Wen-Jer Tsai

508 total citations
43 papers, 393 citations indexed

About

Wen-Jer Tsai is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications and Materials Chemistry. According to data from OpenAlex, Wen-Jer Tsai has authored 43 papers receiving a total of 393 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 20 papers in Computer Networks and Communications and 7 papers in Materials Chemistry. Recurrent topics in Wen-Jer Tsai's work include Semiconductor materials and devices (36 papers), Advancements in Semiconductor Devices and Circuit Design (25 papers) and Advanced Data Storage Technologies (20 papers). Wen-Jer Tsai is often cited by papers focused on Semiconductor materials and devices (36 papers), Advancements in Semiconductor Devices and Circuit Design (25 papers) and Advanced Data Storage Technologies (20 papers). Wen-Jer Tsai collaborates with scholars based in Taiwan. Wen-Jer Tsai's co-authors include N. K. Zous, Chih-Yuan Lu, Tahui Wang, Chi‐Ju Yeh, Tien‐Chang Lu, C.-Y. Lu, Chih‐Yuan Lu, Kuang‐Chao Chen, Tsung‐Chien Lu and S. W. Hwang and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and The Computer Journal.

In The Last Decade

Wen-Jer Tsai

40 papers receiving 363 citations

Peers

Countries citing papers authored by Wen-Jer Tsai

Since Specialization

Citations

This map shows the geographic impact of Wen-Jer Tsai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wen-Jer Tsai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wen-Jer Tsai more than expected).

Fields of papers citing papers by Wen-Jer Tsai

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wen-Jer Tsai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wen-Jer Tsai. The network helps show where Wen-Jer Tsai may publish in the future.

