N. K. Zous

504 total citations
37 papers, 400 citations indexed

About

N. K. Zous is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computer Networks and Communications. According to data from OpenAlex, N. K. Zous has authored 37 papers receiving a total of 400 indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 11 papers in Materials Chemistry and 6 papers in Computer Networks and Communications. Recurrent topics in N. K. Zous's work include Semiconductor materials and devices (37 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Advanced Memory and Neural Computing (15 papers). N. K. Zous is often cited by papers focused on Semiconductor materials and devices (37 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Advanced Memory and Neural Computing (15 papers). N. K. Zous collaborates with scholars based in Taiwan. N. K. Zous's co-authors include Tahui Wang, Wen-Jer Tsai, Chih-Yuan Lu, Chi‐Ju Yeh, Ting-Wei Chang, C.-Y. Lu, Chien‐Da Huang, Tien‐Chang Lu, Tien‐Sheng Chao and J. Ku and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

N. K. Zous

34 papers receiving 374 citations

Peers

Countries citing papers authored by N. K. Zous

Since Specialization

Citations

This map shows the geographic impact of N. K. Zous's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. K. Zous with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. K. Zous more than expected).

Fields of papers citing papers by N. K. Zous

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. K. Zous. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. K. Zous. The network helps show where N. K. Zous may publish in the future.

Co-authorship network of co-authors of N. K. Zous

This figure shows the co-authorship network connecting the top 25 collaborators of N. K. Zous. A scholar is included among the top collaborators of N. K. Zous based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. K. Zous. N. K. Zous is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Junction optimization for Reliability issues in floating gate NAND flash cells 2011 ·(unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Jen-Wei Huang, (unknown), N. K. Zous, (unknown), (unknown), (unknown), Wei Lü, (unknown), Tahui Wang, Chih-Yuan Lu	4
2	Source/Drain dopant concentration induced reliability issues in charge trapping NAND flash cells 2010 ·(unknown), (unknown), Shang‐Wei Lin, (unknown), Kuan‐Fu Chen, (unknown), (unknown), (unknown), N. K. Zous, (unknown), (unknown), Tzu‐Hsuan Hsu, Hang-Ting Lue, (unknown), (unknown), Kuang‐Chao Chen, Chih-Yuan Lu	4
3	Overall operation considerations for a SONOS-based memory 2009 ·(unknown), (unknown), (unknown), (unknown), Kuan‐Fu Chen, (unknown), Jung-Yu Hsieh, (unknown), N. K. Zous, (unknown), (unknown), Wei Lü, (unknown), Tahui Wang, C.-Y. Lu	2
4	Investigation of Charge Loss in Cycled NBit Cells via Field and Temperature Accelerations 2006 ·Wen-Jer Tsai, N. K. Zous, Hao Chen, (unknown), Chi‐Ju Yeh, (unknown), Wei Lü, Tahui Wang, J. Ku, Chih‐Yuan Lu	4
5	A temperature accelerated model for high state retention loss of nitride storage flash memory 2005 ·(unknown), N. K. Zous, (unknown), Wen-Jer Tsai, (unknown), (unknown), (unknown), Chih-Yuan Lu	2
6	A novel fully CMOS process compatible PREM for SOC applications 2005 ·IEEE Electron Device Letters ·Chi‐Ju Yeh, (unknown), Wen-Jer Tsai, Tien‐Chang Lu, Yen‐Chen Liao, N. K. Zous, (unknown), (unknown), (unknown), (unknown), Chih‐Yuan Lu	2
7	Lateral Migration of Trapped Holes in a Nitride Storage Flash Memory Cell and Its Qualification Methodology 2004 ·IEEE Electron Device Letters ·N. K. Zous, (unknown), Wen-Jer Tsai, (unknown), (unknown), Tsung‐Chien Lu, (unknown), (unknown), Wei Lü, W. Ting, J. Ku, C.-Y. Lu	14
8	Reliability and device scaling challenges of trapping charge flash memories 2004 ·Chi‐Ju Yeh, Wen-Jer Tsai, Tien‐Chang Lu, Yen‐Chen Liao, N. K. Zous, (unknown), Tahui Wang, (unknown), J. Ku, Chih‐Yuan Lu	4
9	Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique 2004 ·(unknown), (unknown), (unknown), N. K. Zous, Chi‐Ju Yeh, Wen-Jer Tsai, Tien‐Chang Lu, Tahui Wang, J. Ku, Chih‐Yuan Lu	2
10	An endurance evaluation method for flash EEPROM 2004 ·IEEE Transactions on Electron Devices ·N. K. Zous, (unknown), (unknown), Wen-Jer Tsai, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	5
11	Reliability models of data retention and read-disturb in 2-bit nitride storage flash memory cells 2004 ·(unknown), Wen-Jer Tsai, (unknown), (unknown), Chi‐Ju Yeh, N. K. Zous, Tien‐Chang Lu, (unknown), C.-Y. Lu	34
12	Reliable extraction of interface states from charge pumping method in ultra-thin gate oxide MOSFETs 2003 ·H.C. Lai, N. K. Zous, Wen-Jer Tsai, Tien‐Chang Lu, Tahui Wang, (unknown), (unknown)	6
13	Cause of data retention loss in a nitride-based localized trapping storage flash memory cell 2003 ·Wen-Jer Tsai, (unknown), N. K. Zous, Chi‐Ju Yeh, (unknown), (unknown), (unknown), (unknown), Chih-Yuan Lu	36
14	A comparative study of SILC transient characteristics and mechanisms in FN stressed and hot hole stressed tunnel oxides 2003 ·N. K. Zous, (unknown), Chi‐Ju Yeh, (unknown), Chien‐Da Huang	4
15	Hot Carrier Enhanced Read Disturb and Scaling Effects in a Localized Trapping Storage SONOS Type Flash Memory Cell 2002 ·Wen-Jer Tsai, Chi‐Ju Yeh, N. K. Zous, (unknown), (unknown), (unknown), Tahui Wang, (unknown), Chih-Yuan Lu	7
16	Data retention behavior of a SONOS type two-bit storage flash memory cell 2002 ·Wen-Jer Tsai, N. K. Zous, (unknown), (unknown), (unknown), Tahui Wang, (unknown), Chih-Yuan Lu, (unknown)	77
17	A new technique to measure an oxide trap density in a hot carrier stressed n-MOSFET 2002 ·(unknown), (unknown), Ting-Wei Chang, N. K. Zous, (unknown), Chien‐Da Huang	0
18	Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique 1998 ·IEEE Transactions on Electron Devices ·(unknown), (unknown), N. K. Zous, (unknown), (unknown)	16
19	Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique 1998 ·IEEE Transactions on Electron Devices ·(unknown), Ting-Wei Chang, (unknown), (unknown), N. K. Zous, Chien‐Da Huang	52
20	Field and temperature effects on oxide charge detrapping in a metal–oxide–semiconductor field effect transistor by measuring a subthreshold current transient 1997 ·Applied Physics Letters ·(unknown), N. K. Zous, (unknown), Ting-Wei Chang, (unknown), (unknown)	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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