Giuseppe La Rosa

942 total citations
35 papers, 699 citations indexed

About

Giuseppe La Rosa is a scholar working on Electrical and Electronic Engineering, Molecular Biology and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Giuseppe La Rosa has authored 35 papers receiving a total of 699 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 2 papers in Molecular Biology and 2 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Giuseppe La Rosa's work include Semiconductor materials and devices (30 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). Giuseppe La Rosa is often cited by papers focused on Semiconductor materials and devices (30 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). Giuseppe La Rosa collaborates with scholars based in United States, Italy and France. Giuseppe La Rosa's co-authors include Stewart E. Rauch, F Guarin, A. Acovic, A. Strong, Ernest Y. Wu, Timothy D. Sullivan, J. Suñé, Dimitris P. Ioannou, R.‐P. Vollertsen and S. Mittl and has published in prestigious journals such as Nucleic Acids Research, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

Giuseppe La Rosa

35 papers receiving 665 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Giuseppe La Rosa United States 13 657 42 39 34 24 35 699
T. Ogawa Japan 8 182 0.3× 112 2.7× 49 1.3× 15 0.4× 9 0.4× 32 278
Jeff A. Babcock United States 8 867 1.3× 96 2.3× 68 1.7× 66 1.9× 3 0.1× 19 904
Subhadeep Mukhopadhyay India 17 844 1.3× 43 1.0× 63 1.6× 46 1.4× 2 0.1× 38 919
Xiangliang Jin China 10 311 0.5× 61 1.5× 28 0.7× 13 0.4× 5 0.2× 98 362
F. Schanovsky Austria 13 1.1k 1.6× 155 3.7× 65 1.7× 32 0.9× 3 0.1× 52 1.1k
D. Takashima Japan 14 391 0.6× 99 2.4× 16 0.4× 54 1.6× 6 0.3× 54 435
Jeff Bokor United States 6 214 0.3× 99 2.4× 89 2.3× 18 0.5× 6 0.3× 7 327
F. Monsieur France 12 906 1.4× 113 2.7× 67 1.7× 16 0.5× 2 0.1× 56 936
Ran Cheng China 14 615 0.9× 117 2.8× 101 2.6× 15 0.4× 6 0.3× 78 657
S. Ramey United States 15 684 1.0× 45 1.1× 115 2.9× 44 1.3× 2 0.1× 50 732

Countries citing papers authored by Giuseppe La Rosa

Since Specialization
Citations

This map shows the geographic impact of Giuseppe La Rosa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Giuseppe La Rosa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Giuseppe La Rosa more than expected).

Fields of papers citing papers by Giuseppe La Rosa

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Giuseppe La Rosa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Giuseppe La Rosa. The network helps show where Giuseppe La Rosa may publish in the future.

Co-authorship network of co-authors of Giuseppe La Rosa

This figure shows the co-authorship network connecting the top 25 collaborators of Giuseppe La Rosa. A scholar is included among the top collaborators of Giuseppe La Rosa based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Giuseppe La Rosa. Giuseppe La Rosa is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Stathis, J. H., et al.. (2019). Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery. 1–5. 3 indexed citations
2.
Stiffler, S. R., W.K. Henson, N. Zamdmer, et al.. (2018). Process technology for IBM 14-nm processor designs featuring silicon-on-insulator FinFETs. IBM Journal of Research and Development. 62(2/3). 11:1–11:7. 9 indexed citations
3.
Rosa, Giuseppe La & Martin Zacharias. (2016). Global deformation facilitates flipping of damaged 8-oxo-guanine and guanine in DNA. Nucleic Acids Research. 44(20). gkw827–gkw827. 12 indexed citations
4.
Rosa, Giuseppe La, F. Chen, C. Kothandaraman, et al.. (2015). Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability. 4C.1.1–4C.1.8. 3 indexed citations
5.
Rosa, Giuseppe La, F Guarin, W. Lai, et al.. (2014). Process dependence of AC/DC PBTI in HKMG n-MOSFETs. XT.6.1–XT.6.5. 5 indexed citations
6.
Arora, Rajan, En Xia Zhang, John D. Cressler, et al.. (2011). Trade-Offs Between RF Performance and Total-Dose Tolerance in 45-nm RF-CMOS. IEEE Transactions on Nuclear Science. 58(6). 2830–2837. 19 indexed citations
7.
Ioannou, Dimitris P., Kai Zhao, Aditya Bansal, et al.. (2011). A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS. CR.1.1–CR.1.4. 11 indexed citations
8.
Rauch, Stewart E., F Guarin, & Giuseppe La Rosa. (2009). High-$V_{\rm GS}$ PFET DC Hot-Carrier Mechanism and Its Relation to AC Degradation. IEEE Transactions on Device and Materials Reliability. 10(1). 40–46. 13 indexed citations
9.
Ioannou, Dimitris P., S. Mittl, & Giuseppe La Rosa. (2009). Positive Bias Temperature Instability Effects in nMOSFETs With $\hbox{HfO}_{2}/\hbox{TiN}$ Gate Stacks. IEEE Transactions on Device and Materials Reliability. 9(2). 128–134. 21 indexed citations
10.
Strong, A., Ernest Y. Wu, R.‐P. Vollertsen, et al.. (2009). Reliability Wearout Mechanisms in Advanced CMOS Technologies. 105 indexed citations
11.
Privitera, V., Antonino La Magna, C. Spinella, et al.. (2007). Integration of Melting Excimer Laser Annealing in Power MOS Technology. IEEE Transactions on Electron Devices. 54(4). 852–860. 10 indexed citations
12.
Rosa, Giuseppe La & Stewart E. Rauch. (2007). Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies. Microelectronics Reliability. 47(4-5). 552–558. 9 indexed citations
13.
Rosa, Giuseppe La, et al.. (2006). Impact of NBTI Induced Statistical Variation to SRAM Cell Stability. 2. 274–282. 42 indexed citations
14.
Rauch, Stewart E. & Giuseppe La Rosa. (2005). The energy driven paradigm of nMOSFET hot carrier effects. 708–709. 31 indexed citations
15.
16.
Rosa, Giuseppe La, et al.. (2002). Is product screen enough to guarantee low failure rate for the customer?. 12–16. 3 indexed citations
17.
Rosa, Giuseppe La, et al.. (2002). NBTI-channel hot carrier effects in PMOSFETs in advanced CMOS technologies. 282–286. 76 indexed citations
18.
Rauch, Stewart E., Giuseppe La Rosa, & F Guarin. (2002). Role of e-e scattering in the enhancement of channel hot carrier degradation of deep sub-micron NMOSFETs at high V/sub GS/ conditions. 399–405. 8 indexed citations
19.
Acovic, A., et al.. (1996). A review of hot-carrier degradation mechanisms in MOSFETs. Microelectronics Reliability. 36(7-8). 845–869. 81 indexed citations
20.
Bonfiglioli, G., A. Ferro, G. Montalenti, & Giuseppe La Rosa. (1954). Behavior of Ferromagnetic Domains under Stress. Physical Review. 94(2). 316–318. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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