Co-authorship network of co-authors of Wen-Jer Tsai

This figure shows the co-authorship network connecting the top 25 collaborators of Wen-Jer Tsai. A scholar is included among the top collaborators of Wen-Jer Tsai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wen-Jer Tsai. Wen-Jer Tsai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	A Novel BTBT Erase-Based PUF Generation Method With High Throughput in a 3-D _NAND Flash Memory 2025 ·IEEE Transactions on Electron Devices ·(unknown), (unknown), Guan-Wei Wu, (unknown), Wen-Jer Tsai, Tsung‐Chien Lu, Kuang‐Chao Chen, (unknown), Tuo‐Hung Hou, Chih-Yuan Lu	1
2	Analysis of Random Center/Edge Alignment PWM And Its Application to Digital Current Control for Boost DC-DC Converters 2024 ·Hung‐Chi Chen, (unknown), Wen-Jer Tsai	0
3	Investigation of Vth Distribution Tails of Ground-Select-Line Cells and Edge Dummy Cells in a 3-D NAND Flash Memory 2021 ·IEEE Transactions on Electron Devices ·(unknown), Tahui Wang, (unknown), (unknown), Guan-Wei Wu, (unknown), (unknown), Wen-Jer Tsai, (unknown), Kuang‐Chao Chen, Chih-Yuan Lu	2
4	Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on ${V}_{{t}}$ Retention Loss in a Multilevel Charge Trap Flash Memory 2019 ·IEEE Transactions on Electron Devices ·Yuheng Liu, (unknown), Tahui Wang, Wen-Jer Tsai, (unknown), Kuang‐Chao Chen, Chih-Yuan Lu	5
5	Grain Boundary Trap-Induced Current Transient in a 3-D NAND Flash Cell String 2019 ·IEEE Transactions on Electron Devices ·(unknown), Wen-Jer Tsai, (unknown), (unknown), (unknown), S. W. Hwang, (unknown), Kuang‐Chao Chen, Tseung‐Yuen Tseng, Chih-Yuan Lu	12
6	Analysis and Realization of TLC or even QLC Operation with a High Performance Multi-times Verify Scheme in 3D NAND Flash memory 2018 ·(unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Wen-Jer Tsai, (unknown), (unknown), Tahui Wang, Chih‐Yuan Lu	6
7	Chip-level characterization and RTN-induced error mitigation beyond 20nm floating gate flash memory 2018 ·(unknown), (unknown), (unknown), (unknown), (unknown), Wen-Jer Tsai, (unknown), Wei Lü, (unknown), Tahui Wang, Chih‐Yuan Lu	2
8	RTN modulation by neighboring word-line Vt level in 1Xnm floating gate NAND strings 2018 ·(unknown), (unknown), Changdong Wang, (unknown), (unknown), (unknown), (unknown), (unknown), Wen-Jer Tsai, (unknown), (unknown), Tahui Wang, Chih-Yuan Lu	1
9	A novel low-voltage hot-carrier (LVHC) programming method for scaled NAND flash cell 2011 ·Symposium on VLSI Technology ·Wen-Jer Tsai, Pei-Hsuan Tsai, Jen-Wei Huang, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Chih‐Yuan Lu	1
10	A Novel PHINES Flash Memory Cell with Low Power Program/Erase, Small Pitch, Two-Bits-Per-Cell for Data Storage Applications 2005 ·IEEE Transactions on Electron Devices ·Chi‐Ju Yeh, (unknown), Wen-Jer Tsai, Tsung‐Chien Lu, Ming-Syan Chen⋆, Ying-Yu Liao, W. Ting, (unknown), C.-Y. Lu	4
11	Lateral Migration of Trapped Holes in a Nitride Storage Flash Memory Cell and Its Qualification Methodology 2004 ·IEEE Electron Device Letters ·N. K. Zous, (unknown), Wen-Jer Tsai, (unknown), (unknown), Tsung‐Chien Lu, (unknown), (unknown), Wei Lü, W. Ting, J. Ku, C.-Y. Lu	14
12	Reliability and device scaling challenges of trapping charge flash memories 2004 ·Chi‐Ju Yeh, Wen-Jer Tsai, Tien‐Chang Lu, Yen‐Chen Liao, N. K. Zous, (unknown), Tahui Wang, (unknown), J. Ku, Chih‐Yuan Lu	4
13	Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique 2004 ·(unknown), (unknown), (unknown), N. K. Zous, Chi‐Ju Yeh, Wen-Jer Tsai, Tien‐Chang Lu, Tahui Wang, J. Ku, Chih‐Yuan Lu	2
14	An endurance evaluation method for flash EEPROM 2004 ·IEEE Transactions on Electron Devices ·N. K. Zous, (unknown), (unknown), Wen-Jer Tsai, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	5
15	Reliable extraction of interface states from charge pumping method in ultra-thin gate oxide MOSFETs 2003 ·H.C. Lai, N. K. Zous, Wen-Jer Tsai, Tien‐Chang Lu, Tahui Wang, (unknown), (unknown)	6
16	Cause of data retention loss in a nitride-based localized trapping storage flash memory cell 2003 ·Wen-Jer Tsai, (unknown), N. K. Zous, Chi‐Ju Yeh, (unknown), (unknown), (unknown), (unknown), Chih-Yuan Lu	36
17	PHINES: a novel low power program/erase, small pitch, 2-bit per cell flash memory 2003 ·Chi‐Ju Yeh, Wen-Jer Tsai, (unknown), Tien‐Chang Lu, (unknown), (unknown), Tahui Wang, (unknown), Chih‐Yuan Lu	25
18	Hot Carrier Enhanced Read Disturb and Scaling Effects in a Localized Trapping Storage SONOS Type Flash Memory Cell 2002 ·Wen-Jer Tsai, Chi‐Ju Yeh, N. K. Zous, (unknown), (unknown), (unknown), Tahui Wang, (unknown), Chih-Yuan Lu	7
19	Data retention behavior of a SONOS type two-bit storage flash memory cell 2002 ·Wen-Jer Tsai, N. K. Zous, (unknown), (unknown), (unknown), Tahui Wang, (unknown), Chih-Yuan Lu, (unknown)	77
20	The design and performance of supercomponents - High density MIC modules 1983 ·Microwave journal ·Wen-Jer Tsai, (unknown), (unknown)	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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