D. A. Grigg

831 total citations
20 papers, 605 citations indexed

About

D. A. Grigg is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering and Mechanical Engineering. According to data from OpenAlex, D. A. Grigg has authored 20 papers receiving a total of 605 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Atomic and Molecular Physics, and Optics, 9 papers in Biomedical Engineering and 7 papers in Mechanical Engineering. Recurrent topics in D. A. Grigg's work include Force Microscopy Techniques and Applications (15 papers), Advanced Measurement and Metrology Techniques (7 papers) and Near-Field Optical Microscopy (6 papers). D. A. Grigg is often cited by papers focused on Force Microscopy Techniques and Applications (15 papers), Advanced Measurement and Metrology Techniques (7 papers) and Near-Field Optical Microscopy (6 papers). D. A. Grigg collaborates with scholars based in United States and Canada. D. A. Grigg's co-authors include J. E. Griffith, M. J. Vasile, Eugene A. Fitzgerald, P. E. Russell, P. E. Russell, Xavier Colonna de Lega, Peter J. de Groot, John T. Roth, B. Drake and Ratnesh Lal and has published in prestigious journals such as Journal of Applied Physics, Review of Scientific Instruments and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

In The Last Decade

D. A. Grigg

20 papers receiving 555 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. A. Grigg United States 13 423 306 237 100 87 20 605
M. Wendel Germany 10 312 0.7× 165 0.5× 166 0.7× 51 0.5× 56 0.6× 30 449
H. H. Harary United States 8 626 1.5× 393 1.3× 415 1.8× 37 0.4× 45 0.5× 10 793
Erik M. Secula United States 11 142 0.3× 179 0.6× 349 1.5× 106 1.1× 34 0.4× 156 591
Hideki Kawakatsu Japan 19 692 1.6× 319 1.0× 395 1.7× 37 0.4× 35 0.4× 82 851
M. Tortonese United States 12 831 2.0× 311 1.0× 485 2.0× 18 0.2× 40 0.5× 14 967
Erik H. Waller Germany 13 280 0.7× 332 1.1× 170 0.7× 100 1.0× 41 0.5× 22 605
Karsten Frenner Germany 11 148 0.3× 271 0.9× 145 0.6× 88 0.9× 110 1.3× 56 536
Hans Loeschner Austria 12 98 0.2× 264 0.9× 384 1.6× 109 1.1× 20 0.2× 73 534
Hiroki Kawada Japan 12 117 0.3× 94 0.3× 464 2.0× 68 0.7× 44 0.5× 80 599
J. Spousta Czechia 11 146 0.3× 137 0.4× 156 0.7× 63 0.6× 33 0.4× 31 408

Countries citing papers authored by D. A. Grigg

Since Specialization
Citations

This map shows the geographic impact of D. A. Grigg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. A. Grigg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. A. Grigg more than expected).

Fields of papers citing papers by D. A. Grigg

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. A. Grigg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. A. Grigg. The network helps show where D. A. Grigg may publish in the future.

Co-authorship network of co-authors of D. A. Grigg

This figure shows the co-authorship network connecting the top 25 collaborators of D. A. Grigg. A scholar is included among the top collaborators of D. A. Grigg based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. A. Grigg. D. A. Grigg is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Grigg, D. A., et al.. (2004). Static and dynamic characterization of MEMS and MOEMS devices using optical interference microscopy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5455. 429–429. 25 indexed citations
3.
Lega, Xavier Colonna de, D. A. Grigg, & Peter J. de Groot. (2004). Surface profiling using a reference-scanning Mirau interference microscope. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5532. 106–106. 6 indexed citations
4.
Groot, Peter J. de, et al.. (2002). Optical interferometry for measurement of the geometric dimensions of industrial parts. Applied Optics. 41(19). 3853–3853. 48 indexed citations
5.
Groot, Peter J. de, Xavier Colonna de Lega, & D. A. Grigg. (2002). Step height measurements using a combination of a laser displacement gage and a broadband interferometric surface profiler. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4778. 127–127. 10 indexed citations
6.
Grigg, D. A.. (1996). Advanced applications and instrumentation for scanning probe microscopy (SPM). Proceedings annual meeting Electron Microscopy Society of America. 54. 852–853. 1 indexed citations
7.
Hansma, P. K., B. Drake, D. A. Grigg, et al.. (1994). A new, optical-lever based atomic force microscope. Journal of Applied Physics. 76(2). 796–799. 34 indexed citations
8.
Griffith, J. E. & D. A. Grigg. (1993). Dimensional metrology with scanning probe microscopes. Journal of Applied Physics. 74(9). R83–R109. 136 indexed citations
9.
Griffith, J. E., D. A. Grigg, Greg Kochanski, M. J. Vasile, & P. E. Russell. (1993). Metrology with scanning probe microscopes. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10310. 103100I–103100I. 2 indexed citations
10.
Grigg, D. A., P. E. Russell, & J. E. Griffith. (1992). Rocking-beam force-balance approach to atomic force microscopy. Ultramicroscopy. 42-44. 1504–1508. 14 indexed citations
11.
Grigg, D. A., J. E. Griffith, Greg Kochanski, M. J. Vasile, & P. E. Russell. (1992). <title>Scanning probe metrology</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1673. 557–567. 8 indexed citations
12.
Grigg, D. A., P. E. Russell, J. E. Griffith, M. J. Vasile, & Eugene A. Fitzgerald. (1992). Probe characterization for scanning probe metrology. Ultramicroscopy. 42-44. 1616–1620. 17 indexed citations
13.
Griffith, J. E., D. A. Grigg, M. J. Vasile, P. E. Russell, & Eugene A. Fitzgerald. (1992). Scanning probe metrology. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 674–679. 35 indexed citations
14.
Grigg, D. A., P. E. Russell, & J. E. Griffith. (1992). Tip–sample forces in scanning probe microscopy in air and vacuum. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 680–683. 68 indexed citations
15.
Parsons, R. R., et al.. (1992). Improved barrier layer for high-T c superconductor on silicon. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(2). 697–700. 2 indexed citations
16.
Vasile, M. J., D. A. Grigg, J. E. Griffith, Eugene A. Fitzgerald, & P. E. Russell. (1991). Scanning probe tips formed by focused ion beams. Review of Scientific Instruments. 62(9). 2167–2171. 51 indexed citations
17.
Vasile, M. J., D. A. Grigg, J. E. Griffith, Eugene A. Fitzgerald, & P. E. Russell. (1991). Scanning probe tip geometry optimized for metrology by focused ion beam ion milling. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(6). 3569–3572. 54 indexed citations
18.
Griffith, J. E., D. A. Grigg, M. J. Vasile, P. E. Russell, & Eugene A. Fitzgerald. (1991). Characterization of scanning probe microscope tips for linewidth measurement. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(6). 3586–3589. 35 indexed citations
19.
Griffith, J. E., et al.. (1991). A rocking beam electrostatic balance for the measurement of small forces. Review of Scientific Instruments. 62(3). 705–709. 36 indexed citations
20.
Griffith, J. E., et al.. (1990). A scanning tunneling microscope with a capacitance-based position monitor. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 8(6). 2023–2027. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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