison fields: 5 of 75
  • Structural Biology 121
  • Surfaces, Coatings and Films 235
  • Atomic and Molecular Physics, and Optics 610
  • Electrical and Electronic Engineering 802
  • Condensed Matter Physics 137
Replace R. D. Twesten with:
R. D. Twesten United States
Songkil Kim United States
K. Murakami Japan
Tomáš Šikola Czechia
Mizuho Morita Japan
Patrice Gergaud France
Katsuhiro Sasaki Japan
Jingya Sun China
Amal Chabli France
M. E. Twigg United States
P. E. Russell relative to R. D. Twesten United States R. D. Twesten's profile →
Citations per field
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R. D. Twesten · 1×
Citations per year

Countries citing papers authored by P. E. Russell

Since Specialization
Citations

This map shows the geographic impact of P. E. Russell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. E. Russell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. E. Russell more than expected).

Fields of papers citing papers by P. E. Russell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. E. Russell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. E. Russell. The network helps show where P. E. Russell may publish in the future.

Co-authorship network

The 25 scholars most cited alongside P. E. Russell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. E. Russell Line = papers co-authored together P. E. Russell links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1
Nanofabrication using focused ion and electron beams : principles and applications
2011212
2 200932
3 200814
4 200513
5 20045
6 20031
7 200210
8 20022
9 200211
10 200016
11 199025
12 199020
13 19894
14
Microchannel Plates as Specialized Scanning Electron Microscopy Detectors
19842
15 198320
16 19831
17
Grain boundaries in silicon solar cells
19821
18
Electro-optical properties of screen printed solar cells
19823
19
Microanalysis of candidate thin and thick film photovoltaic materials
19821
20
Junction characteristics of indium tin oxide/indium phosphide solar cells
19821

About P. E. Russell

P. E. Russell is a scholar working on Surfaces, Coatings and Films, Structural Biology, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Condensed Matter Physics, having authored 91 papers that have together received 1.5k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (27 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers), Semiconductor materials and devices (22 papers), Electron and X-Ray Spectroscopy Techniques (16 papers), Semiconductor materials and interfaces (14 papers), Ion-surface interactions and analysis (12 papers), Advanced Surface Polishing Techniques (11 papers) and Metal and Thin Film Mechanics (10 papers). The work is most often cited by research in Structural Biology (121 citations), Surfaces, Coatings and Films (235 citations), Atomic and Molecular Physics, and Optics (610 citations), Electrical and Electronic Engineering (802 citations) and Condensed Matter Physics (137 citations). P. E. Russell has collaborated with scholars based in United States, Brazil and China. Frequent co-authors include Stanislav A. Moshkalev, Ivo Utke, D. P. Griffis, D. A. Grigg, J. E. Griffith, Fumio S. Ohuchi, Bernardo R. A. Neves, E. B. Troughton, Konrad Jarausch and Donovan N. Leonard. Their work appears in journals such as Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics, Ultramicroscopy and Microscopy and Microanalysis.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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